Inston (United States)

Magnetic tunnel junction based on the CoFeB/MgO/CoFeB structures is of great interest due to its application in the spin-transfer-torque magnetic random access memory (STT-MRAM). Large interfacial perpendicular magnetic anisotropy (PMA) is required to achieve high thermal stability. Here, we use the first-principles calculations to investigate the magnetic anisotropy energy (MAE) of the MgO/CoFe/capping layer structures, where the capping materials include 5d metals Hf, Ta, Re, Os, Ir, Pt, and Au and 6p metals Tl, Pb, and Bi. We demonstrate that it is feasible to enhance PMA by using proper capping materials. Relatively large PMA is found in the structures with the capping materials of Hf, Ta, Os, Ir, and Pb. More importantly, the MgO/CoFe/Bi structure gives rise to giant PMA (6.09 mJ/m2), which is about three times larger than that of the MgO/CoFe/Ta structure. The origin of the MAE is elucidated by examining the contributions to MAE from each atomic layer and orbital. These findings provide a comprehensive understanding of the PMA and point towards the possibility to achieve the advanced-node STT-MRAM with high thermal stability.

A source line sensing (SLS) scheme is presented, along with a corresponding memory core circuit architecture, for the sensing operation of magneto-electric random-access memory (MeRAM). Compared to a conventional bit-line sensing (BLS) scheme, the proposed SLS, which exploits the voltage-controlled magnetic anisotropy (VCMA) effect, applies a voltage across the magneto-electric tunnel junction (MEJ) with an opposite polarity. The SLS significantly reduces read disturbance and increases the sensing margin due to the enhanced coercivity of the bit during the read operation. Experimental data demonstrate that the thermal stability of nanoscale MEJs increases up to 2 times during the SLS operation compared with conventional BLS. An MEJ compact model based the SLS simulation shows that read disturbance improves by a factor greater than 10 ${}^{9}$ fJ/V $\cdot $ m and the sensing margin increases up to 3 times in the MEJ with the large VCMA coefficient $\left(>\text{100} \text{fJ}/\text{V}\cdot\text{m}\right)$ .

We introduce a magnetoelectric junction driven by voltage-controlled magnetic anisotropy (VCMA-MEJ) as a building block for a range of low-power memory applications. We present and discuss specifically two applications, magnetoelectric random access memory (MeRAM) and ternary content-addressable memory (TCAM). The MEJ differs from a magnetic tunnel junction (MTJ) in that electric field is used to induce switching in lieu of substantial current flow in MTJ. Electric field control of magnetism can dramatically enhance the performance of magnetic memory devices in terms of switching energy efficiency and switching speed. The development of such an energy-efficient and ultrafast memory has a potential to change the paradigm of a hierarchical memory system in the conventional computer architecture. By combining speed, low power, and high density, electric-field-controlled magnetic memory merges features of multiple separate memory technologies used in today's memory hierarchy. The performance of a VCMA-MEJs-based MeRAM, especially in the case of one access transistor associated with one MEJ (1T-1R) structure, is evaluated by comparing it with that of phase-change RAM, resistive RAM, and spin transfer torque RAM. MeRAM can achieve ultrafast switching (<1 ns), low switching energy (∼1 fJ), and compact cell size of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math>$6\;F^2$</tex-math></inline-formula> with a shared source region, as well as nonvolatility. For another application, we propose the VCMA-MEJ-based TCAM, which will be referred to as MeTCAM, consisting of 4T-2MEJs. Since MeTCAM fully exploits the low power and high density features of the VCMA effect both in write and search operation modes, it obtains a fast searching speed (0.2 ns) with the smallest cell area ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math>$44\;F^2 $</tex-math></inline-formula> ) compared to previous works.

Abstract Non-contacting extensometry offers a wide range of benefits in materials tests. Depending on the specific application, non-contacting extensometry may be the only option for strain measurement.

In this work, we experimentally study the temperature dependence of the perpendicular magnetic anisotropy (PMA) and of the voltage-controlled magnetic anisotropy (VCMA) in nanoscale MgO|CoFeB|Ta-based magnetic tunnel junctions. We demonstrate that the temperature dependences of both the PMA and the VCMA coefficient follow power laws of the saturation magnetization, but with different exponents. We also find that the linear dependence of the PMA on electric field is maintained over a wide temperature range, although the VCMA strength decreases faster as a function of temperature as compared to the PMA. Possible mechanisms leading to the different exponents are discussed.

High resolution sector field ICP-MS (SF-ICP-MS) is used to explore the mechanisms and limitations of the interference standard (IFS) method.

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