Analog macromodeling of capacitive coupling faults in digital circuit interconnects

Methods are investigated for reducing events in sequential circuit fault simulation by reducing the number of faults simulated for each test vector. Inactive faults, which are guaranteed to have no effect on the output or the next state, are identified using local information from the fault-free circuit in one technique. In a second technique, the Star-algorithm is extended to handle sequential circuits and provides global information about inactive faults, based on the fault-free circuit state. Both techniques are integrated into the PROOFS synchronous sequential circuit fault simulator. An average 28% reduction in faulty circuit gate evaluations is obtained for the 19 ISCAS-89 benchmark circuits studied using the first technique, and 33% reduction for the two techniques combined. Execution times decrease by an average of 17% when the first technique is used. For the largest circuits, further improvements in execution time are made when the Star-algorithm is included. >

In the first part of the chapter, an introduction to the problem of logic level fault simulation is given together with the overview of existing fault simulation techniques. The remaining part of the chapter describes a new approach to fault simulation based on exact critical path tracing to conduct fault analysis in logic circuits. A circuit topology driven computational model is presented which allows not only to cope with complex structures of nested reconvergent fan-outs but also to carry out the fault reasoning for many test patterns concurrently. To achieve the speed-up of backtracing, the circuit is simulated on higher than traditional gate level. As components of the circuit network, fan-out free regions of maximum size are considered, and they are represented by structurally synthesized BDDs. The latter allow to reduce the number of internal variables in the computation model, and therefore to process the whole circuit faster than on the flat gate-level. The method is explained first, for the stuck-at fault model, and then generalized for an extended class of functional fault model covering the conditional stuck-at and transition faults. The method can be used for simulating permanent faults in combinational circuits, and transient or intermittent faults both in combinational and sequential circuits with the goal of selecting malicious faults for injecting into fault tolerant systems to evaluate their dependability. Experimental results are included to give an idea how efficiently the method works with different fault classes.

~ NJ 07974 Abstract - This paper addresses the problem of simukating transition faults in synchronous sequential circuits. After presenting the concept of the transition fault modell for sequential circuits, we present a fault simulation algorithm for transition faults. The algorithm is a modification of PROOFS, a parallel, differential fault simulation algorithm for stuck faults. A novel fault injection technique is pro- posed. Experimental results show that neither a comprehen- sive functional verification sequence nor a test sequence gen- erated by a sequential circuit test generator for stucck-at faults produces a high fault coverage for transition faults. and finite state machine (FSM) synthesis for delay testabil- ity was adtlressedl. A known reset state is required. The method has limited capability of handling large circuits, because it Icquires the extraction of the complete or partial state transition graph. The approach suggested in 1131 assumes that the circuit is fault-free in the initialization and fault propagation phases. This suggestion is valid if the clock is applied alt a lower speed during the initialization and the fault propagation phases and is applied at a rated speed during the fault activation phase. Slow clock for ini- tialization ,and fault propagation is also assumed in (12). To the author's Icnowledge, no delay-fault simulator €or sequential circuits has been reported before. In this paper, we address the problem of simulating transition faults in sequential circuits. We first enhance the transition fault model for the gate-delay faults and the stuck-open faults in synchronous sequential circuits. We assume the input vectors and clock are applied at speed and at a fixed interval during test application. The primary outputs are: also observed at a fixed interval. We use a transition fault of size n clock cycles to model the defects that cause im extra delay of n clock cycles to a transition. We present a fault simulation algorithm for the proposed fault model. Fault simulation results on the ISCAS-89 sequential benchmark circuits are presented in Section 5.

An automatic test generation system has been developed to detect faults in combinational and sequential circuits. The circuit model treats logic circuits as interconnections of unit- and zero-time-delay gates. A series of time-dependent Boolean equations are derived from the logic network (starting from the network inputs) in terms of sequences of signals (input vectors) on the circuit input leads. These equations account for the effect of specific circuit faults. Many tests, each consisting of a sequence of input signals (input vectors), are needed to detect all single faults in a circuit. Tests are generated from the time-dependent equations using two different strategies: (i) a maximum-cover approach to detect a large number of faults quickly by generating tests for the faults on the circuit-input leads. The fault-detection level achieved by the maximum-cover tests is then evaluated using fault simulation; (ii) tests for individual faults not detected by the maximum-cover approach. ATG has been implemented on the IBM 360, Model 67, and IBM 370, Model 168, computers.

We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinational and sequential circuits. Several dynamic algorithms for compaction in combinational circuits have been proposed but, to the best of our knowledge, no dynamic method has been reported in the literature for compaction in non scan sequential circuits. Our algorithm is based on two key ideas: (1) we first identify bottlenecks that prevent vector compaction and test cycle reduction for test sequences generated thus far, and (2) future test sequences are generated with an attempt to eliminate bottlenecks of earlier generated test sequences. If all bottlenecks of a sequence are eliminated, then the sequence is dropped from the test set. The final test set generated by our algorithm is minimal in the following sense. Static vector compaction or test cycle reduction using set-covering or extended set-covering approaches (for example, reverse or any other order of fault simulation, with any specification of unspecified inputs in test sequences) cannot further reduce the number of vectors. Experimental results on scan and non scan sequential circuits are reported to demonstrate the effectiveness of our algorithm.

Atomic digraphs are applied to fault description and simulation in combinational circuits. Using these graphs, it is possible to simulate both the correct circuit and the presence of any simple or multiple stuck-at fault. The proposed method permits the efficient generation of tests.

Many applications produce acceptable results when their underlying computations are executed in an approximate manner. For such applications, approximate circuits enable hardware implementations that exhibit improved efficiency for a given quality. Previous efforts have largely focused on the design of approximate combinational logic blocks such as adders and multipliers. In practice, however, designers are concerned with the quality of outputs generated by a sequential circuit after several cycles of computation, rather than an embedded combinational block. We propose ASLAN (Automatic methodology for Sequential Logic ApproximatioN), the first effort towards the synthesis of approximate sequential circuits. Given a sequential circuit and an output quality constraint, ASLAN creates an approximate version of the circuit that consumes lower energy, while meeting the specified quality bound. The key challenges in approximating sequential circuits are (i) to model how errors due to approximations are generated, re-circulate through the combinational logic over multiple cycles of operation, and eventually impact quality of the final output, and (ii) to select the most beneficial approximations, i.e., those that result in higher energy savings for smaller impact on quality. ASLAN addresses the first challenge by constructing a virtual Sequential Quality Constraint Circuit (SQCC) and utilizing formal verification techniques to ensure that the selected approximations meet the quality constraint. To address the second challenge, ASLAN identifies combinational blocks in the sequential circuit that are amenable to approximation, generates local quality-energy trade-off curves for them, and uses a gradient-descent approach to iteratively approximate the entire sequential circuit. We used ASLAN to automatically synthesize approximate versions of ten sequential benchmarks, resulting in energy reductions of 1.20X-2.44X for tight quality constraints, and 1.32X-4.42X for moderate quality constraints. We present case studies of using the approximate circuits generated by ASLAN in two popular applications - MPEG Encoding and K-Means Clustering - obtaining 1.32X energy savings with 0.5% PSNR degradation, and 1.26X energy savings with 0.8% increase in mean cluster radius, respectively.

This paper proposes a Verilog HDL-based fault simulation and testing environment for embedded IP core-based digital systems, specifically targeted towards synchronous memory-based systems, for detecting single stuck-line faults. The simulator emulates a typical BIST (built-in self-testing) environment with test pattern generator that sends its outputs to a MUT (module under test) and the output streams from the MUT are fed into a response data analyzer. A fault is detected if the module response is different from that of the fault-free module. All of the faults detected are recorded in a detailed simulation results file. The fault simulator is suitable for testing sequential circuits described in Verilog HDL. The automatic fault simulator generates tests for the MUT described at the gate and flip-flop level. There are very few constraints on the circuit. The simulation process is completely automatic, and requires no intervention from the designer during the test generation process. The paper describes in detail the architecture and applications of the fault simulator along with the models of sequential elements used. Results on some simulation experiments on ISCAS 89 sequential benchmark circuits are also provided.

A study is made of single-fault fault collapsing in sequential logic circuits. Two major phenomena, self-hiding (SH) and delayed reconvergence (DR), which arise from the existence of feedback paths and storage elements in sequential circuits, are analyzed and found to cause the dominance relationship which is valid in combinational circuits but no longer valid in sequential circuits. A fault-collapsing procedure is proposed to collapse faults in sequential circuits. It first collapses faults in the non-SAD (self-hiding and delayed-reconvergence) gates of the combinational part of the sequential circuit and then further collapses faults by identifying the prime fan-out branches. Finally, it collapses faults in feedback lines. The collapsed faults constitute a sufficient representative set of prime faults.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

Efficient march test for 3-coupling faults in random access memories

A fast fault simulation approach based on ordinary logic emulation is proposed. The circuit configured into our system that emulates the faulty circuit's behaviour is synthesized from the good circuit and the given fault list in a novel way. Fault injection is made easy by shifting the content of a fault injection scan chain or by selecting the output of a parallel fault injection selector, with which we get rid of the time-consuming bit-stream regeneration process. Experimental results for ISCAS-89 benchmark circuits show that our serial fault emulator is about 20 times faster than HOPE. The speedup grows with the circuit size by our analysis. Two hybrid fault emulation approaches are also proposed. The first reduces the number of faults actually emulated by screening off faults not activated or with short propagation distances before emulation, and by collapsing nonstem faults into their equivalent stem faults. The second reduces the hardware requirement of the fault emulator by incorporating an ordinary fault simulator.

TPG for synchronous sequential circuits has received wide attention over the last two decades, yet unlike for (full-scan) combinational circuits, for many sequential benchmark circuits 100% fault efficiency still cannot be reached. This illustrates the complexity of sequential circuit ATPG. The huge search space, which exists during sequential circuit TPG, is the main reason for this complexity. Powerful techniques and heuristics are required to cope with this search space. One way to reduce the search space is the detection of illegal states. These states cannot be justified with an initialization sequence. In this paper, we propose new techniques to find illegal states and to remove the over-specification of these states by searching common fractions in the list of illegal states. Experimental results demonstrate the importance of an as complete as possible illegal state list: Higher fault efficiencies are reached for the sequential ISCAS'89 circuits (1989) and industrial circuits, together with a large reduction of CPU time.

Mixed analog and digital mode simulators have been available for accurate /spl alpha/-particle-induced transient fault simulation. However, they are not fast enough to simulate a large number of transient faults on a relatively large circuit in a reasonable amount of time. In this paper, we describe a gate-level transient fault simulation environment which has been developed based on realistic fault models. Although the environment was developed for /spl alpha/-particle-induced transient faults, the methodology can be used for any transient fault which can be modeled as a transient pulse of some width. The simulation environment uses a gate level timing fault simulator as well as a zero-delay parallel fault simulator. The timing fault simulator uses logic level models of the actual transient fault phenomenon and latch operation to accurately propagate the fault effects to the latch outputs, after which point the zero-delay parallel fault simulator is used to speed up the simulation without any loss in accuracy. The environment is demonstrated on a set of ISCAS-89 sequential benchmark circuits.

Test vector omission is a static test compaction procedure for functional test sequences that removes unnecessary test vectors from a sequence. The test vector omission procedure requires fault simulation for every test vector (or subsequence) that it considers for omission. It was noted earlier that it is possible to reduce the set of simulated faults based on the clock cycles where the faults are detected. However, this reduction is effective only for the later test vectors of a sequence. This paper defines a minimal set of faults that need to be simulated for the omission of a test vector by considering, in addition to detection clock cycles, also clock cycles where test subsequences start. The former are computed by a conventional sequential fault simulation process. For the latter, the paper introduces a sequential reverse order fault simulation process, and an approximation with a reduced computational complexity. Experimental results show significant reductions in the run time for test vector omission without affecting the level of compaction.

In this paper, a time and memory-efficient diagnostic fault simulator for sequential circuits is first presented. A distributed diagnostic fault simulator is then presented based on the sequential algorithm to improve the speed of the diagnostic process. In the sequential diagnostic fault simulator, the number of fault-pair output response comparisons has been minimized by using an indistinguishability fault list that stores the faults that are indistinguishable from each fault. Due to the symmetrical relationship of the fault-pair distinguishability, fault list sizes are reduced. Therefore, the different diagnostic measures of a given test set can be generated very quickly using a small amount of memory. To further speed up the process of finding the indistinguishable fault list for each fault, a distributed approach is proposed and developed. The major idea for this approach is that each processor constructs the indistinguishable fault lists for a certain percentage of faults only. Experimental results show that the sequential diagnostic fault simulator runs faster and uses less memory than a previously developed one and that the distributed algorithm even achieves superlinear speedup for a very large sequential benchmark circuit, s35932. To the authors' knowledge, no distributed diagnostic fault simulation system for sequential circuits has been proposed before.