- Research Article
- 10.1088/1361-6382/ae50a5
Characterization of the temperature dependence of the quality factor of a silicon substrate using the gentle nodal suspension method
- Mar 25, 2026
- Classical and Quantum Gravity
- Damiano Aisa + 11 more +11
Abstract In this work, we present the proof of concept of a characterization of the temperature
dependence of the quality factor Q(T ) for a massive silicon substrate suspended in a
cryogenic environment using the Gentle Nodal Suspension (GeNS) method. Measurements
were conducted in a low-vibration cryostat, analyzing three distinct resonant vibrational
modes of the sample. Quality factor values and associated uncertainties were extracted
using multiple statistical approaches. The results highlight the suitability of the
experimental method and confirm crystalline silicon as a promising material for last-stage
test mass suspensions in cryogenic conditions, as required in next-generation gravitational
wave detectors. A comparison between experimental data and FEM simulations confirms
the accuracy of the setup. This study, part of the broader development of monolithic
silicon suspensions, demonstrates the effectiveness of the GeNS technique for assessing
mechanical dissipation in large-scale substrates.
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