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  • https://doi.org/10.1109/icnc-fskd67701.2025.11197998Copy DOI Icon

Fine-Tuning a Deep Metric Learning Model for Few-Shot Specific Emitter Identification

  • Jul 26, 2025
  • Zhen Liu +5 more
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Abstract

In recent years, the growing complexity of the electromagnetic environment has rendered traditional methods of specific emitter identification (SEI) inadequate in meeting the increasing demands for both high accuracy and generalization capability. Moreover, the high cost and confidentiality associated with emitter data have made the acquisition of large-scale labeled datasets exceedingly difficult, further intensifying the challenges in SEI tasks. To address these issues, this paper proposes a deep metric learning-based method for SEI. The approach first leverages a large-scale emitter signal dataset to train a high-accuracy, generalizable pre-trained model. Subsequently, the pre-trained model is fine-tuned in few-shot scenarios to achieve accurate emitter identification under data-scarce conditions. Experimental results indicate that the fine-tuning method, built upon the pre-trained model, demonstrates excellent SEI performance even with limited training data. Specifically, when only 10% of the training data is used, the model achieves an impressive accuracy of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathbf{9 0 \%}$</tex>.

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