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  • https://doi.org/10.17760/d20467199Copy DOI Icon

Holistic methods for protecting and testing embedded devices

  • Jan 1, 2022
  • Alejandro Mera
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Abstract

The increasing network connectivity of embedded devices in the IoT era hasexposed them to the hostile threats that pullulate in the cyberspace. Multiple reported cyberattacks on these devices supporting critical infrastructure, medical devices, or automobiles reflect the harmful effects of this exposition and highlight the paramount need to maintain their security. The cyberattacks usually result from the exploitation of bugs and vulnerabilities rooted in the firmware of these devices. These firmware defects are not different from those affecting the software of regular computers. However, they are more challenging to detect and mitigate. The main reasons for this particular difficulty are the unique characteristics of the embedded devices, including diversity of hardware and firmware architectures, strong coupling between firmware and peripherals, and constrained computing, power consumption and timing capabilities. In this thesis, we present three novel solutions that holistically tackle the uniquecharacteristics of embedded devices to detect and mitigate firmware defects. First, to protect and isolate DMA operations, we present D-BOX, the reference architecture and systematic method that holistically enable secure DMA operations, providing strong security properties, a practical definition of a capability-based security policy, high-performance, and low power consumption. Second, to holistically test firmware, we present DICE, a drop-in solution for firmware analyzers to emulate and manipulate DMA input channels, which current firmware analyzers ignore regardless of their profound implications on the security, power, and performance of embedded devices. Finally, to test firmware as a whole with the highest fidelity, we present SHIFT, a semi-hosted fuzz testing framework that runs firmware natively in an MCU, supporting peripherals with zero-emulation, real-time and DMA operations, and state-of-the-art instrumentation for fault detection.--Author's abstract

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