This paper outlines a way for identifying plant leaf infections and a method for locating infections with caution. The goal of the proposed research is to use image processing and support vector machines to analyze leaf disease (SVM). The diseases on the leaf are the primary cause of the rapid fall in leaf development. Because 85–95 percent of diseases occur on the leaf, the approach used to identify leaf disease. This research involves K- means bunching, which is the division calculation, as well as the Support Vector Machine. This proposed recognition model based extremely successful in perceiving leaf illnesses. Record Terms k-implies, Leaf illnesses, picture division, characterization, Threshold, picture handling.