• Home
  • Search
  • Alpha Particle Effect on Multi-Nanosheet Tunneling Field-Effect Transistor at 3-nm Technology Node
  • Open Access IconOpen Access
  • Cite Icon13
  • https://doi.org/10.3390/mi10120847Copy DOI Icon

Alpha Particle Effect on Multi-Nanosheet Tunneling Field-Effect Transistor at 3-nm Technology Node

Show More
  • Abstract
  • Highlights & Summary
  • PDF
  • Literature Map
  • References
  • Citations
  • Similar Papers
Abstract

The radiation effects on a multi-nanosheet tunneling-based field effect transistor (NS-TFET) were investigated for a 3-nm technology node using a three-dimensional (3D) technology computer-aided design (TCAD) simulator. An alpha particle was injected into a field effect transistor (FET), which resulted in a drain current fluctuation and caused the integrated circuit to malfunction as the result of a soft-error-rate (SER) issue. It was subsequently observed that radiation effects on NS-TFET were completely different from a conventional drift-diffusion (DD)-based FET. Unlike a conventional DD-based FET, when an alpha particle enters the source and channel areas in the current scenario, a larger drain current fluctuation occurs due to a tunneling mechanism between the source and the channel, and this has a significant effect on the drain current. In addition, as the temperature increases, the radiation effect increases as a result of a decrease in silicon bandgap energy and a resultant increase in band-to-band generation. Finally, the radiation effect was analyzed according to the energy of the alpha particle. These results can provide a guideline by which to design a robust integrated circuit for radiation that is totally different from the conventional DD-FET approach.

Loading PDF

Similar Papers
  • Research Article
  • Citations1

Analyzing Interface Trap Influence on Sensitivity, Noise, and Response Time in 2-D Material Field-Effect Transistor pH Sensors: A Theoretical Framework

  • Nov 15, 2024
  • IEEE Sensors Journal
  • S Sarath +3
  • Research Article

Effect of source-drain conduction in single-event transient on nanoscaled bulk fin field effect transistor

  • Jan 01, 2020
  • Acta Physica Sinica
  • Chao Lu +7
  • Book Chapter

Analytical Modeling of Reconfigurable Transistors

  • Mar 26, 2022
  • Rajan Ranjith +2
  • Conference Article
  • Citations13

Comparison and Simulation study of Cylindrical GAA NWMBCFET for sub 5 nm

  • Oct 01, 2019
  • S. Ashok Kumar +1
  • Research Article
  • Citations4

Quantum Mechanical Corrected Simulation Program with Integrated Circuit Emphasis Model for Simulation of Ultrathin Oxide Metal-Oxide-Semiconductor Field Effect Transistor Gate Tunneling Current

  • Apr 01, 2005
  • Japanese Journal of Applied Physics
  • Yiming Li +2
  • Research Article
  • Citations18

Multi-Stimuli-Responsive Field-Effect Transistor with Conjugated Polymer Entailing Spiropyran in the Side Chains

  • Apr 01, 2020
  • CCS Chemistry
  • Jing Ma +6
  • Research Article
  • Citations6

Study of parasitic oscillation of a multi-chip SiC MOSFET circuit based on a signal flow graph model by TCAD simulation

  • Sep 08, 2020
  • Solid-State Electronics
  • Hiroshi Kono +1
  • Conference Article

Machine Learning Approach to Predict Tunnel FET Characteristics Using Random Forest Regression

  • Jan 08, 2026
  • Ajaykumar Dharmireddy +5
  • Research Article
  • Citations22

Technology Scaling Trend of Soft Error Rate in Flip-Flops in <inline-formula> <tex-math notation="LaTeX">$1\times$ </tex-math> </inline-formula> nm Bulk FinFET Technology

  • Jun 01, 2018
  • IEEE Transactions on Nuclear Science
  • Taiki Uemura +5
  • Research Article
  • Citations2

Extensive electrostatic investigation of workfunction-modulated SOI tunnel FETs

  • Oct 04, 2016
  • Journal of Computational Electronics
  • Subhrasmita Panda +2
  • Research Article
  • Citations3

Thermal modeling of 7 nm node bulk fin-shaped field-effect transistors for device structure-aware design

  • Oct 15, 2018
  • Semiconductor Science and Technology
  • Chuntaek Park +1
  • Research Article
  • Citations4

Impact of Parasitic Bipolar Effect on Single-Event Upset in p-Type Metal–Oxide–Semiconductor Field Effect Transistor with Embedded SiGe

  • Mar 21, 2013
  • Japanese Journal of Applied Physics
  • Takashi Kato +6
  • PDF
  • Research Article
  • Citations8

Unscrambling for Subgap Density-of-States in Multilayered MoS2Field Effect Transistors under DC Bias Stress via Optical Charge-Pumping Capacitance-Voltage Spectroscopy

  • Jan 01, 2021
  • IEEE Access
  • Ga Won Yang +4
  • Research Article
  • Citations15

Compact Modeling of Static and Transient Effects of Buffer Traps in GaN HEMTs

  • Mar 01, 2022
  • IEEE Transactions on Electron Devices
  • Ajay Shanbhag +4
  • Supplementary Content
  • Citations1

Physical models for numerical simulation of Si-based nanoscale FETs and sensors

  • Apr 15, 2011
  • AMS Dottorato Institutional Doctoral Theses Repository (University of Bologna)
  • Luca Silvestri
Cactus Communications logo

Copyright 2026 Cactus Communications. All rights reserved.