BCO (United States)

This Standard defines a Universal Test Interface (UTI) Pin Map Configuration for portable and bench top test requirements utilizing IEEE Std 1505, which will provide an open architecture serving the general electronic test industry. The UTI standard will permit users to create low-cost COTS interface solution and migrate test fixtures (i.e. adapters, interface devices,etc.), transparently between UTI configured test systems.

The IEEE-P1693, Modular Integration Packaging Scaleable System (MIPSS) standard as illustrated in Figure 1, defines the electrical and mechanical specifications of a modular interconnect packaging system design for Automatic Test System (ATS). It specifically describes a building block approach based upon the integration of three elements: (1) the outer enclosure and the inner Eurocard standard mechanical chassis that forms the mechanical structure of the building block with alignment features to mate with other enclosures [building blocks]; (2) a hopeful revision of the VME eXtensions for Instrumentation (VXI) chassis and component designs, that includes consideration of an IEEE-1155 backplane modification by the VXI Consortium Technical Committee [1], to add VME VXS 41.4 PCI Express serial bus control, with protocol enhancement under 2eSST, while the IEEE-P1693 working group continues to specify a new pluggable virtual power source, and mechanical extension that couples the VXI module directly to a transition panel that connects to an UUT or test interface choice emulating DOD Interface Standards [2]; and (3) the integration of the instrument modules and UUT personalty modules into a pluggable subassembly that interfaces with the basic enclosure building block.All of which is directly applicable to current DOD ATS (Fig.1).