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Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems

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Abstract

This paper demonstrates a convenient experimental tech- nique for measuring the resolution of a digital imaging system. The spa- tial frequency response of the system is obtained by deriving the modu- lation transfer function (MTF) from the measured contrast transfer function (CTF). Basic signal-processing techniques are used to establish a relationship between the MTF and the CTF. Experimental methodology is discussed with respect to avoidance of shift variation in the CTF. Dis- crete Fourier transformation is applied for a power-spectrum analysis of the MTF. Using the CTF as a measure of performance, a series of ex- periments were carried out to characterize an imaging system based on an integrated CMOS camera. The experimental results showed that this approach can be applied in general, for the assessment of spatial reso- lution for digital imaging systems. © 1998 Society of Photo-Optical Instrumenta- tion Engineers. (S0091-3286(98)00609-6)

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