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  • https://doi.org/10.1088/1402-4896/ae4e60Copy DOI Icon

Plasma uniformity and ion dynamics in Ar/He capacitively coupled plasmas

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Abstract

Abstract Radio-frequency capacitively coupled plasmas (RF-CCPs) are central to microelectronics processing, yet their behavior is highly sensitive to the working gas. We employ a self-developed two-dimensional particle-in-cell/Monte Carlo collision (PIC/MCC) model to investigate He-Ar mixtures in He-rich, Ar-dilute regimes. Introducing a modest Ar fraction into He increases plasma density and improves spatial uniformity via complementary electron-impact processes on the two species. With increasing Ar fraction and pressure, the Ar ion energy distribution function (IEDF) shifts to slightly lower peak energy and broadens,whereas the overall He ions energy spectrum remains largely unchanged but exhibits broadening with partial extension into the high-energy region. These trends are consistent with a modified sheath potential and altered ion acceleration path lengths in a more collisional sheath. The results demonstrate that adjusting the Ar content provides a simple knob to tune IEDFs and uniformity in RF-CCPs without changing the external driving waveform.

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