Evaluation of Read Disturbance Reduction Effect by SOT-MRAM Bi-directional Read on Device Size Dependence
Spin-orbit torque magnetic RAM (SOT-MRAM) is affected by read disturbances due to spin current in the heavy metal layer that arises from spin-orbit interaction at the time of reading [1]. To resolve this issue, we have proposed a stabilized structure with a bi-directional read path, based on the idea that spin currents flowing in opposite directions on either side of the heavy metal layer cancel each other’s effects, that improves the read reliability of SOT-MRAM. We have already reported that this structure reduces the read disturbance [2]. In this study, we evaluated the movement of the magnetization of the free layer at the time of reading in a bi-directional read SOT-MRAM by using an LLG simulator. It was found that the read disturbance caused by SOT is removed in the free layer, as shown in Fig. 1 (a). In other words, the spin currents generated in opposite directions in the heavy metal layer directly affect the magnetization of the free layer, and the free layer functions as if it were two ferromagnets, whose balanced magnetizations cancel the read disturbance. To clarify this mechanism, Fig. 1 (b) shows the simulated magnetization for only the free layer at extremely large currents. The free layer is a ferromagnet magnetized in two opposite directions due to the central vortex magnetization, and the magnetization does not reverse to either side. (That is, it is not a mechanism in which the spin currents cancel themselves in both directions in the heavy metal layer.)Toward the realization of this bidirectional read SOT-MRAM structure, we evaluated the effect on the read disturbance of the size of the direction in which current flows through the heavy metal layer of an SOT structure. The device structure had an magnetic tunnel junction (MTJ) with two ferromagnets (cobalt), in which a pinned layer with a thickness of 3.5 nm and a free layer with a thickness of 1.5 nm sandwiched an insulating layer with a thickness of 1.0 nm, and a heavy metal layer (tungsten) with a thickness of 2.0 nm under the free layer. The magnetization of the two ferromagnetic layers directed toward the short side direction of the device, and the current passed from the pinned layer to both ends in the long side direction of the heavy metal layer. The width in the short side direction was uniformly 30 nm, and there were four device widths for the long side direction, i.e., 30 nm, 60 nm, 120 nm, and 180 nm. We evaluated the magnetization reversal probability of a conventional SOT-MRAM structure and the stabilized SOT-MRAM structure for a read time of 5 ns. Fig. 2 shows that the stabilized SOT-MRAM was about 6 to 10 times more effective than the conventional structure. In the conventional SOT-MRAM, the threshold current was proportional to the width of the device, whereas in the stabilized SOT-MRAM, the threshold current decreased as the width of device increased. The magnetization reversal of the conventional SOT-MRAM was strongly affected by the SOT disturbance due to the spin Hall effect, and the difference in thermal stability depending on the device size also had an influence. On the other hand, in the stabilized SOT-MRAM, the disturbance was canceled out at the free layer and only spin transfer torque in MTJ affected the magnetization reversal. Thus, we expected that the relationship between thermal stability and device size would have a large effect on magnetization reversal, but the result was contrary to that. These results indicate that the force exerted by the spin Hall effect on the magnetization of the free layer is relatively large and easy to act when the device is small. Therefore, a small device of the conventional SOT-MRAM tend to easily occur magnetization reversal, whereas in a smaller device of the stabilized SOT-MRAM, the effect on the magnetization of the free layer is strong enough to cancel the SOT disturbance and the magnetization reversal becomes more difficult.AcknowledgmentsThis work was partly supported by a Grant-in-Aid for Scientific Research (19K04536) from Japan Society for the Promotion of Science. **
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