Mathematical method for air electrostatic discharge circuits calculation

HORYU-IV is a 30 cm cubic satellite with an approximate mass of 11 kg. The satellite was successfully launched by a JAXA H-IIA rocket to an orbit of 575 km altitude with a 31° inclination on February 17, 2016. HORYU-IV’s main mission is to capture an electrostatic discharge (ESD) current waveform by an onboard oscilloscope and capture its image by a camera triggered by the oscilloscope. HORYU-IV captured various ESD current waveforms and images in space. Ground-based experiments were carried out to compare the waveforms between the flight results and the ground results. The results of ground-based experiments, compared with the flight results, had lower peak currents and longer durations. This result does not match past ground-based experiments showing that ESD current has lower peaks and longer durations when ambient pressure is lower. Also, the relationship between ESD occurrence location and ESD current waveforms was found through ground-based experiment.

Human-to-metal electrostatic discharge current measurements – Notes on the ESD current waveform

To fully enable and leverage the power of advanced processors, products must have abundant cache memory with much shorter access paths without increasing chip power for non-functional cells such as such as electrostatic discharge (ESD) circuits. It is very critical to have ESD circuits to protect the chip and module but also important to ensure that ESD circuits don't add significant power to the chip. A novel solution to meet higher ESD requirements during chip manufacturing, packaging, and test that can be “turned off” in system operation to reduce power is described.

The electrostatic discharge (ESD) generator calibration described in IEC 61000-4-2 (2008) only specifies contact mode discharge waveforms for the discharge-into-ground scenario. However, the actual device under test input impedance often differs from a short. To study the effect of different load impedances, a test method for ESD generator discharge under different load impedances is proposed. The method only slightly modifies the present calibration setup. The data show that the peak current variation between different brands of ESD generators for nonshorted load impedances is within the tolerance range given by the standard for the peak current. On the other hand, when performing system-efficient ESD design simulations, the load impedance seen by the ESD generator models is also different than a short. Therefore, the discharge current of a variety of ESD generator models is simulated with different load impedances and compared with ESD generator measurement results, which allows the selection of a suitable ESD generator model.

To fully enable and leverage the power of advanced processors, products must have abundant cache memory with much shorter access paths without increasing chip power for nonfunctional cells such as such as electrostatic discharge (ESD) circuits. It is very critical to have ESD circuits to protect the chip and module but also important to ensure that ESD circuits don't add significant power to the chip. A novel solution to meet higher ESD requirements during chip manufacturing, packaging, and test that can be “turned off” in system operation to reduce power is described.

A method for analyzing electrostatic discharge (ESD) generators and coupling to equipment under test in the frequency domain is proposed. In ESD generators, the pulses are excited by the voltage collapse across relay contacts. The voltage collapse is replaced by one port of a vector network analyer (VNA). All the discrete and structural elements that form the ESD current pulse and the transient fields are excited by the VNA as if they were excited by the voltage collapse. In such a way, the method allows analyzing the current and field-driven linear coupling without having to discharge an ESD generator, eliminating the risk to the circuit and allowing the use of the wider dynamic range of a network analyzer relative to a real-time oscilloscope. The method is applicable to other voltage-collapse-driven tests, such as electrical fast transient, ultrawideband susceptibility testing but requires a linear coupling path.

This paper demonstrates the essential procedures in the Hong Kong Standards and Calibration Laboratory for the calibration of an electrostatic discharge (ESD) generator in accordance with the International Standard IEC 61000-4-2 Edition 2.0 (2008-12) of electromagnetic compatibility. All the required instruments and special precautions to perform the calibration are listed clearly. The performance of an ESD generator has been tested and reported by following the requirement of the standard. The corresponding results, including the waveform parameters of the current discharge pulse and the DC high voltage test of the ESD generator before discharge with different voltages setting, are reported. The measurement uncertainties of the calibration are clearly listed in this paper, and they are evaluated in accordance with the document "Guide to the Expression of Uncertainty in Measurement (GUM)". The expanded measurement uncertainty U, with level of confidence of approximate 95 %probability is used in the calibration.

The aim of this paper is to investigate the transient magnetic field radiating by electrostatic discharge (ESD) generators. Near field measurements have been conducted, a few centimeters far away from the discharge point (Pellegrini target). The Pellegrini target is mounted on the centre of a grounded metal plane, inside an anechoic chamber. The measurements were carried out to three different directions in relation to the discharge point. The experimental data show that each ESD generator produces a different transient magnetic field. Furthermore, additional differences referring to the produced magnetic field produced by each generator are noted, depending on the direction that the measurement is conducted. Finally, comparisons are stated concerning the magnetic field produced by each generator as well as useful conclusions for the decrease of the magnetic field

Electrostatic discharge induced by strong electromagnetic field refers to the electrostatic discharge process of spacecraft surface materials, cables, some special structural parts and other areas with low charging potential induced by strong electromagnetic field. In general, the spacecraft surface low charge potential sensitive area of the electric field is weak, and electron energy is lower than the ionization energy of molecules, atoms, collision ionization probability is low, when the strong electromagnetic field action, stimulate low-pressure gas to produce dense plasma, thereby reducing the discharge threshold and induce the generation of electrostatic charge discharge. The establishment of testing method for electrostatic discharge induced by strong electromagnetic field is the premise of research on law and protection method of electrostatic discharge induced by strong electromagnetic field. At present, there are no experimental conditions for the interaction between strong electromagnetic field and space environment in China. Therefore, this article established the strong electromagnetic radiation environment and space radiation environment at the same time, under the action of induced discharge test system, not only to be able to carry out electrostatic discharge, high power microwave, nuclear electromagnetic pulse, ultra-wideband electromagnetic pulse and continuous wave such as strong electromagnetic field radiation studies, but also need to solve the high vacuum environment at the same time for sample production and discharge, the discharge parameters and the effect of real-time monitoring, etc. For the research on the rules of space equipment of strong electromagnetic field induced electrostatic discharge is of great significance.

Electrostatic discharge (ESD) is a physical phenomenon that may destroy electronic components due to its high discharge current that may reach a few amperes in just a few ns. However, another major aspect of ESD is the related high-frequency electromagnetic (E/M) fields radiated by the ESD event. The electronic equipment that is affected by the ESD phenomenon is additionally affected by the induced voltages caused by these E/M fields. This is the reason that the current version of the IEC 61000-4-2 on ESD has a special reference to these fields and the measurement setup. Starting with the classical formulation of these fields, this paper reviews the most popular techniques for calculating the ESD electromagnetic fields while also emphasizing the best methods for minimizing computational effort. There is also a separate section for the measurement techniques that have been applied in research works, whose outcomes could be implemented in the next revision of the IEC 61000-4-2. It is extremely important for the next revision to include these measurement setups and the E/M field sensors because the ESD generators should comply with certain values related to the E/M fields they produce.

Scaling, optimization and design considerations of electrostatic discharge protection circuits in CMOS technology

The detected structures in a CUP wafer by sensing (leakage) analysis are presented in this paper. The pad structures are designed by the ADS2009 & TSMC 0.18um CMOS processes design rules, and use some electrostatic discharge (ESD) protection devices and circuits under these pads. Furthermore, the signal will be passed through these ESD devices or circuits on the top-metal pad as a sinusoidal, square, or ESD pulse waveform being injected. It is found that during an ESD occurred situation, a strong signal coupling can be sensed by the ESD protection circuits.

ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms

This paper introduces a methodology to simulate the currents and fields during an air discharge electrostatic discharge (ESD) into a product by combining a linear description of the behavior of the DUT with a nonlinear arc resistance equation. The most commonly used test standard IEC 61000-4-2 requires using contact-mode discharges to metallic surfaces and air-discharge mode to nonconducting surfaces. In the contact mode, an ESD generator is a linear system. In the air-discharge mode, a highly nonlinear arc is a part of the current loop. This paper proposes a method that combines the linear ESD generator full-wave model and the nonlinear arc model to simulate currents and fields in air-discharge mode. Measurements are presented comparing discharge currents and fields for two cases: ESD generator discharges into a ground plane, and ESD generator discharges into a small product.

Electrostatic discharge (ESD) generators are used for testing the robustness of electronics towards ESD. Most generators are built in accordance with the IEC 61000-4-2 specifications. It is shown that the voltage induced in a small loop correlates with the failure level observed in an ESD failure test on the systems comprising fast CMOS devices, while rise time and current derivative of the discharge current did not correlate well. The electric parameters are compared for typical and modified ESD generators and the effect on the failure level of fast CMOS electronics is investigated. The consequences of aligning an ESD standard with the suggestions of this paper are discussed with respect to reproducibility and test severity.