Solid State Analysis with the New Leipzig High-Energy Ion Nanoprobe

On the accuracy of element concentrations and masses of micron sized samples determined with the Heidelberg proton microprobe

Geant4 simulation of the new CENBG micro and nanoprobes facility

Morphological and elemental characterisation with the high-energy ion-nanoprobe LIPSION

A multitude of ion-atom interactions are induced with projectiles of E≥0.1 MeV/nucleon. Analytical techniques derived from these include particle induced X-ray emission (PIXE), charged particle activation analysis (CPAA), prompt nuclear reactions (PNR), and Rutherford backscattering spectrometry (RBS). Among their features are broad elemental coverage (PIXE), subnanogram sensitivity (PIXE, CPAA), isotopic specificity (CPAA, PNR), and depth resolution (RBS, PNR). A limiting requirement with each technique is the need for high intensity ion beams. Novel approaches seek now to obtain analytical information with very small numbers of bombarding ions. Sample integrity is then maintained; moreover, they can be delivered in a microbeam (diameter ≤ 5 mm). A phenomenon which under these conditions provides useful analytical information is the particle induced desorption of molecular fragments. Thus, microscopic chemical analysis can be achieved with a small number ( 50%); (b) mass spectrometry on microspots (diameter of a few μm) is feasible; (c) < 106 atoms can be detected. Further capabilities of ion beams for minute, detailed, and comprehensive chemical characterization remain to be explored.

Biomedical research at LIPSION – Present state and future developments

In this study, superconducting samples of type Cu0.5Tl0.5Ba2Ca2Cu3O10−δ added by SnO2 and In2O3 in nano-scale were prepared by a solid-state reaction technique. The concentrations of both SnO2 and In2O3 were 0.0, 0.1, 0.2, 0.4, 0.6 and 1.0 wt% of the sample’s total mass. The prepared samples were characterized using X-ray powder diffraction (XRD) and scanning electron microscopy (SEM) for phase analysis and microstructure examination. The elemental content of the prepared samples was determined using energy dispersive X-ray (EDX) and particle induced X-ray emission (PIXE). The results of elemental content, determined from EDX and PIXE, were compared and discussed. In addition, The oxygen content of these samples was obtained using non Rutherford backscattering spectroscopy (RBS) at 3 MeV proton beam. It was found that the Oxygen-content of (Cu0.5Tl0.5)-1223 phase was not affected by both SnO2 and In2O3 nano-oxides addition. The electrical resistivity of the prepared samples was measured by the conventional four-probe technique from room temperature down to the zero superconducting transition temperature (T 0). An increase in the superconducting transition temperature T c from 106 to 119 K was observed as x was varied from 0.0 to 0.6 wt% for (SnO2) x Cu0.5Tl0.5Ba2Ca2Cu3O10−δ , followed by a systematic decrease with increasing nano-SnO2 addition. On the other hand, the T c values for (In2O3) x Cu0.5Tl0.5Ba2Ca2Cu3O10−δ show a small variation with x. Moreover, the variation rate of T c with x, for both nano-additions, was found to be directly proportional to the variation of the volume fraction of the prepared samples.

Ion beam analysis of Zn 2−2 xCu xIn xS 2 films

The present work proposes the use of two‐dimensional correlation mapping (2D‐CM) methods to analyze both particle induced X‐ray emission (PIXE) and Rutherford back scattering (RBS) spectra. RBS spectra of ion irradiated (H + and He 2+ ) poly(ether ether ketone) (PEEK) films were analyzed by both generalized and hybrid 2D‐CM techniques to reveal the chemistry involved in different ion irradiation types. The analysis indicated different irradiation mechanisms using He 2+ and H + high energy ion beams and was assigned to X‐linking and Y‐linking, respectively. The effects of sulfonation on the structure of PEEK membranes were also analyzed from their RBS and PIXE spectra. The sequential order of elemental concentration change with increasing the degree of sulfonation (DS) was determined as: N→S→O→C, and the origin of Nitrogen was assigned to the casting solvent as revealed from nuclear magnetic resonance (NMR) spectra. In addition, Hetro‐2D‐CM‐PIXE‐RBS analysis indicated the presence of three RBS Sulfur signals, and were assigned to Sulfur at surface, in the middle and in depth. 2D‐CM techniques could be considered as a promising approach to enrich information obtained by ion beam analysis.

PIXE-STIM microtomography: Zinc and manganese concentrations in a scorpion stinger

Light and heavy ion beam analysis of thin biological sections

The use of light ions for microscopy and tomography is illustrated by a variety of recent applications in materials and life sciences at the Leipzig high-energy ion-nanoprobe LIPSION with a short comparison to other microscopic techniques. The versatility of ion techniques is exemplified by Rutherford backscattering spectrometry maps of thin films of solar cell materials, particle induced X-ray emission maps of manganese in ancient human bones, particle induced X-ray emission on single aerosol particles with μm size, and scanning transmission ion microscopy and tomography on pigs knee cartilage. Finally, the design of a single ion single living cell bombardment facility is sketched for studies of the cellular response and microdosimetry.

Optimizing the Rutherford Backscattering Spectrometry setup in a nuclear microprobe

The nuclear microprobe is a microanalytical tool capable of quantitative studies of elemental distribution at the ppm level with a spatial resolution of the order of 1 μm. This sensitivity is adequate for most elements ofinterest, and the spatial resolution is acceptable for studies of elemental distribution in organs, tissues, and cells. The main techniques used in plant science are particle induced X-ray emission using protons, proton backscattering, scanning transmission ion microscopy, and particle induced gamma-ray emission. Specimen preparation is the most difficult part of analysis, and only cryotechniques are recommended presently for all types of microanalytical studies.

Simultaneous PIXE and RBS data analysis using Bayesian inference with the DataFurnace code

Elemental depth profiling in Cu(In, Ga)Se2 solar cells using micro-PIXE on a bevelled section