- Research Article
17
- 10.1080/09500839.2011.593575
Interface failure and adhesion measured by focused ion beam cutting of metal–polymer interfaces
- Aug 01, 2011
- Philosophical Magazine Letters
- M.j Cordill + 2 more +2
New developments in flexible electronics require metal films to adhere to polymer substrates. Measuring the interfacial adhesion of these systems is challenging, requiring the formulation of new techniques and models. A strategy to measure the adhesion of Cr–polyethylene terephthalate (PET) interfaces using tensile straining and buckle formation is presented in this article. Focused ion beam cross-sectioning of the buckles reveals that the polymer substrate can locally fail, which may lead to an overestimate of adhesion. Cr–PET adhesion energy of 9.4 ± 1.6 J/m2 is determined with the present approach.
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