- Conference Article
1
- 10.1117/12.310568
<title>Microscopy using an interference pattern as illumination source</title>
- Jun 09, 1998
- Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
- Rimas Juskaitis + 2 more +2
We describe a method of obtaining optically scanned fluorescence images in a widefield conventional microscope by interfering two beams on an object so as to illuminate it with a single spatial frequency fringe pattern. Images taken at three spatial positions of the fringe pattern are processed in real time to produce optically sectioned images which are substantially similar to those obtained with confocal microscopes.© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
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