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  • https://doi.org/10.1117/12.3072066Copy DOI Icon

Dual surface form measurement of optics using a contact profilometer

  • Dec 3, 2025
  • Jayesh Navare +4 more
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Abstract

This paper investigates the feasibility of measuring form error of all the optical surfaces on a lens in a single setup using a dual tipped diamond stylus. Two lenses were measured with a dual, 2 μm conisphere tipped, diamond stylus on a tactile profilometer having a phase grating interferometer (PGI) gauge. When the lens was mounted in a horizontal orientation, one of the stylus tips was used to measure the optical surface on top of the lens (hereafter referred to as measurement using normal bias), whereas the other stylus tip (180˚ opposite) was used to measure the optical surface on bottom of the lens (hereafter referred to as measurement using reverse bias). To validate the results from the measurement using reverse bias, a given optical surface was measured using both normal bias and reverse bias of the PGI gauge with a suitable fixture. Moreover, this surface was also measured on a LuphoScan instrument, a 3D non-contact profiler based on multiwavelength interferometry, and an average form error profile was extracted from the 3D surface form error map. Surface form was quantified by evaluating peak-to-valley (PV), and root mean square (RMS) parameters to compare the results obtained from measurements using normal bias, reverse bias, and multiwavelength interferometer. It is shown that there is a good agreement not only between normal bias and reverse bias measurements using PGI gauge but also with measurement performed on multiwavelength interferometer. With this additional capability of PGI gauge to measure form error of all the optical surfaces in a single setup, results from both surfaces can be correlated to determine wedge, commonly referred to as inner centration, decenter error between the two surfaces, and thickness of the lens under test.

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