50- https://doi.org/10.1016/j.sse.2005.01.018
Scaling CMOS: Finding the gate stack with the lowest leakage current
- Feb 12, 2005
- Solid-State Electronics
- Thomas Kauerauf +4 more
Abstract
Scaling CMOS: Finding the gate stack with the lowest leakage current
- # Leakage Current
- # Lowest Leakage Current
- # Future CMOS Generations
- # Leakage Current Issues
- # High-k Gate Dielectrics
- # Gate Leakage Current
- # Substrate Injection
- # High-k Layer
- # High-k Material
- # Universal Relation
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