Constraint-Based Hierarchical Untestability Identification for Synchronous Sequential Circuits

The paper proposes a hierarchical untestable stuck-at fault identification method for non-scan synchronous sequential circuits. The method is based on deriving, minimizing and solving test path constraints for modules embedded into Register-Transfer Level (RTL) designs. First, an RTL test pattern generator is applied in order to extract the set of all possible test path constraints for a module under test. Then, the constraints are minimized using an SMT solver Z3 and a logic minimization tool ESPRESSO. Finally, a constraint-driven deterministic test pattern generator is run providing hierarchical test generation and untestability proof in sequential circuits. We show by experiments that the method is capable of quickly proving a large number of untestable faults obtaining higher fault efficiency than achievable by a state-of-the-art commercial ATPG. As a side effect, our study shows that traditional bottom-up test generation based on symbolic test environment generation at RTL is too optimistic due to the fact that propagation constraints are ignored.

Much effort in register transfer level (RTL) design has been devoted to developing types of tools. However, given the highly complex nature, and lack of control on RTL design, push-button type synthesis is not accepted by many designers. Interactive design with assistance of algorithms and tools can be more effective if it provides control to the steps of synthesis. In this paper, we propose an interactive RTL design environment which enables designers to control the design steps and to integrate hardware components into a system. Our design environment is targeting a generic RTL processor architecture and supporting pipelining, multicycling, and chaining. Tasks in the RTL design process include clock definition, component allocation, scheduling, binding, and validation. In our interactive environment, the user can control the design process at every stage, observe the effects of design decisions, and manually override synthesis decisions at will. We present a set of experimental results that demonstrate the benefits of our approach. Our combination of automated tools and interactive control by the designer results in quickly generated RTL designs with better performance than fully-automatic results, comparable to fully manually optimized designs.

Today, VLSI design has progressed to a stage where it needs to incorporate methods of testing circuits. The Automatic Test Pattern Generation (ATPG) is a very attractive method and feasible on almost any combinational and sequential circuit. Currently available automatic test pattern generators (ATPGs) generate test sets that may be excessively long. Because a cost of testing depends on the test length, compaction techniques have been used to reduce that length. The motivation for studying test compaction is twofold. Firstly, by reducing the test sequence length, the memory requirements during the test application and the test application time are reduced. Secondly, the extent of test compaction possible for deterministic test sequences indicates that test pattern generators spend a significant amount of time generating test vectors that are not necessary. The compacted test sequences provide a target for more efficient deterministic test generators. Two types of compaction techniques exist: dynamic and static. The dynamic test sequence compaction performs compaction concurrently with the test generation process and often requires modification of the test generator. The static test sequence compaction is done in a post-processing step to the test generation and is independent of the test generation algorithm and process. In the thesis, a new idea for static compaction of test sequences for synchronous sequential circuits has been proposed. Our new method - SUSEM (Set Up Sequence Elimination Method) uses the circuit state information to eliminate some setup sequences for the target faults and consequently reduce the test sequence length. The technique has been used for the test sequences generated by HITEC test generator. ISCAS89 benchmark circuits were used in our experiments, for some circuits which have a large number of target faults and relatively small number of flip-flops, the very significant compactions have been obtained. The more important is that this method can be used to improve the test generation procedure unlike most static compaction methods which blindly or randomly remove parts of test vectors and cannot be used to improve the test generators.

State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (hip-hops) that are either difficult to set or unsettable. This is achieved by performing test generation on certain transformed circuits to identify state elements that are not settable to specific logic values. Two applications that benefit from this identification are sequential circuit test generation and partial scan design. The knowledge of the state space is shown to be useful in creating early backtracks in deterministic test generation. Partial scan selection is also shown to benefit from the knowledge of the difficult-to-set hip-hops. Experiments on the ISCAS89 circuits are presented to show the reduction in time for test generation and the improvements in the testability of the resulting partial scan circuits.

An efficient sequential circuit test generation algorithm is presented. The algorithm is based on PODEM and uses a nine-valued logic model. Among the novel features of the algorithm are use of an initial time-frame algorithm and correct implementation of a solution to the previous state information problem. The initial time-frame algorithm determines the number of time-frames required to excite the fault under test and the number of time-frames required to observe the excited fault. This step saves the test generator from doing unnecessary search in the input space. Test generation is done strictly in forward time. The algorithm saves good machine circuit state after test generation to aid in future test generation. Faulty machine state is set to unknown whenever test generation for a fault is begun. This solves the previous state information problem, which has often been ignored by existing test generators. >

A method to perform diagnostic test generation in sequential circuits by modifying a conventional test generator is presented. The method utilizes circuit netlist modification along with a forced value at primary input in the modified circuit techniques to reduce the computational effort for diagnostic test pattern generation in sequential circuits. Speed-up of the diagnostic ATPG process is achieved by the identification of states that are impossible to justify with three-valued logic.

In this paper, we discuss the relationship between the test generation complexity for path delay faults (PDFs) and that for stuck-at faults (SAFs) in combinational and sequential circuits using the recently introduced τk-notation. On the other hand, we also introduce a class of cyclic sequential circuits that are easily testable, namely two-column distributive state-shiftable finite state machine realizations (2CD-SSFSM). Then, we discuss the relevant conjectures and unsolved problems related to the test generation for sequential circuits with PDFs under different clock schemes and test generation models.

In order to reduce the time-to-market and simplify gate-level test generation for digital integrated circuits, GA-based functional test generation techniques are proposed for behavioral and register transfer level designs. The functional tests generated can be used for design verification, and they can also be reused at lower levels (i.e. register transfer and logic gate levels) for testability analysis and development. Experimental results demonstrate the effectiveness of the method in reducing the overall test generation time and increasing the gate-level fault coverage.

Test Pattern Generation (TPG) for sequential and/or 3-state circuits involves two important aspects which often are handled incorrectly: bus conflict detection and completeness of search in TPG. The correct handling of both aspects strongly depends on the signal model used by TPG. We propose a novel, set-based, signal model using the power-set (i.e., the set of all possible subsets) of the basic values {0, 1, Z}. TPG using this signal model guarantees complete search, provides exact bus-conflict detection, and is more efficient than TPG using the traditional signal models for J-state and sequential circuits. Experimental results demonstrate this by higher fault efficiencies combined with a large reduction of backtracking and computing time for sequential ISCAS'89 and industrial circuits.

According to Moore's Law, number of transistors on chip doubles in every next two years, So the complexity of the circuit increases. So it needs to be careful in designing and verification. Register Transfer Level (RTL) designing and its verification is also most important part of circuit design. The intent behind verification is to check that design meets all system specification and requirements or not. It is important to verify RTL before simulation and synthesis the design because It save clock cycle and time of simulation. This paper is focused on the RTL verification tool, Such as HAL linting and Spyglass RTL signoff tool. This type of RTL verification is used to find bugs and error in design before synthesis. It is easy to debug RTL design and pinpoint the problem and their solution. It is important to identify design issues as early as possible before synthesis RTL design.

Transaction-level modeling is used in hardware design for describing designs at a higher level compared to the register-transfer level (RTL) (e.g. Cai and Gajski in CODES+ISSS '03: proceedings of the 1st IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis, pp. 19---24, 2003; Chen et al. in FMCAD '07: proceedings of the formal methods in computer aided design, pp. 53---61, 2007; Mahajan et al. in MEMOCODE '07: proceedings of the 5th IEEE/ACM international conference on formal methods and models for codesign, pp. 123---132, 2007; Swan in DAC '06: proceedings of the 43rd annual conference on design automation, pp. 90---92, 2006). Each transaction represents a unit of work, which is also a useful unit for design verification. In such models, there are many properties of interest which involve interactions between multiple transactions. Examples of this are ordering relationships in sequential processing and hazard checking in pipelined circuits. Writing such properties on the RTL design requires significant expertise in understanding the higher-level computation being done in a given RTL design and possible instrumentation of the RTL to express the property of interest. This is a barrier to the easy use of such properties in RTL designs. In this paper, we consider specification of interaction properties at the transaction-level and the subsequent encoding of the property and the transaction-level model as a finite-state system for model checking. We discuss how the encoded finite-state system can be automatically generated from the specification of the property and the transaction-level model, and illustrate this through simple examples.

Design for testability (DFT) is introduced to reduce the complexity of testing integrated circuit and help improve fault coverage. However, conventional DFT with additional 2-to-1 multiplexer (MUX) might add an increasing amount of delay and area overhead. Therefore, register transfer level (RTL) scan design is introduced to overcome this problem. This paper aims to present the development of an ASIC with RTL scan design by using multiple scan paths instead of the conventional technique, which is gate-level (GL) scan insertion to insert scan cells. This method inserts multiple scan cells by utilizing the existing multiplexer and operational units in order to reduce area overhead and delay. Besides, multiple scan paths are implemented instead of a single scan chain to reduce the complexity of the testing process, where a single scan chain has long test application times due to the high number of clock cycles for the scan chain process. RTL design is also modified by adding an extra gate for multiple scan chain insertion. The graph is derived in order to analyse the connection between registers such that the multiple scan paths can be determined accordingly. Synopsys tool is used for synthesized, placement and routing and performing automatic test pattern generation while static timing analysis is used to verify the results of the setup slack time for ASIC design. The simulation result shows that multiple scan paths insertion at RTL level has an area overhead and slack time of about 3.79% and 0.44ns less compared to multiple scan paths insertion at GL for a finite impulse response circuit with comparable high fault coverage and small delay. A comparison of the performance metrics such as area, setup slack time, and fault coverage of the multiple scan chain is done between the RTL scan and GL scan.

The growing complexity of modern digital design makes designers shift toward starting design exploration using high-level languages, and generating register transfer level (RTL) design from system level modeling (SLM) using high-level synthesis or manual transformation. Unfortunately, this translation process is very complex and may introduce bugs into the generated design. In this paper, we propose a novel SLM and RTL sequential equivalence checking method. The proposed method bases on Finite state machines with datapath (FSMD) equivalence checking method. The proposed method recognizes the corresponding path-pairs of FSMDs using machine learning (ML) technique from all the paths. And then it compares the corresponding path-pairs by symbolic simulation. The advantage of our method is that it separates the corresponding path-pairs from all the paths and avoids blind comparisons of path-pairs. Our method can deal with greatly different SLM and RTL designs and dramatically reduce the complexity of the path-based FSMD equivalence checking problem. The promising experimental results show the efficiency and effectiveness of the proposed method.

Today, the most common abstraction level for manual design capture is at the so called register transfer level. At this level, all synchronous registers, latches and the combinational logic between the sequential elements are described in a hardware description language such as Verilog or VHDL. The description is then transformed into logic gate implementations based on a technology specific cell library, a procedure known as logic synthesis. This allows a designer to handle more complex design because detailed manual analysis need not be made at the logic gate level that is more tedious and error prone. Register transfer level is certainly not the only starting point for automated hardware synthesis. The analysis and synthesis of digital circuits are still being pushed toward even higher level of abstraction for manual manipulation. For example, macro block level specification and synthesis has been practiced in some design areas. The register transfer and macro block level design methodologies are part of the architecture and system level techniques to be discussed in this chapter.

Researchers have proposed different methods for testing digital systems and circuits in the last couple of decades. The need for testing digital logic circuits has become more important than ever due to the growing complexity of such systems. During the design phase, testing is focusing on design defects, as well as manufacturing and wear out type of defects. Failures in digital systems could be caused, for example, by design errors, the use of inherently probabilistic devices, and manufacturing variability. As a way to test digital systems in a more efficient way, automated test generation has been proposed to automatically create tests that can quickly and accurately identify faulty components. Examples of such techniques are the sequential test generation, the scan path testing, and the random test generation techniques. With the research domain becoming more mature and growing, it is essential to systematically identify, analyze, and classify these contributions. We performed a systematic mapping study of automated test generation for digital circuits aimed at providing an overview of the application of these techniques. We focused on three of the most widely-used and well-supported hardware description languages (HDLs) for digital systems: Verilog, SystemVerilog, and VHDL. Our results suggest that the majority of the test generation methods for digital circuits are focused on the behavioral and register-transfer design levels. Fault-independent and fault-oriented test generation are the most frequently reported types of test generation methods, while HDL model simulation is the most common test generation technology used to search for test cases in these academic studies. While the results are suggesting a growing interest in this area, the majority of articles are published as conferences papers. Our results show that only 31% of the methods are implemented as software tools and only 63% of all contributions are actually generating executable test cases. This study makes three important contributions, (i) a state-of-the-art of test generation for digital system designs research is provided, (ii) the reported characteristics are identified in both the primary papers and experimental reports, (iii) gaps and opportunities for future test generation for digital system designs research are identified.