„How exactly does this work?”

The effects of sample storage, target preparation and annealing temperature on a nested polymerase chain reaction (PCR) test for Toxoplasma gondii DNA were investigated with experimentally seeded amniotic fluids to simulate congenital infection. Aliquots of 17 amniotic fluid samples remaining after investigation for conditions other than toxoplasmosis and seeded to contain small numbers of T. gondii tachyzoites, were tested after storage for up to 2 weeks. There was no deterioration in test sensitivity on samples stored for 1-2 weeks at room temperature; thus, samples sent by post to reference laboratories are acceptable for examination. There was no significant difference in the results from two target preparation methods or two different annealing temperatures. One-to-ten parasites were detectable in 13 of 17 test samples. The significant feature in the remaining four samples was the use of washed stored parasites to seed the amniotic fluids rather than any feature of the amniotic fluids used or the test. False positive results were found in up to 15% of unseeded amniotic fluid samples, which contrasts with only 1.9% for the same PCR test in other routine or negative control samples tested as part of the laboratory's reference diagnostic work. The difference illustrates the increased risk of cross-contamination in PCR when the majority of specimens tested are positive. The results suggest that PCR techniques are likely to be sensitive and effective tools for the routine diagnosis of congenital toxoplasma infection.

Comparison of different sample and target preparation procedures for PIXE analysis of biological materials

For those genomes low in repetitive DNA, hybridizing total genomic DNA to high‐density expression arrays offers an effective strategy for scoring single‐feature polymorphisms (SFPs). Of the ∼2.5 gigabases that constitute the maize (Zea mays L.) genome, only 10 to 20% are genic sequences, with large amounts of repetitive DNA intermixed throughout. Therefore, a target preparation method engineered to generate a high genic–to–repetitive DNA ratio is essential for SFP detection in maize. To that end, we tested four gene enrichment and complexity reduction target preparation methods for scoring SFPs on the Affymetrix GeneChip Maize Genome Array (“Maize GeneChip”). Methylation filtration (MF), C0t filtration (CF), mRNA‐derived cRNA, and amplified fragment length polymorphism (AFLP) methods were applied to three diverse maize inbred lines (B73, Mo17, and CML69) with three replications per line (36 Maize GeneChips). Our results indicate that these particular target preparation methods offer only modest power to detect SFPs with the Maize GeneChip. Most notably, CF and MF are comparable in power, detecting more than 10 000 SFPs at a 20% false discovery rate. Although reducing sample complexity to ∼125 megabase by AFLP improves SFP scoring accuracy over other methods, only a minimal number of SFPs are still detected. Our findings of residual repetitive DNA in labeled targets and other experimental errors call for improved gene‐enrichment methods and custom array designs to more accurately array genotype large, complex crop genomes.

Based on the requirements regarding target, reproducibility, and specimen surface quality, an automatic system for controlled material removal and target preparation has been developed. The tool is for metallographic failure analysis of electric and microelectronic components, and provides an accuracy of 5 micrometer. This article presents details of sample preparation and device evaluation methods. The images presented show typical objects of examination in the analysis of microstructures and materials in the electronics packaging industry with brief comments. For automatically controlled material removal and preparation, the tool offers alignment and measuring of the sample prior to the preparation. The desired preparation layers were achieved precisely and reproducibly with several specimens of the same kind. The automatic preparation system allowed the preparation of critical samples within a short time, with high precision and with excellent reproducibility.

Ti-Ni-thin films fabricated by sputter-deposition are applicable in microdevices like: micropumps, microwrappers, and microgrippers [1–5], since they exhibit excellent shape memory effects and good mechanical properties [6]. The addition of a third element like Pd, Pt or Hf increases the transformation temperature. It is already reported that the substitution of Pd for Ni can increase the transformation temperatures of Ti-Ni from approximately room temperature to 800 K [7]. The phase transformation characteristics within the Ti-Ni-Pd system were recently investigated by combinatorial materials science methods [8]. For the first time the complete composition region showing a reversible phase transformation was determined. For non-transforming compositions, e.g. Ti64Ni20Pd16, X-ray diffraction results showed pronounced amounts of Ti2Pd and Ti2Ni precipitates. However the mechanism of how the precipitates might hinder the phase transformation could not be deduced. Therefore a TEM sample of Ti64Ni20Pd16 was cut form the Ti-Ni-Pd composition spread by target preparation methods using a focused ion beam (FIB) system with attached energy dispersive X-ray (EDX) analysis.

Traditional preoperative reminding services have been applied to enhance the quality of bowel preparation for colonoscopy. In this study we aimed to evaluate the effectiveness of an automated electronic reminder system (E-reminder) on improving bowel preparation and the quality of preoperative education before colonoscopy. From August 2021 to March 2022, 833 outpatients aged 50-75 years who underwent colonoscopy were included and randomly assigned to the E-reminder group and the control group. While the control group received routine preoperative education. The E-reminder group received automatic phone call, text message reminders and web services regarding the details of bowel preparation before the colonoscopic examination. The quality of bowel preparation was evaluated by the Boston Bowel Preparation Scale (BBPS) score and the previously validated objective evaluation scale of automatic BBPS (e-BBPS). In manual assessment, the rate of adequate bowel preparation was improved in the E-reminder group of intention-to-treat population using BBPS(60.7% vs 54.5%, P = 0.01). The percentage of objective evaluated adequate bowel preparation using e-BBPS in the E-reminder group of per-protocol population was significantly higher than that in the control group (76.9% vs 69.2%, P = 0.02). E-reminder was an effective tool to improve the quality of bowel preparation and compliance with medical instructions. It may be regarded as an efficient and convenient education tool, improving the quality of medical service.

Combination of multiple classifiers for post-placement quality inspection of components: A comparative study

Wolfgang Beyer: A Groundwater Scientist from Dresden.

The assembly of miniature components on Printed Circuit Boards (PCBs) poses numerous challenges to each process step. The 0201 components are miniature components which are 0.020” in length and 0.010” in width. The assembly of 0201s using process settings that are currently in-place may result in defects including bridging, tombstoning and solderballing. The objectives of this research are to evaluate two no-clean eutectic solder pastes, determine ‘optimum’ print parameters, and develop good reflow profiles to eliminate defects that are commonly observed during the assembly of 0201 components. The two no-clean solder pastes are evaluated and the ‘optimum’ print parameters were determined through a full factorial experiment. Statistical tests, such as the paired t-test and the calculation of the coefficient of variation of the volume of the solder paste deposited, helped to evaluate the two solder pastes. A comprehensive literature review was conducted to arrive at the initial reflow parameters. The solder paste printing and reflow processes were modified as per the findings and were implemented to assemble several PCBs (test vehicles) with 0201s on them. The assemblies were inspected for defects, both visually and using a 10X microscope. In addition, the assemblies were also inspected using automated optical inspection equipment. No defects were observed during these inspections. Consequently, it can be concluded that the recommended changes to the printing and reflow soldering processes have resulted in the successful development of a viable ‘drop in’ process for the assembly of 0201 components.

The Fourteenth Annual Exotic Beam Summer School EBSS 2015 was held August 2nd - August 7th, 2015, and belongs to the series of summer programs aimed at educating future workforce in nuclear physics-related areas, mostly about the challenges of radioactive ion beam physics. Through these schools the research community will be able to exploit fully the opportunities created by the exotic beam facilities. These facilities in the US include CARIBU at ANL, the NSCL and the future FRIB laboratory as well as smaller-scale university laboratories. The skill set needed by the future workforce is very diverse and a fundamental understanding of theoretical, technical, computational and applied fields are all important. Therefore, the Exotic Beam Summer Schools follow a unique approach, in which the students not only receive lectures but also participate in hands-on activities. The lectures covered broad topics in both the experimental and theoretical physics of nuclei far from stability as well as radioactive ions production and applications. The afternoons provided opportunities for "hands-on" projects with experimental equipment and techniques useful in FRIB research. Five activities were performed in groups of eight students, rotating through the activities over the five afternoons of the school. The center of the activities was an experiment at the FSU tandem accelerator, measuring the angular distribution and cross section of the 12C(d,p)13C transfer reaction, measured with a silicon telescope in a scattering chamber. The experimental data were analyzed by performing a DWBA calculation with the program DWUCK, and the resulting spectroscopic factors were compared to a shell model calculation. The other activities included target preparation, digital gamma-spectroscopy and modern neutron detection methods.

Over the past 40 years, technology has dramatically affected the field of upper limb prosthesis. With improvement in the electronics industry, along with advances in the miniaturisation and mass production of electronic components, myoelectrically controlled prosthesis has become reliable and widespread in their use. Compared to lower extremity amputees, the acceptance of prosthetic replacement is less in upper extremity amputees. This may be due to different factors like functional needs, cosmetic factors, motivation of the patient, inadequate training following conventional prosthetic fitment, etc. More and more developments are going on in upper limb extremity prosthesis which will fulfill the need of the upper limb amputees. Such developments ensure better rehabilitation though cost is a limiting factor. This article is an earnest attempt to review the recent trends in upper limb prosthetics.

The experts are unanimous: laser technologies are increasingly gaining in importance for future production processes in the electronic industry. A key role is layed by laser systems in the miniaturisation of electronic components in particular. The putting into practice of innovative concepts or installation and connection technology (packaging) would be either not possible or only incomplete without the application of laser technology. In numerous fields of microelectronics and micro material processing, especially UV-lasers have proved to be useful tools. More and more application fields are opened-up. UVlasers for via drilling, for laser direct imaging and flex routing are on the cutting edge of technology [1,2,3,4]. State-of-the-art polymer stencils for fine pitch applications are a new application field for the use of UV-lasers. Wafer bump stencils for the Flip Chip on Board (FCOB) assembly are a prime examples of where this new technology can be applied. Following are the advantages of this technology in combination with the use of laser-cut polymer stencils are shown.

Metallographic Preparation of Solar Cell Samples for Quality Assurance and Material Evaluation

The descriptions of the new products listed in this section are based on information supplied to us by the manufacturers. Physics Today can assume no responsibility for their accuracy. For more information about a particular product, visit the website at the end of the product description. Magnetic force microscopy probesSection:ChooseTop of pageMagnetic force microscopy... <<Silver nanoparticlesAtomic force microscopeScanner for nanotechnolog...Nanoimprint lithographyDigital microscopeX-ray source for structur...Spectroscopic ellipsomete...Wafer loader for microsco...Camera for biofluorescenc...Microfluidic componentsNew literatureCITING ARTICLESNANOSENSORS has introduced a new series of six silicon probes for magnetic force microscopy that make possible the visualization of magnetic domains. The probes are optimized for high sensitivity and enable tapping mode and noncontact and lift modes in air. The standard MFM probes feature a hard magnetic coating for high magnetic contrast and high lateral resolution. The low-momentum probes are designed for reduced disturbance of the magnetic sample by the tip and for enhanced lateral resolution. Low-coercivity MFM probes are coated with a soft magnetic thin film to allow the measurement of domains in soft magnetic samples. For high-resolution magnetic imaging, NANOSENSORS offers the SuperSharp-Silicon tip. Two types of probes have been developed for use in ultrahigh vacuum. NANOSENSORS, Rue Jaquet-Droz 1, CP 216, CH-2002 Neuchatel, Switzerland, http://www.nanosensors.com See www.pt.ims.ca/12307-131 Silver nanoparticles Section:ChooseTop of pageMagnetic force microscopy...Silver nanoparticles <<Atomic force microscopeScanner for nanotechnolog...Nanoimprint lithographyDigital microscopeX-ray source for structur...Spectroscopic ellipsomete...Wafer loader for microsco...Camera for biofluorescenc...Microfluidic componentsNew literatureCITING ARTICLESAmerican Elements has announced expansion of the manufacture of silver oxalate, a precursor for the production of silver nanoparticles. The nanoparticles, nanodots, and nanopowder can be either spherical high-surface-area metal particles, typically 10-, 40-, and 80-nm o.d., with specific surface area in the 30–60 range m2/g, or flakes with an average particle size of 2–10 µm, with an SSA of approximately 40–80 m2/g. The silver particles are available in high purity and ultrahigh purity and in coated and dispersed forms. Applications for the product include as an antimicrobial, antibacterial, antiviral, antibiotic, and antifungal agent when incorporated in coatings, nanofibers, plastics, soap, textiles, and self-cleaning fabrics. It is also used in nanowire and certain catalyst applications. American Elements, 1093 Broxton Avenue, Suite 2000, Los Angeles, CA 90024, http://www.americanelements.com See www.pt.ims.ca/12307-132 Atomic force microscope Section:ChooseTop of pageMagnetic force microscopy...Silver nanoparticlesAtomic force microscope <<Scanner for nanotechnolog...Nanoimprint lithographyDigital microscopeX-ray source for structur...Spectroscopic ellipsomete...Wafer loader for microsco...Camera for biofluorescenc...Microfluidic componentsNew literatureCITING ARTICLESPacific Nanotechnology has developed the Nano-DST, a complete atomic force microscope (AFM) system that includes advanced control software, a high-performance electronic controller, a versatile stage, and a vibration solution. A dual scanner control enables two scanners to be driven individually or simultaneously to perform rapid scanning and panning. With the company’s flexure scanner, which uses 3D calibration sensors, optional scan ranges as high as 350 µm are possible; 24-bit scan control and 400-MHz high-stability modulation electronics are included. The Nano-DST stage is constructed with a precision granite base and a gantry that supports a video optical microscope, light lever AFM scanner, and the high-speed sample rapid scanner. The stage features seven stepper motors that control the sample position, optics zoom, and focus. Pacific Nanotechnology Inc, 3350 Scott Boulevard, Suite 29, Santa Clara, CA 95054, http://www.pacificnano.com See http://www.pt.ims.ca/12307-133 Scanner for nanotechnology Section:ChooseTop of pageMagnetic force microscopy...Silver nanoparticlesAtomic force microscopeScanner for nanotechnolog... <<Nanoimprint lithographyDigital microscopeX-ray source for structur...Spectroscopic ellipsomete...Wafer loader for microsco...Camera for biofluorescenc...Microfluidic componentsNew literatureCITING ARTICLESPhysik Instrumente is offering the P-363 PicoCube XY/XYZ, a high-performance, closed-loop piezo scanning system designed for atomic force, scanning probe, and scanning tunneling microscopy. It combines the ultralow-inertia, high-speed piezo scanner with noncontact, direct-measuring, parallel metrology capacitive position sensors capable of 50-pm resolution. The sensors measure the actual distance between the fixed frame and the moving part of the stage, which results in a stiffer, faster-responding servo-loop. The very fast xyz piezo drives offer resonant frequencies of 9.8 kHz in z and greater than 3 kHz in x and y. The high frequency and high-bandwidth capacitive feedback allow step and settle to 1% accuracy in as little as 1 ms. The company can now provide the E-536 driver/controller for use with the PicoCube. Physik Instrumente LP, 16 Albert Street, Auburn, MA 01501, http://www.pi-usa.us See www.pt.ims.ca/12307-134 Nanoimprint lithography Section:ChooseTop of pageMagnetic force microscopy...Silver nanoparticlesAtomic force microscopeScanner for nanotechnolog...Nanoimprint lithography <<Digital microscopeX-ray source for structur...Spectroscopic ellipsomete...Wafer loader for microsco...Camera for biofluorescenc...Microfluidic componentsNew literatureCITING ARTICLESMolecular Imprints has introduced the Imprio 1100 system, which provides fully automated nanoimprint lithography. The system combines the resolution and CD control of e-beam lithography with the throughput, overlay, and operating simplicity of a mask aligner, and it can be configured to accept 25- to 150-nm substrates. The Imprio 1100 delivers cost-effective patterning of sub-50 nm features on the fragile, nonflat substrates used in the compound semiconductor industry. The same processes can also be used to pattern larger features such as laser diode ridges and diffractive optical elements with high pattern fidelity. The system is ideally suited for application in LEDs, optical components requiring fine-resolution patterning and 3D features, and high-density disk substrates for hard disk drives. Molecular Imprints Inc, 1807 West Braker Lane, Building C-100, Austin, TX 78758-3605, http://www.molecularimprints.com See www.pt.ims.ca/12307-135 Digital microscopeSection:ChooseTop of pageMagnetic force microscopy...Silver nanoparticlesAtomic force microscopeScanner for nanotechnolog...Nanoimprint lithographyDigital microscope <<X-ray source for structur...Spectroscopic ellipsomete...Wafer loader for microsco...Camera for biofluorescenc...Microfluidic componentsNew literatureCITING ARTICLESThe KH-7700 digital microscope from Hirox Inc combines as one unit a digital camera, light source, integrated LCD monitor, computer, and software. The camera incorporates a CCD image sensor with approximately 2.11 million pixels and provides a rate of 15 frames/s. It offers a still image capture of up to 30 million pixels and dynamic image recording with selectable resolution. The light source is a 60-W short-arc metal halide lamp with an average life of 4000 hours. A modular lens system with 1× to 7000× magnification is optimized for the CCD sensor and offers viewing from straight and oblique angles. For 2D and 3D measurements of height and volume, an autocalibration select feature enables users to zoom in and out while the scale and calibration in the unit changes accordingly. The KH-7700 has 3D image rendering software with profiling that uses split images and image comparison. Hirox-USA Inc, 1060 Main Street, Suite 302, River Edge, NJ 07661, http://www.hirox-usa.com See www.pt.ims.ca/12307-136 X-ray source for structural biologySection:ChooseTop of pageMagnetic force microscopy...Silver nanoparticlesAtomic force microscopeScanner for nanotechnolog...Nanoimprint lithographyDigital microscopeX-ray source for structur... <<Spectroscopic ellipsomete...Wafer loader for microsco...Camera for biofluorescenc...Microfluidic componentsNew literatureCITING ARTICLESRigaku Americas Corp has announced the FR-E+ SuperBright, an ultrabright, microfocus rotating anode x-ray source for structural biology. With an intensity up to 1.6 ×1011 x-rays/mm2/s, the brightness of the new source exceeds some second-generation synchrotron beamlines; the company claims that the new device is the most intense home laboratory x-ray source now available for macromolecular crystallography. The FR-E+ SuperBright features a true 70 µm × 70 µm focal spot, reportedly the smallest available in a rotating anode design. The beam is ideally suited to the tiny crystals typically encountered in current structural biology research. The new system can be supplied in several dual-wavelength configurations, including one using copper and chromium. Rigaku Americas Corporation, 9009 New Trails Drive, The Woodlands, TX 77381-5209, http://www.rigaku.com See www.pt.ims.ca/12307-137 Spectroscopic ellipsometer Section:ChooseTop of pageMagnetic force microscopy...Silver nanoparticlesAtomic force microscopeScanner for nanotechnolog...Nanoimprint lithographyDigital microscopeX-ray source for structur...Spectroscopic ellipsomete... <<Wafer loader for microsco...Camera for biofluorescenc...Microfluidic componentsNew literatureCITING ARTICLES Ocean Optics’ SpecEl-2000-VIS is a benchtop spectroscopic ellipsometer that uses polarized light reflected from the surface of a substrate to measure thin films. It provides fast, precise determination of layer thickness, refractive index, absorption, and components ratio and is well suited for semitransparent flat samples such as wafers and glass plates. Compared with reflectometry, spectroscopic ellipsometry measures relative changes in the phase and amplitude of the light instead of absolute intensity. Depending on the layer and substrate material, the SpecEl can detect over the full 450- to 900-nm spectral range layer thicknesses between 1 nm and 5 µm and refractive indices to ±0.005°. The software enables experiment methods to be configured and saved for one-step analysis. Ocean Optics Inc, 830 Douglas Avenue, Dunedin, FL 34698, http://www.oceanoptics.com See www.pt.ims.ca/12307-138 Wafer loader for microscopy Section:ChooseTop of pageMagnetic force microscopy...Silver nanoparticlesAtomic force microscopeScanner for nanotechnolog...Nanoimprint lithographyDigital microscopeX-ray source for structur...Spectroscopic ellipsomete...Wafer loader for microsco... <<Camera for biofluorescenc...Microfluidic componentsNew literatureCITING ARTICLESMcBain Instruments is offering a newly designed laboratory tool, the Wafer Handler WL150 and WL200 series of semiautomatic wafer inspection systems. The portable apparatus offers high throughput at 750 wafers/h with smooth handling of wafer sizes up to 8 in.; the company’s new wafer cassettes accommodate either 3–6 in. (WL150) or 5–8 in. (WL200) sizes. The class 1 clean-room-compatible wafer handler features smart stepper motors for the drive axis motors that provide stall and fault detection, linear stages for smooth and repeatable action, and vacuum touch end effectors with sensing capabilities. The device facilitates safer wafer handling with a spring-loaded counterbalance to support the weight without overloading the z-axis mechanism. McBain Instruments, 9601 Variel Avenue, Chatsworth, CA 91311, http://www.mcbaininstruments.com See www.pt.ims.ca/12307-139 Camera for biofluorescence microscopy Section:ChooseTop of pageMagnetic force microscopy...Silver nanoparticlesAtomic force microscopeScanner for nanotechnolog...Nanoimprint lithographyDigital microscopeX-ray source for structur...Spectroscopic ellipsomete...Wafer loader for microsco...Camera for biofluorescenc... <<Microfluidic componentsNew literatureCITING ARTICLESPhotron has developed the FocusScope SV200-i, a new slow-motion video system for the study of extreme low-light biofluorescence and microscope recording at rates up to 2000 frames/s. Other applications include high-speed imaging of blood cells and quantum-dot response measurements. The camera’s image intensifier (a luminous gain of 2.2 × 104 lm/m2/lx) is bonded directly to the CMOS sensor and provides 512 × 512 pixel resolution. The gallium arsenide phosphide photocathode delivers a broad spectral response over the 280–720 nm spectral range with a peak sensitivity at 530 nm. Intensifier overbrightness protection is enabled through phosphor-surface current detection. Additional features of the FocusScope SV200-i are low-light-level framing and gray-scale enhancement. Photron USA Inc, 9520 Padgett Street, Suite 110, San Diego, CA 92126-4446, http://www.photron.com See www.pt.ims.ca/12307-140 Microfluidic componentsSection:ChooseTop of pageMagnetic force microscopy...Silver nanoparticlesAtomic force microscopeScanner for nanotechnolog...Nanoimprint lithographyDigital microscopeX-ray source for structur...Spectroscopic ellipsomete...Wafer loader for microsco...Camera for biofluorescenc...Microfluidic components <<New literatureCITING ARTICLESLabSmith has introduced its CapTite microfluidic series of components for fast assembly of microfluidic setups. The components, licensed from Sandia National Laboratories, are designed for construction using 360-µm capillary tubing and include breadboards, valves, tees and ferrules, refillable microliter volume cartridges, Luer-Lock connectors to interface with standard syringe pumps, and bonded-port connectors to route fluids through and between microfluidic chips. The compact components are designed for leak-free connectivity, even at high pressures, and for low dead volumes and easy cleaning. Complete microfluidic construction kits are available; users can choose from single user, capillary interface, and chip interface types. LabSmith Inc, 7665 Hawthorne Avenue, Livermore, CA 94550, http://www.labsmith.com See www.pt.ims.ca/12307-141 New literatureSection:ChooseTop of pageMagnetic force microscopy...Silver nanoparticlesAtomic force microscopeScanner for nanotechnolog...Nanoimprint lithographyDigital microscopeX-ray source for structur...Spectroscopic ellipsomete...Wafer loader for microsco...Camera for biofluorescenc...Microfluidic componentsNew literature <<CITING ARTICLESInnoCal, an accredited metrology laboratory, has issued a service brochure that provides a comprehensive explanation of its many traceable calibration and repair services for a wide range of instrumentation. InnoCal, 625 East Bunker Court, M/S 14, Vernon Hills, IL 60061-1844, http://www.innocalsolutions.com ▪ See www.pt.ims.ca/12307-142 © 2007 American Institute of Physics.

Purpose. The dependence analysis of structural changes in the metal of railway wheels and tires from indicated influences in operation, for the further development of strategy of service reliability growth. Methodology. Test materials are the details selected from railway wheels which were taken out of operation beforehand because of various damages. Micro-structural researches were made with the use of light microscope Epiquant and electron microscope. The sizing of structural elements was done by using the methods of quantitative metallography. Findings. Over the past few decades the rapid development of industry was supported by the steady growth of intensity of using railway transport. In this case simultaneous increase of load at wheel set axle, with the increase of speed was accompanied by natural increase of the amount of cases of premature wheels and tires’ withdrawing out of operation. Railway wheel, except the formation of metal layer at rolling surface with the high defects concentration of crystal structure and first of all dislocations, falls under thermal influence from interaction with break blocks. The nature of joint influence (cold deformation and heating) on the metal rim of a wheel is conditioned by the appearance of sufficiently high gradients of structural changes that can be considered as the influence on the level of internal residual stresses. In case of the rise of volume part of carbide phase at a constant ferrite grain size, it is achieved only by the increasing of dislocation nucleation sources without changing the number of annihilation positions. In this case the accumulation of dislocations at the initial stages of plastic deformation (in metal volume in front of delta arm crack) will lead to the formation of cementite globes around certain interlocked dislocation density. In contrast the sharp increase of deformation hardening carbon steel parameters is observed. Originality. During the braking of locomotive the speed rise of metal heating at rolling surface is provided with the increase of temperatures that is enough for the beginning of phase transformations. Under the further cooling there is the formation of a number of structures formed from sliding to diffusive mechanisms. As a result the chosen areas become the centers of future metal deformations on wheels’ rolling surface and tires. Practical value. Based on the study of patterns of damages’ formation in railway wheels and tires from the peculiarities of internal metal structure and the working conditions «Classifier of defects» was developed аnd «Technical tips for determination of causes of cracks in solid-rolled railway wheels and destruction in general», which have been implemented on Ukrzaliznytsia.