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  • https://doi.org/10.1088/0957-4484/18/8/084019Copy DOI Icon

Dynamic force microscopy with quartz tuning forks at high oscillation amplitudes

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Abstract

Dynamic force microscopy (DFM) with the self-oscillator (SO)method allows reasonably high scanning rates even with highQ-factors of the resonant force sensor, typical of cantilevers in ultra-high vacuum and ofquartz tuning forks. However, due to simpler interpretation of force spectroscopymeasurements, small oscillation amplitudes (sub-nm level) are generally preferred. Inapplications like ‘apertureless’ scanning near-field optical microscopy (SNOM), oscillationamplitudes of the order of 5–10 nm are needed to increase optical sensitivity and toapply standard optical artefact suppression methods. This motivates the studyof the behaviour of tuning forks driven at such high amplitudes, as comparedto usual air-operated cantilevers. Both constant-excitation-amplitude (CE) andconstant-oscillation-amplitude (CA) modes of SO-DFM are analysed, since the CA mode ismore convenient for SNOM applications, denoting remarkable differences. In particular,possible instability effects, previously found in CE mode, are not anticipated for CAmode. It is shown how resonance and approach (‘isophase’) curves in both modescan be conveniently described in terms of the usual ‘normalized frequency shift’γ and of a‘normalized gain’ η, defined as a measurement of surface dissipation.

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