- Research Article
3
- 10.1007/s12596-009-0001-1
Interaction of polarized beam with copper surface and its application for metal-dielectric discrimination of vero board
- Mar 01, 2009
- Journal of Optics
- S Chakraborty + 1 more +1
The state of polarization of a specularly reflected beam from metal and dielectric surface is mainly dependent on the optical constants of the materials, wavelength of the illuminating beam, state of polarization and angle of incidence of the incident beam. In the present study the state of polarization of the reflected beam is analyzed with the help of Stokes formalism where the input beam is linearly polarized. The intensity variation of the reflected beam passing through an analyzer is then studied by varying the orientation of the transmission axis of the analyzer and acquiring the image of the metal-dielectric (copper film deposited on microscope slide) surface for each angular position of the analyzer. The degree of linear polarization (DOLP) as well as fractional non-linear polarization (FNTP) of the image of the metal-dielectric surface is evaluated both theoretically and experimentally and for both monochromatic and polychromatic incident illumination. A good agreement is observed between theoretical and experimental results. For estimation of pixel-wise variation of DOLP and FNLP of the metal dielectric surface, the spectral Stokes parameters for each pixel location are computed with the help of measurement matrix. As a practical application of the study, a printed circuit board (vero board) is used as a metal-dielectric (perforated copper strip on glossy dielectric substrate) surface for observing pixel-wise DOLP and FNLP variation. The resultant DOLP and FNLP images for Vero board show the metal-dielectric discrimination capability under polychromatic illumination.
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