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Charge Density Analysis from X-Ray Diffraction

  • Sep 20, 2011
  • R Saravanan +1 more
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Abstract

This chapter provides a survey of current applications of X-ray diffraction techniques in crystal structure analysis, with some focus on recent advances that have been made in the scope and potential for carrying out crystal structure determination directly from diffraction data. The basic concepts of crystal structure analysis, Rietveld refinement, and the concepts used for the estimation and analysis of charge density in a crystal are discussed. The more reliable models for charge density estimation like multipole formalism and maximum entropy method are discussed in detail. The local structural analysis technique atomic pair distribution function is also discussed.

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