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  • Materials Innovations for Quantum Technology Acceleration: A Perspective (Adv. Mater. 27/2023)
  • https://doi.org/10.1002/adma.202370193Copy DOI Icon

Materials Innovations for Quantum Technology Acceleration: A Perspective (Adv. Mater. 27/2023)

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Abstract

Quantum Applications In article number 2201064, Ajit K. Roy and co-workers present a perspective of quantum technology state of the art wherein critical stumbling blocks for quantum technology development are identified. As represented in the cover, atomic defects are created in a transition metal chalcogenide (TMD) thin film with a specialized tip in an atomic force microscope. AFM tip tracing indicates atomic-scale localization of materials states at the defect location. These controlled and localized defect sites are the source of quantum signal generation under a biased field.

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