An accurate sparse matrix based framework for statistical static timing analysis

In recent years, there has been a lot of research into statistical static timing analysis (SSTA) to compute the critical path delay of a circuit under timing variation. In order to compute the true critical path delay, however, false paths that cannot be sensitized by any input vector must be identified first. Since SSTA is unable to capture the dynamic timing behavior of a circuit, it is completely blind to false paths, and thus it overestimates the circuit timing. In this paper, we propose a new concept of timing analysis approach called statistical dynamic timing analysis (SDTA), which is able to precisely express the statistical behavior of dynamic transitions at the output of gate into a compact form and to directly evaluate and propagate the expressions throughout the circuit, by which the false paths can be cleaned effectively. In addition, to be practical, we propose a couple of techniques that enable a fast computation of the SDTA. We tested the proposed approach on ISCAS benchmarks and carry skip adders under timing variation to show its accuracy in computing the distribution of the true critical path delay of a circuit. In summary, compared to the previous approach of false path-aware statistical timing analysis, our timing analysis technique is able to reduce the accuracy error in the mean and standard deviation of true critical path delay distribution from 9.8% to 1.9% and from 29.4% to -3.4%, respectively.

The impact of parameter variations on timing due to process variations has become significant in recent years. In this paper, we present a statistical timing analysis (STA) framework with quadratic gate delay models that also captures spatial correlations. Our technique does not make any assumption about the distribution of the parameter variations, gate delays, and arrival times. We propose a Taylor-series expansion-based quadratic representation of gate delays and arrival times which are able to effectively capture the nonlinear dependencies that arise due to increasing parameter variations. In order to reduce the computational complexity introduced due to quadratic modeling during STA, we also propose an efficient linear modeling driven quadratic STA scheme. We ran two sets of experiments assuming the global parameters to have uniform and Gaussian distributions, respectively. On an average, the quadratic STA scheme had 20.5times speedup in runtime as compared to Monte Carlo simulations with an rms error of 0.00135 units between the two timing cummulative density functions (CDFs). The linear modeling driven quadratic STA scheme had 51.5times speedup in runtime as compared to Monte Carlo simulations with an rms error of 0.0015 units between the two CDFs. Our proposed technique is generic and can be applied to arbitrary variations in the underlying parameters under any spatial correlation model

Existing statistical static timing analysis (SSTA) techniques suffer from limited modeling capability by using a linear delay model with Gaussian distribution, or have scalability problems due to expensive operations involved to handle non-Gaussian variation sources or non-linear delays. To overcome these limitations, we propose a novel SSTA technique to handle both nonlinear delay dependency and non- Gaussian variation sources simultaneously. We develop efficient algorithms to perform all statistical atomic operations (such as max and add) efficiently via either closed- form formulas or one-dimensional lookup tables. The resulting timing quantity provably preserves the correlation with variation sources to the third-order. We prove that the complexity of our algorithm is linear in both variation sources and circuit sizes, hence our algorithm scales well for large designs. Compared to Monte Carlo simulation for non-Gaussian variation sources and nonlinear delay models, our approach predicts all timing characteristics of circuit delay with less than 2% error.

In this paper, we propose a calculation method of gate delay for SSTA (Statistical Static Timing Analysis) considering MIS (Multiple Input Switching). In SSTA, statistical maximum/minimum operation is necessary to calculate the latest/fastest arrival time of multiple input gate. Most SSTA approaches calculate the distribution in the latest/fastest arrival time under SIS (Single Input Switching assumption), resulting in ignoring the effect of MIS on the gate delay and the output transition time. MIS occurs when multiple inputs of a gate switch nearly simultaneously. Thus, ignoring MIS causes error in the statistical maximum/minimum operation in SSTA. We propose a statistical gate delay model considering MIS. We verify the proposed method by SPICE based Monte Carlo simulations. Experimental results show that the neglect of MIS effect leads to 80% error in worst case. The error of the proposed method is less than 20%.

Statistical static timing analysis (SSTA) methods, which model process variations statistically as probability distribution function rather than deterministically, have been thoroughly performed on traditional zero clock skew circuits. In the traditional zero clock skew circuits, the synchronizing clock signal is designed to arrive in phase with respect to each register. However, designers will often schedule the clock skew to different registers in order to decrease the minimum clock period of the entire circuit. Clock skew scheduling imparts very different timing constraints that are based, in part, on the topology of the circuit. In this paper, SSTA is applied to nonzero clock skew circuits in order to determine the accuracy improvement relative to their zero skew counterparts, and also to assess how the results of skew scheduling might be impacted with more accurate statistical modeling. For 99.7% timing yield (3σ variation), SSTA is observed to improve the accuracy, and therefore increase the timing margin, of nonzero clock skew circuits by up to 2.5×, and on average by 1.3×, the amount seen by zero skew circuits.

This work is aimed at the development of a path-based approach to Statistical Static Timing Analysis. Timing Analysis is an absolutely essential step in the verification of Very Large Scale Integration (VLSI) designs. We propose a novel analytical methodology for the fast calculations of VLSI delay. The problem is stated in such a way that becomes equivalent to finding the maximum of a large set of correlated random variables (RVs). For this purpose, a corresponding extension of extreme value theory of weakly-correlated RVs is developed. Results of simulations showing a comparison of our approach with Monte Carlo simulations are presented. Possible applications, extensions of our methodology and future steps are discussed.

Statistical static timing analysis (SSTA) tools have mostly addressed the process variations of devices and lumped interconnect RC effects. This paper provides an overview of interconnect process variations of capacitive coupling and its effect on crosstalk delay and noise. The correlations among parallel plate, lateral and total capacitance is shown. Correlations between resistance and capacitance are illustrated to enable development of a simple and efficient model for delay and noise analysis. Experimental results are shown to validate the assumptions on the linearity of sensitivity of delay and noise to process variations. A methodology to account for process variations in crosstalk delay and noise is proposed.

We present a new technique for statistical static timing analysis (SSTA) based on Markov chain Monte Carlo (MCMC), that allows fast and accurate estimation of the right-hand tail of the delay distribution. A ¿naive¿ MCMC approach is inadequate for SSTA. Several modifications and enhancements, presented in this paper, enable application of MCMC to SSTA. Moreover, such an approach overcomes inherent limitations of techniques such as importance sampling and Quasi-Monte Carlo. Our results on open source designs, with an independent delay variation model, demonstrate that our technique can obtain more than an order of magnitude improvement in computation time over simple Monte Carlo, given an estimation accuracy target at a point in the tail. Our approach works by providing a large number of samples in the region of interest. Open problems include extension of algorithm applicability to a broader class of synthesis conditions, and handling of correlated delay variations. In a broader context, this work aims to show that MCMC and associated techniques can be useful in rare event analyses related to circuits, particularly for high-dimensional problems.

This paper introduces a novel compact implicit model for a probabilistic set of waveforms (PSoW) which arise as representations for uncertain signal waveforms in Statistical Static Timing Analysis (SSTA). In traditional SSTA tools, signals are just represented as (distributions of) arrival time and slew. In our approach, to increase accuracy, PSoW's are used instead. However, to represent PSoW's explicitly, a very large amount of data is necessary, which can be problematic. To solve this problem, a compact implicit model is introduced, which can be characterized with just a handful of parameters. The results obtained show that the implicit model can generate real-life PSoW's with high accuracy.

In this paper, we explore the implementation of Monte Carlo based statistical static timing analysis (SSTA) on a Graphics Processing Unit (GPU). SSTA via Monte Carlo simulations is a computationally expensive, but important step required to achieve design timing closure. It provides an accurate estimate of delay variations and their impact on design yield. The large number of threads that can be computed in parallel on a GPU suggests a natural fit for the problem of Monte Carlo based SSTA to the GPU platform. Our implementation performs multiple delay simulations at a single gate in parallel. A parallel implementation of the Mersenne Twister pseudo-random number generator on the GPU, followed by Box-Muller transformations (also implemented on the GPU) is used for generating gate delay numbers from a normal distribution. The μ and σ of the pin-to-output delay distributions for all inputs and for every gate, are obtained using a memory lookup, which benefits from the large memory bandwidth of the GPU. Threads which execute in parallel have no data/control dependencies on each other. All threads compute identical instructions, but on different data, as required by the Single Instruction Multiple Data (SIMD) programming semantics of the GPU. Our approach is implemented on a NVIDIA GeForce GTX 8800 GPU card. Our results indicate that our approach can obtain an average speedup of about 260x as compared to a serial CPU implementation. With the recently announced quad 8800 GPU cards, we estimate that our approach would attain a speedup of over 785x. The correctness of the Monte Carlo based SSTA implemented on a GPU has been verified by comparing its results with a CPU based implementation.

The impact of parameter variations on timing due to process and environmental variations has become significant in recent years. With each new technology node this variability is becoming more prominent. In this work, we present a general Statistical Timing Analysis (STA) framework that captures spatial correlations between gate delays. Our technique does not make any assumption about the distributions of the parameter variations, gate delay and arrival times. We propose a Taylor-series expansion based polynomial representation of gate delays and arrival times which is able to effectively capture the non-linear dependencies that arise due to increasing parameter variations. In order to reduce the computational complexity introduced due to polynomial modeling during STA, we propose an efficient linear-modeling driven polynomial STA scheme. On an average the degree-2 polynomial scheme had a 7.3x speedup as compared to Monte Carlo with 0.049 units of rms error w.r.t Monte Carlo. Our technique is generic and can be applied to arbitrary variations in the underlying parameters.

We propose a scalable efficient parameterized block-based statistical static timing analysis (SSTA) algorithm incorporating both Gaussian and non-Gaussian parameter distributions, capturing spatial correlations using a grid-based model. As a preprocessing step, we employ an independent component analysis to transform the set of correlated non-Gaussian parameters to a basis set of parameters that are statistically independent. Given the moments of the variational parameters, we use a Pade acute-approximation-based moment-matching scheme to generate the distributions of the random variables representing the signal arrival times and preserve correlation information by propagating arrival times in a canonical form. Our SSTA procedure is able to generate the circuit delay distributions with reasonably small prediction errors. For the ISCAS89 benchmark circuits, as compared to Monte Carlo simulations, we obtain average errors of 0.99%, 2.05%, 2.33%, and 2.36%, respectively, in the mean, standard deviation, and 5% and 95% quantile points of the circuit delay. Experimental results show that our procedure can handle as many as 256 correlated non-Gaussian variables in about 5 min of runtime. For a circuit with |G| gates and a layout with g spatial correlation grids, the complexity of our approach is O(g|G|) .

The timing closure problem (e.g., meeting timing/clock period constraint) is one of the most important problems in the design automation. However, the rapid increase of the impact of the process variation on circuit timing makes the problem much more complicated and unpredictable to tackle in synthesis. This paper addresses a new problem of high-level synthesis (HLS) that effectively takes into account the timing variation. Conventional HLS may simply avoid the timing variation problem by considering the worst case or constant delay model of hardware resources, which are certainly not viable solutions. To overcome the impact of timing variation in HLS, this paper addresses the following two problems: 1) how can the statistical static timing analysis (SSTA) used in logic synthesis be modified and effectively applied to the delay and yield computation in HLS? and 2) how can scheduling and resource binding tasks effectively solve the HLS problem with the objective of minimizing latency under yield constraint? Through an extensive experimentation, we confirm that the proposed variation-aware HLS algorithm is able to reduce the latency by 19.7% under 90% performance yield constraint, compared with the result by conventional timing variation-unaware HLS .

As technology scales into the sub-90 nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as statistical distributions during both analysis and optimization. This paper uses incremental, parametric statistical static timing analysis (SSTA) to perform gate sizing with a required yield target. Both correlated and uncorrelated process parameters are considered by using a first-order linear delay model with fitted process sensitivities. The fitted sensitivities are verified to be accurate with circuit simulations. Statistical information in the form of criticality probabilities are used to actively guide the optimization process which reduces run-time and improves area and performance. The gate sizing results show a significant improvement in worst slack at 99.86% yield over deterministic optimization.

In this paper, a grid-based multiple supply voltage (MSV) assignment method is presented to statistically minimize the total power consumption of 3-D IC. This method consists of a statistical electro-thermal simulator to get the mean and variance of on-chip, a thermal-aware statistical static timing analysis (SSTA) to take into account the thermal effect on circuit timing, the statistical power delay sensitivity-slack product to be the optimization criterion, and an incremental update of statistical timing to save the runtime. The experimental results demonstrate the effectiveness of the developed methodology and indicate that the consideration of the thermal effect in the circuit simulation is imperative.