Nion (United States)

Journal Article Ultra-high Energy Resolution EELS and 4D STEM at Cryogenic Temperatures Get access B Plotkin-Swing, B Plotkin-Swing Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar A Mittelberger, A Mittelberger Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar B Haas, B Haas Department of Physics & IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar J C Idrobo, J C Idrobo Department of Material Science and Engineering, University of Washington, Seattle, WA, USAPhysical Sciences Division, Pacific Northwest National Laboratory, Richland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar B Graner, B Graner Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar N Dellby, N Dellby Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar M T Hotz, M T Hotz Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar C E Meyer, C E Meyer Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar S C Quillin, S C Quillin Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar O L Krivanek, O L Krivanek Nion R&D, Kirkland, WA, USADepartment of Physics, Arizona State University, Tempe AZ, USA Search for other works by this author on: Oxford Academic Google Scholar ... Show more T C Lovejoy T C Lovejoy Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1698–1699, https://doi.org/10.1093/micmic/ozad067.875 Published: 22 July 2023

Journal Article Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM Get access M T Hotz, M T Hotz Nion R&D, 11511 NE 118th St, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar J Martis, J Martis Nion R&D, 11511 NE 118th St, Kirkland, WA, USADepartment of Mechanical Engineering, Stanford University, Stanford, CA, USA Search for other works by this author on: Oxford Academic Google Scholar T Radlicka, T Radlicka Institute of Scientific Instruments of CAS, Královopolská 147, Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar N J Bacon, N J Bacon Nion R&D, 11511 NE 118th St, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar N Dellby, N Dellby Nion R&D, 11511 NE 118th St, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar T C Lovejoy, T C Lovejoy Nion R&D, 11511 NE 118th St, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar S C Quillin, S C Quillin Nion R&D, 11511 NE 118th St, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar H Y Hwang, H Y Hwang Department of Applied Physics, Stanford University, Stanford, CA, USA Search for other works by this author on: Oxford Academic Google Scholar P Singh, P Singh Department of Applied Physics, Stanford University, Stanford, CA, USA Search for other works by this author on: Oxford Academic Google Scholar O L Krivanek O L Krivanek Nion R&D, 11511 NE 118th St, Kirkland, WA, USADepartment of Physics, Arizona State University, Tempe, AZ, USA Corresponding author: krivanek@nion.com Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 2064–2065, https://doi.org/10.1093/micmic/ozad067.1068 Published: 22 July 2023

Journal Article Ultra-high Resolution EELS Analysis and STEM Imaging at 20 keV Get access N Dellby, N Dellby Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar S C Quillin, S C Quillin Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar O L Krivanek, O L Krivanek Nion R&D, Kirkland, WA, USADepartment of Physics, Arizona State University, Tempe AZ, USA Search for other works by this author on: Oxford Academic Google Scholar P Hrncirik, P Hrncirik Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar A Mittelberger, A Mittelberger Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar B Plotkin-Swing, B Plotkin-Swing Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar T C Lovejoy T C Lovejoy Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 626–627, https://doi.org/10.1093/micmic/ozad067.305 Published: 22 July 2023

Journal Article A Materials Scientist's CANVAS: A System for Controlled Alteration of Nanomaterials in Vacuum Down to the Atomic Scale Get access Clemens Mangler, Clemens Mangler University of Vienna, Faculty of Physics, Vienna, Austria Corresponding author: clemens.mangler@univie.ac.at Search for other works by this author on: Oxford Academic Google Scholar Jannik Meyer, Jannik Meyer University of Vienna, Faculty of Physics, Vienna, AustriaCurrent affiliation: University of Tuebingen, Institute for Applied Physics, Tuebingen, Germany Search for other works by this author on: Oxford Academic Google Scholar Andreas Mittelberger, Andreas Mittelberger University of Vienna, Faculty of Physics, Vienna, AustriaCurrent affiliation: Nion Co., Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar Kimmo Mustonen, Kimmo Mustonen University of Vienna, Faculty of Physics, Vienna, Austria Search for other works by this author on: Oxford Academic Google Scholar Toma Susi, Toma Susi University of Vienna, Faculty of Physics, Vienna, Austria Search for other works by this author on: Oxford Academic Google Scholar Jani Kotakoski Jani Kotakoski University of Vienna, Faculty of Physics, Vienna, Austria Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 2940–2942, https://doi.org/10.1017/S1431927622011023 Published: 01 August 2022

Journal Article Seamless Communication Between High-Performance Computing System and Electron Microscopes for On-Demand Automated Data Transfer and Remote Control Get access Debangshu Mukherjee, Debangshu Mukherjee Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States Corresponding author: mukherjeed@ornl.gov Search for other works by this author on: Oxford Academic Google Scholar Anees Al-Najjar, Anees Al-Najjar Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States Search for other works by this author on: Oxford Academic Google Scholar Kevin M Roccapriore, Kevin M Roccapriore Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States Search for other works by this author on: Oxford Academic Google Scholar Jacob D Hinkle, Jacob D Hinkle Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States Search for other works by this author on: Oxford Academic Google Scholar Andrew R Lupini, Andrew R Lupini Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States Search for other works by this author on: Oxford Academic Google Scholar Chris Meyer, Chris Meyer NION R&D, Kirkland, WA, United States Search for other works by this author on: Oxford Academic Google Scholar Sergei V Kalinin, Sergei V Kalinin Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States Search for other works by this author on: Oxford Academic Google Scholar Olga S Ovchinnikova, Olga S Ovchinnikova Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States Search for other works by this author on: Oxford Academic Google Scholar Nageswara S Rao Nageswara S Rao Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 2908–2910, https://doi.org/10.1017/S1431927622010911 Published: 01 August 2022

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Crystal defects affect the thermal and heat-transport properties of materials by scattering phonons and modifying phonon spectra1-8. To appreciate how imperfections in solids influence thermal conductivity and diffusivity, it is thus essential to understand phonon-defect interactions. Sophisticated theories are available to explore such interactions, but experimental validation is limited because most phonon-detecting spectroscopic methods do not reach the high spatial resolution needed to resolve local vibrational spectra near individual defects. Here we demonstrate that space- and angle-resolved vibrational spectroscopy in a transmission electron microscope makes it possible to map the vibrational spectra of individual crystal defects. We detect a red shift of several millielectronvolts in the energy of acoustic vibration modes near a single stacking fault in cubic silicon carbide, together with substantial changes in their intensity, and find that these changes are confined to within a few nanometres of the stacking fault. These observations illustrate that the capabilities of a state-of-the-art transmission electron microscope open the door to the direct mapping of phonon propagation around defects, which is expected to provide useful guidance for engineering the thermal properties of materials.

Abstract

Plasmonic crystals are well known to have band structure including a band gap, enabling the control of surface plasmon propagation and confinement. The band dispersion relation of bulk crystals has been generally measured by momentum-resolved spectroscopy using far field optical techniques while the defects introduced in the crystals have separately been investigated by near field imaging techniques so far. Particularly, defect related energy levels introduced in the plasmonic band gap have not been observed experimentally. In order to investigate such a localized mode, we performed electron energy-loss spectroscopy (EELS) on a point defect introduced in a plasmonic crystal made up of flat cylinders protruding out of a metal film and arranged on a triangular lattice. The energy level of the defect mode was observed to lie within the full band-gap energy range. This was confirmed by a momentum-resolved EELS measurement of the band gap performed on the same plasmonic crystal. Furthermore, we experimentally and theoretically investigated the emergence of the defect states by starting with a corral of flat cylinders protrusions and adding sequentially additional shells of those in order to eventually form a plasmonic band-gap crystal encompassing a single point defect. It is demonstrated that a defectlike state already forms with a crystal made up of only two shells.