Integrated Dynamic Electron Solutions (United States)

Journal Article A New Low-dose STEM Imaging Mode with Probability Driven Intra-pixel Beam Blanking Get access Jonathan J P Peters, Jonathan J P Peters Advanced Microscopy Laboratory, CRANN, Dublin, IrelandSchool of Physics, Trinity College Dublin, Dublin, IrelandturboTEM Ltd., Dublin, Ireland Corresponding author: jonathan.peters@tcd.ie Search for other works by this author on: Oxford Academic Google Scholar Bryan W Reed, Bryan W Reed Integrated Dynamic Electron Systems Inc., Pleasanton, California, USA Search for other works by this author on: Oxford Academic Google Scholar Yu Jimbo, Yu Jimbo JEOL Ltd., Akishima, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Alexandra Porter, Alexandra Porter Imperial College London, London, United Kingdom Search for other works by this author on: Oxford Academic Google Scholar Daniel Masiel, Daniel Masiel Integrated Dynamic Electron Systems Inc., Pleasanton, California, USA Search for other works by this author on: Oxford Academic Google Scholar Lewys Jones Lewys Jones Advanced Microscopy Laboratory, CRANN, Dublin, IrelandSchool of Physics, Trinity College Dublin, Dublin, IrelandturboTEM Ltd., Dublin, Ireland Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1754–1755, https://doi.org/10.1093/micmic/ozad067.907 Published: 22 July 2023

Las vivencias asociadas al cautiverio clandestino constituyeron instancias profundamente disruptivas, en términos de sus construcciones simbólicas e identitarias de las y los sujetos, de sus proyecciones de futuro y sus entramados de relación. Este artículo analiza las inscripciones biográficas de la experiencia de la (propia) desaparición y posterior sobrevida en los sobrevivientes de los Centros Clandestinos de Detención (CCD) emplazados en la Argentina durante el período 1975-1983, con el objeto de reflexionar en torno de las formas de persistencia de la violencia en el presente y los procesos (siempre abiertos) de recomposición subjetiva. A partir de un abordaje de tipo cualitativo sostenido, principalmente, en el análisis de las historias de vida de hombres y mujeres que atravesaron la experiencia del cautiverio y posterior liberación, se hace foco en dos dimensiones analíticas: las modalidades de persistencia de la violencia en el espacio subjetivo y los procesos de ruptura y recomposición de los espacios de acción e interacción entendidos en el largo plazo.

We report Brillouin light scattering measurements of monoclinic CdPS3, a 2D layered cadmium chalcogenophosphate. By measurement of over 400 spectra in different orientations and scattering geometries, acoustic phonons are measured to determine the 13 elastic stiffness coefficients, along with longitudinal and transverse sound velocities from Brillouin frequency shifts. Because the sample was polycrystalline with a high density of planar defects, it was not possible to assign a crystal orientation to each spectrum. Instead, we determined the anisotropy in the material properties through statistical analysis, treating each spectrum as coming from a randomly sampled crystal orientation. Values of the Voigt–Reuss averages for the bulk modulus, Young’s modulus, the shear modulus, and Poisson’s ratio are calculated from measured stiffnesses. This work demonstrates analysis of elastic properties of a polycrystalline, monoclinic 2D layered material through statistical analysis of a significant number of spectra.

Yu et al. suggested calculating precisely the size ranges of the three parts of our figure 3A, adjusting the free-energy levels in figure 3B, and considering the shape effect in the first-principles calculation. The first and second suggestions raise strong concerns for misinterpretation and overinterpretation of our experiments. The original calculation is sufficient to support our claim about crystalline-to-disordered transformations.

Understanding and controlling ultrafast charge carrier dynamics is of fundamental importance in diverse fields of (quantum) science and technology. Here, we create a three-dimensional hot electron gas through two-photon photoemission from a copper surface in vacuum. We employ an ultrafast electron microscope to record movies of the subsequent electron dynamics on the picosecond-nanosecond time scale. After a prompt Coulomb explosion, the subsequent dynamics is characterized by a rapid oblate-to-prolate shape transformation of the electron gas, and periodic and long-lived electron cyclotron oscillations inside the magnetic field of the objective lens. In this regime, the collective behavior of the oscillating electrons causes a transient, mean-field lensing effect and pronounced distortions in the images. We derive an analytical expression for the time-dependent focal length of the electron-gas lens, and perform numerical electron dynamics and probe image simulations to determine the role of Coulomb self-fields and image charges. This work inspires the visualization of cyclotron dynamics inside two-dimensional electron-gas materials and enables the elucidation of electron/plasma dynamics and properties that could benefit the development of high-brightness electron and X-ray sources.

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Journal Article Temporal Compressive Sensing Instrumentation for TEM Get access Daniel J Masiel, Daniel J Masiel Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America Search for other works by this author on: Oxford Academic Google Scholar Ruth S Bloom, Ruth S Bloom Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America Search for other works by this author on: Oxford Academic Google Scholar Sang Tae Park, Sang Tae Park Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America Search for other works by this author on: Oxford Academic Google Scholar Bryan W Reed Bryan W Reed Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 20–21, https://doi.org/10.1017/S1431927617000782 Published: 04 August 2017