- Research Article
3
- 10.13176/11.511
An Image Visual Quality Assessment Method Based on SIFT Features
- Jan 01, 2013
- Journal of Pattern Recognition Research
- Guangyi Chen + 1 more +1
Close The Journal of Pattern Recognition Research (JPRR) provides an international forum for the electronic publication of high-quality research and industrial experience articles in all areas of pattern recognition, machine learning, and artificial intelligence. JPRR is committed to rigorous yet rapid reviewing. Final versions are published electronically (ISSN 1558-884X) immediately upon acceptance. Submit Manuscript An Image Visual Quality Assessment Method Based on SIFT Features Guangyi Chen, Stephane Coulombe JPRR Vol 8, No 1 (2013); doi:10.13176/11.511
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