8- https://doi.org/10.1016/s0921-5107(01)00888-1
A new tool for measuring island dimensions and spatial correlations in quantum dot multilayers: Raman scattering interferences
- Nov 7, 2001
- Materials Science and Engineering: B
- M Cazayous +5 more
Abstract
A new tool for measuring island dimensions and spatial correlations in quantum dot multilayers: Raman scattering interferences
- # Quantum Dot Multilayers
- # Spatial Correlations
- # Dot Multilayers
- # Quantum Dot
- # Interference Phenomena
- # Interference Contrast
- # X-ray Measurements
- # Multilayer Structures
- # Transmission Electron Microscopy Measurements
- # Transmission Electron Microscopy
