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  • https://doi.org/10.1109/iceaai68945.2026.11442509Copy DOI Icon

Lightweight Infrared Defect Detection Network for Substation Equipment Based on Wavelet-Driven Structured Pruning

  • Jan 16, 2026
  • Xin Tong +5 more
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Abstract

Infrared imaging plays a crucial role in substation equipment inspection by enabling non-contact identification of thermal anomalies that reveal potential defects. However, achieving high detection accuracy often requires large convolutional neural networks, which imposes significant computational and memory burdens and limits deployment on edge devices commonly used in power systems. To address this challenge, this paper proposes a lightweight and efficient infrared defect detection framework that incorporates wavelet-regularized soft channel pruning into a deep neural network. Specifically, a Wavelet-Based Channel Pruning (WCP) strategy is introduced to evaluate channel importance by analyzing the wavelet-domain coefficients of convolutional filters, allowing the model to preserve channels rich in defect-related edge information. Furthermore, to mitigate the risk of prematurely removing informative channels, a Soft Channel Reconstruction (SCR) mechanism is developed to dynamically restore selected pruned channels through cosineinterpolated parameter fusion during training. Extensive experiments demonstrate that the proposed method achieves superior recognition accuracy while reducing the number of parameters and FLOPs by more than 50%.

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