- https://doi.org/10.1016/j.ijthermalsci.2026.110875
Electrothermal investigation of contact metal structural variation in 28 nm FDSOI MOSFETs
- Sep 1, 2026
- International Journal of Thermal Sciences
- Tae Young Yoon +5 more
Abstract
Electrothermal investigation of contact metal structural variation in 28 nm FDSOI MOSFETs