TAO-BIST: a framework for testability analysis and optimization of RTL circuits for BIST

In this paper, we present design for testability (DFT) and hierarchical test generation techniques for facilitating the testing of application-specific programmable processors (ASPPs) and application-specific instruction processors (ASIPs). The method utilizes the register-transfer level (RTL) circuit description of an ASPP or ASIP to come up with a set of test microcode patterns which can be written into the instruction read-only memory (ROM) of the processor. These lines of microcode dictate a new control/data flow in the circuit and can be used to test modules which are not easily testable. The new control/data flow is used to justify precomputed test sets of a module from the system primary inputs to the module inputs and propagate output responses from the module output to the system primary outputs. The testability analysis, which is based on the relevant control/data flow extracted from the RTL circuit, is symbolic. Thus, it is independent of the bit-width of the data path and is extremely fast. The test microcode patterns are a by-product of this analysis. If the derived test microcode cannot test all untested modules in the circuit, then test multiplexers are added (usually to the off-critical paths of the data path) to test these modules. This is done to guarantee the testability of all modules in the circuit. If the control microcode memory of the processor is erasable, then the test microcode lines can be erased once the testing of the chip is over. In that case, the DFT scheme has very little overhead (typically less than 1%). Otherwise, the test microcode lines remain as an overhead in the control memory. The method requires the addition of only one external test pin. Application of this technique to several examples has resulted in a very high fault coverage (above 99.6%) for all of them. The test generation time is about three orders of magnitude smaller compared to an efficient gate-level sequential test generator. The average area overhead (without assuming an erasable ROM) is 3.1% while the delay overheads are negligible. This method does not require any scan in the controller or data path. It is also amenable to at-speed testing.

In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has several advantages in terms of time-to-market and system cost, testing such core-based systems is difficult, mainly due to the problem of justifying test sequences at the inputs of a core embedded deep in the circuit and propagating test responses from the core outputs. In this paper, we first present a design for testability technique for testing such core-based systems. In this scheme, untestable cores are first made testable using hierarchical testability analysis techniques. If necessary, additional testability hardware is added to the cores to make them transparent so that they can propagate test data without information loss. This testability and transparency technique is currently applicable to cores of the following types: application-specific integrated circuits, application-specific programmable processors, and application-specific instruction processors. Other core types can be made testable and transparent using traditional techniques. The testable and transparent cores can then he integrated together with some system-level testability hardware to ensure justification of precomputed test sequences of each core from system primary inputs to the core inputs and propagation of test responses from core outputs to system primary outputs. Justification and propagation of test sequences are done at the system level by extending and suitably modifying the symbolic hierarchical testability analysis method that has been successfully applied to register-transfer level circuits. Since the testability analysis method is symbolic, the system test generation method is independent of the bit-width of the cores. The system-level test set is obtained as a byproduct of the testability analysis and insertion method without further search. The test methodology was applied to six example systems. Besides the proposed test method, the two methods that are currently used in the industry were also evaluated: (1) FScan-BScan, where each core is full-scanned, and system test is performed using boundary scan and (2) FScan-TBus, where each core is full-scanned, and system test is performed using a test bus. The experiments show that the proposed scheme has significantly lower area overhead, delay overhead, and test application time compared to FScan-BScan and FScan-TBus, without any compromise in the system fault coverage.

This paper proposes a novel design of application specific integrated circuit (ASIC) which is capable of connecting sensor network and other electronic systems to the internet. The transfer of data between different networks and electronic systems is controlled by internet of things (IoT) platform with the help of instruction sent to ASIC. ASIC will act as serial peripheral interface (SPI) master to all connected networks and data will be transferred serially between them. The different ASIC modules are SPI module, control module, memory module and data/instruction decoder with additional modules built-in self-test (BIST) and direct memory access (DMA). The proposed ASIC will consume less power as compared to conventional microcontroller/microprocessor due to SPI feature along with DMA on ASIC for IoT applications. It is described in very high speed integrated circuit hardware description language (VHDL) at register transfer level (RTL) and simulation is done on the Vivado 2016.2.

Background: In recent years, the rising demand for high-performance radar systems in aeronautics, astronautics, national defense, and civil communication has driven the widespread application of phased-array technology. The design of beam controllers, the core of phased-array systems, faces many challenges. Traditional implementation schemes are usually based on application-specific integrated circuits (ASIC) or discrete components, which have a long development cycle, poor flexibility, and limited adaptability. Field-programmable gate arrays (FPGA), with their high parallelism, reconfigurability, and powerful signal processing capabilities, offer a new way to implement phased-array control systems. But FPGA design has traditionally relied on register transfer level (RTL) description, which is inefficient and struggles to keep up with the rapid iteration of complex algorithms. With the development of high-level synthesis (HLS) technology, it has become possible to develop FPGAs using high-level languages such as C/C++. However, improving development efficiency while ensuring hardware performance remains a key issue in the design of phased-array beam controllers. Materials and Methods: This study employs an HLS - RTL co - design method to build a phased - array beam controller. This approach combines the strengths of HLS's efficient algorithm implementation and RTL's precise hardware interface control. The system architecture consists of three parts: the host - machine control layer, FPGA processing layer, and phase - control output layer. In the FPGA processing layer, the core beam - forming algorithm is implemented via HLS. Based on phased - array principles, this algorithm converts target angles to wave vectors and calculates phase - compensation values for each element in an 8×8 array. Pipelining and parallel processing techniques are used in the HLS design to optimize algorithm throughput and latency. The phase - control output layer, designed with RTL, repackages 64 calculated phase values and distributes them to 16 physical phase - shifter chips. Each phase - shifter manages four elements and receives control data through an SPI interface. Results: The proposed FPGA-based phased-array beam controller design in this paper has successfully achieved high - speed, high - precision beam control. By using the HLS - RTL co - design method, it has solved the problem of low algorithm implementation efficiency in traditional FPGA development and ensured the high performance and reliability of hardware interfaces. Experimental results indicate that the system meets or surpasses design targets on key performance indicators. Its end - to - end latency is kept within 130μs, it supports an angle update rate of over 5,000 times per second, and can satisfy the requirements for tracking highly dynamic targets in practical applications. Conclusion: The major contributions of this research are as follows: presenting an HLS - RTL co - design methodology for complex FPGA system development; designing an efficient phased - array beam - forming algorithm and its hardware implementation; and developing a flexible and scalable phased - array control system architecture that supports different array configurations. These findings are highly significant for beamforming technologies in phased - array radar and 5G communication systems, as well as for other FPGA applications requiring high - speed signal processing.

Design for testability (DFT) is introduced to reduce the complexity of testing integrated circuit and help improve fault coverage. However, conventional DFT with additional 2-to-1 multiplexer (MUX) might add an increasing amount of delay and area overhead. Therefore, register transfer level (RTL) scan design is introduced to overcome this problem. This paper aims to present the development of an ASIC with RTL scan design by using multiple scan paths instead of the conventional technique, which is gate-level (GL) scan insertion to insert scan cells. This method inserts multiple scan cells by utilizing the existing multiplexer and operational units in order to reduce area overhead and delay. Besides, multiple scan paths are implemented instead of a single scan chain to reduce the complexity of the testing process, where a single scan chain has long test application times due to the high number of clock cycles for the scan chain process. RTL design is also modified by adding an extra gate for multiple scan chain insertion. The graph is derived in order to analyse the connection between registers such that the multiple scan paths can be determined accordingly. Synopsys tool is used for synthesized, placement and routing and performing automatic test pattern generation while static timing analysis is used to verify the results of the setup slack time for ASIC design. The simulation result shows that multiple scan paths insertion at RTL level has an area overhead and slack time of about 3.79% and 0.44ns less compared to multiple scan paths insertion at GL for a finite impulse response circuit with comparable high fault coverage and small delay. A comparison of the performance metrics such as area, setup slack time, and fault coverage of the multiple scan chain is done between the RTL scan and GL scan.

Constraints on the structure of circular self-test paths in register transfer level (RTL) circuits with circular built-in self test (BIST) features are discussed. These constraints arise from the desire to avoid bit-level correlation, which can have a devastating effect on test quality. Two causes of bit-level correlation are examined, with examples demonstrating the resulting degradation in test quality. The first cause, register adjacency, is a byproduct of the ordering of the registers within the circular self test path. The second cause, a correlation inherent in circular BIST, stems from the shifting nature of the circular self-test path. >

Design for test is an integral part of any VLSI chip. However, for secure systems extra precautions have to be taken to prevent that the test circuitry could reveal secret information. This paper addresses secure test for Physical Unclonable Function based systems. It investigates two secure Built-In Self-Test (BIST) solutions for Fuzzy Extractor (FE) which is the main component of PUF-based systems. The schemes target high stuck-at-fault (SAF) coverage by performing scan-chain free functional testing, to prevent scan-chain abuse for attacks. The first scheme reuses existing FE blocks (for pattern generation and compression) to minimize the area overhead, while the second scheme tests all the FE blocks simultaneously to minimize the test time. The schemes are integrated in FE design and simulated; the results show that for the first test scheme, a SAF fault coverage of 95 % can be realized with no more than 47.1k clock cycles at the cost of a negligible area overhead of only 2.2 %; while for the second test scheme a SAF fault coverage of 95 % can be realized with 3.5k clock cycles at the cost of 18.6 % area overhead. Higher fault coverages are possible to realize at extra cost (i.e., either by extending the test time, or by adding extra hardware, or a combination of both).

Three ASIC (application-specific integrated circuit) devices recently designed at AT&T incorporate the ANSI/IEEE Std 1149.1-1990 testability features. The test port is used for control of on-chip boundary-scan (BS) and full chip (macrocell and random logic) built-in-self-test (BIST). Presented are a view of the methods used for implementation, novel circuit sharing between BIST and BS, and results related to device area, performance, fault coverage, and testing. The availability of boundary-scan allowed automatic generation of board-level test vectors and allowed board-level printed wire testing without bed-of-nails techniques. By applying BIST tools to the devices after functional design, fault coverage of all of the ASICs was increased to acceptable levels without the significant time and expense of manual vector writing.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

This paper presents a novel test point insertion method for pseudo-random built -in self-test (BIST) to reduce the area overhead. R ecently, a new test point insertion method for BIST was proposed which tries to use functional flip -flops to drive control test points instead of adding extra dedicated flip - flops for driving the control points. Replacement rule used in the previous work has limitations preventing some dedicated flip-flops from being replaced by functional flip -flops. This paper proposes a logic cone analysis based test point insertion approach to overcome the limitations. Logic cone analysis is performed to find candida te functional flop -flops for replacing dedicated flip -flops. Experimental results indicate that the proposed method reduces test point area overhead significantly with minimal loss of testability by replacing the dedicated flip - flops. application to the inputs of the circuit -under-test (CUT). The output response analyzer compacts the output response of the CUT into a signature. T his provides a variety of benefits including the ability to apply a large number of test patterns in a short time (i.e., shorter test time) , at-speed testing, minimal automatic test equipment (ATE) storage requirements, test application in the field over t he lifetime of the part, and a reusable test solution for embedded cores. In particular, BIST is crucial for applications such as aerospace, defense, automotive, computer, etc., for the reliability of the entire system. The most economical logic BIST te chniques are based on pseudo-random pattern testing. On -chip input pattern generator constructed from a linear feedback shift register (LFSR) is most commonly used to generate pseudo -random patterns with its compact structure. And on -chip output response analyzer compacts the output responses into a signature and this allows significant compaction of test data. Pseudo-random pattern testing also can achieve high coverage of non-modeled faults which are not explicitly targeted during deterministic test ge neration. However, a major challenge is the presence of random -pattern-resistant (r.p.r.) faults which have low detection probabilities and hence may limit the fault coverage that can be achieved with pseudo -random patterns. There have been many research efforts to overcome the fault coverage limitation by r.p.r faults. Mainly two directions are given to enhance the fault coverage. One is to modify the pattern generator in order to generate patterns that detect hard faults. Various methods have been pr oposed such as weighted pattern generation ( 2), (4)-(8), pattern mapping ( 9)- (11), bit-fixing (12), bit-flipping (13), and LFSR reseeding (14)-(19).

In this paper, we propose a new testability analysis method for Register-Transfer Level (RTL) descriptions. The proposed method is based on the idea of testability analysis in terms of data-flow and control structure which can be extracted from RTL designs. We analyze testability of RTL descriptions with more testability measures than those of conventional gate-level testability, so that the method provides information for design for testability (DFT). We have implemented the presented method and experimental results show that we can reduce circuit cost for test and achieve highly testable circuits by DFT using our RTL testability analysis.

Partial reset has been shown to have significant impact on test generation for sequential circuits in a stored-pattern test application environment. In this paper, we explore the use of partial reset in fault-independent testing and built-in self-test (BIST) of non-scan sequential circuits. We select a subset of flip-flops in the circuit to be resetable to logic one or zero during the application of the test vectors. The resetting is performed with random frequency. The selection of the flip-flops and the reset polarity is based on fault-propagation analysis, which determines the impact of a selected flip-flop on fault propagation from the circuits structure. Application of partial reset as described above yields an average improvement of 15% in fault-coverage for sequential circuits resistant to random pattern testing. To further enhance testability, we also present a methodology for selecting observable test points based on propagation of switching activity. Overall, high fault coverages (about 97%) are obtained for many of the ISCAS89 benchmark circuits. Thus, partial reset BIST provides a low cost alternative for testing sequential circuits when scan design is unacceptable due to area and/or delay constraints. The routing overhead for implementing BIST is seen to be about 6%.

In the RF and mixed signal IC design, Built in Self Test (BIST) technique is becoming an important issue that affects both the time-to-market and product cost of many modem electronic systems. In most cases, these systems are evaluated and designed with electrical stimulation method. The main problem of electrical simulation tools is that the extraction of the parameters associated with the performances of circuit and the design rules depend broadly on the intuition of the experts. To overcome this problem, an efficient methodology for top-down design, modeling, and simulation of complete BIST circuit to validate its proper function before moving on to transistor level implementation is presented in this paper. The described method is based in behavioral modeling strategy using hardware description language VHDL-AMS. At behavioral level, the performances of circuits are optimized by modeling and simulation these performances parameters with a hardware description language without considering its transistor level implementation. Hence, methods and algorithms for modeling has been developed, for simulation, in order to decrease the total simulation time, validation of systems, and accelerate the production cycle of electronic devices. The proposed BIST schema based on modeling and simulation strategy is applied to test a loop filter. Extensive simulation study shows that the proposed BIST approach can efficiently detect the loop filter fault and tolerate this type of fault, and so offers high fault coverage of 100% for the fault detects.

This paper introduces new design and synthesis techniques that reduce the area and performance overhead of built-in self-test (BIST) architectures such as circular BIST and parallel BIST. Our goal is to arrange the system bistables into scan paths such that some of the BIST and scan logic is shared with the functional logic. Logic sharing is possible when scan dependence is introduced in the design. Other BIST design techniques attempt to avoid scan dependence because it can reduce the fault coverage of embedded, multiple input signature registers (MISRs). We show that introducing certain types of scan dependence in embedded MISRs can result in reduced overhead and improved fault coverage. We present our results for benchmark circuits that have been synthesized to take advantage of scan dependence in a circular BIST architecture.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

The applicability of at-speed scan-based logic built-in self-test (BIST) is being severely challenged by excessive capture power that may cause erroneous test responses for good chips. Different from conventional low-power BIST, this paper is the first that has explicitly focused on achieving capture power safety with a practical scheme called capture-power-safe BIST (CPS-BIST). The basic idea is to identify all possibly erroneous test responses and use the well-known technique of mask (partial-mask or full-mask) to block them from reaching the MISR. Experiments with large benchmark and industrial circuits show that CPS-BIST can achieve capture power safety with negligible impact on both test quality and area overhead.

We present a new approach for Field Programmable Gate Array (FPGA) testing that exploits the reprogrammability of FPGAs to create Built-In Self-Test (BIST) logic only during off-line test. As a result, BIST is achieved without any area overhead or performance penalties to the system function implemented by the FPGA. Our approach is applicable to all levels of testing, achieves maximal fault coverage, and all tests are applied at-speed. We describe the BIST architecture used to test all the programmable logic blocks in an FPGA and the configurations required to implement our approach using a commercial FPGA. We also discuss implementation problems caused by CAD tool limitations and limited architectural resources, and we describe techniques which overcome these limitations.