Tracking scientific simulation using online time-series modelling

Approximate computing (AC) is an effective energy-efficient method for error-resilient applications. The essence behind AC is to reduce energy consumption by slightly sacrificing computation accuracy purposefully while providing quality-acceptable results. On the other hand, soft error is a common problem during program execution and may cause unacceptable outputs or catastrophic failure to the system. As AC introduces errors and soft errors are mitigated by fault-tolerant mechanisms, they have conflict goals and contradictory approaches. To the best of our knowledge, there is no previous efforts to consider the two at the same time. In this paper, we study the problem of AC with soft errors in order to guarantee the safe execution of the program while reducing energy (by AC). More specifically, we propose FTApprox, a fault-tolerant approximate arithmetic computing data format, to enable the detection and correction of SEs. As an approximate data format, FTApprox can use 16 bits to approximate any 32-bit integers and fixed-point numbers, and will select only the most significant part of operands for AC at runtime. Energy saving is obtained by converting 32-bit arithmetic operations to 8-bit operations. Meanwhile, for soft errors such as random bit flips, FTApprox not only can detect all single bit flips and most 2-bit flips, it can also correct most of these errors. The experimental results show that FTApprox has significant resistance against soft errors while providing 66.4%-79.6% energy saving.

Motivation: Certain studies use short-TE MRS to estimate metabolites such as gamma-aminobutyric acid. The findings of such studies hinge on the correlation of this technique to the gold-standard edited MRS technique. Goal(s): We investigate how the false negative rate and false positive rate of studies vary as a function of correlation between short-TE and MEGA-edited metabolite estimates. Approach: Simulated data was used to numerically estimate the false positive and false negative rates, using parameters obtained from the literature. Results: We show that these studies can have largely inflated false positive and false negative rates as compared to their nominally designed values. Impact: The false negative and false positive rate can be markedly inflated when using short-TE MRS to estimate metabolites such as gamma-aminobutyric acid. This calls for increased caution in interpreting results, and the accommodation of these effects when designing statistical analyses.

Device scaling and large scale integration have led to growing concerns about soft errors in microprocessors. To date, in all but the most demanding applications, implementing parity and ECC for caches and other large, regular SRAM structures have been sufficient to stem the growing soft error tide. This will not be the case for long, and questions remain as to the best way to detect and recover from soft errors in the remainder of the processor - in particular, the less structured execution core. In this work, we propose the ReStore architecture, which leverages existing performance enhancing checkpointing hardware to recover from soft error events in a low cost fashion. Error detection in the ReStore architecture is novel: symptoms that hint at the presence of soft errors trigger restoration of a previous checkpoint. Example symptoms include exceptions, control flow mis-speculations, and cache or translation look-aside buffer misses. Compared to conventional soft error detection via full replication, the ReStore framework incurs little overhead, but sacrifices some amount of error coverage. These attributes make it an ideal means to provide very cost effective error coverage for processor applications that can tolerate a nonzero, but small, soft error failure rate. Our evaluation of an example ReStore implementation exhibits a 2x increase in MTBE (mean time between failures) over a standard pipeline with minimal hardware and performance overheads. The MTBF increases by 7x if ReStore is coupled with parity protection for certain pipeline structures.

Ranaviruses have been identified as the etiologic agent in many amphibian die-offs across the globe. Polymerase chain reaction (PCR) is commonly used to detect ranavirus infection in amphibian hosts, but the test results may vary between tissue samples obtained by lethal and non-lethal procedures. Testing liver samples for infection is a common lethal sampling technique to estimate ranavirus prevalence because the pathogen often targets this organ and the liver is easy to identify and collect. However, tail clips or swabs may be more practicable for ranavirus surveillance programs compared with collecting and euthanizing animals, especially for uncommon species. Using PCR results from liver samples for comparison, we defined false-positive test results as occurrences when a non-lethal technique indicated positive but the liver sample was negative. Similarly, we defined false-negative test results as occurrences when a non-lethal technique was negative but the liver sample was positive. Using these decision rules, we estimated false-negative and false-positive rates for tail clips and swabs. Our study was conducted in a controlled facility using American bullfrog Lithobates catesbeianus tadpoles; false-positive and false-negative rates were estimated after different periods of time following exposure to ranavirus. False-negative and false-positive rates were 20 and 6%, respectively, for tail samples, and 22 and 12%, respectively, for swabs. False-negative rates were constant over time, but false-positive rates decreased with post-exposure duration. Our results suggest that non-lethal sampling techniques can be useful for ranavirus surveillance, although the prevalence of infection may be underestimated when compared to results obtained with liver samples.

The Effect of Testing Reliability on Visual Field Sensitivity in Normal Eyes: The Singapore Chinese Eye Study

Successive generations of processors use smaller transistors in the quest to make more powerful computing systems. It has been previously studied that smaller transistors make processors more susceptible to soft errors (transient faults caused by high energy particle strikes). Such errors can result in unexpected behavior and incorrect results. With smaller and cheaper transistors becoming pervasive in mainstream computing, it is necessary to protect these devices against soft errors; an increasing rate of faults necessitates the protection of applications running on commodity processors against soft errors. The existing methods of protecting against such faults generally have high area or performance overheads and thus are not directly applicable in the embedded design space. In order to protect against soft errors, the detection of these errors is a necessary first step so that a recovery can be triggered.

Successive generations of processors use smaller transistors in the quest to make more powerful computing systems. It has been previously studied that smaller transistors make processors more susceptible to soft errors (transient faults caused by high energy particle strikes). Such errors can result in unexpected behavior and incorrect results. With smaller and cheaper transistors becoming pervasive in mainstream computing, it is necessary to protect these devices against soft errors; an increasing rate of faults necessitates the protection of applications running on commodity processors against soft errors. The existing methods of protecting against such faults generally have high area or performance overheads and thus are not directly applicable in the embedded design space. In order to protect against soft errors, the detection of these errors is a necessary first step so that a recovery can be triggered. To solve the problem of detecting soft errors cheaply, we propose a profiling-based software-only application analysis and transformation solution. The goal is to develop a low cost solution which can be deployed for off-the-shelf embedded processors. The solution works by intelligently duplicating instructions that are likely to affect the program output, and comparing results between original and duplicated instructions. The intelligence of our solution is garnered through the use of control flow, memory dependence, and value profiling to understand and exploit the common-case behavior of applications. Our solution is able to achieve 92% fault coverage with a 20% instruction overhead. This represents a 41% lower performance overhead than the best prior approaches with approximately the same fault coverage.

To evaluate the false-negative and false-positive error rates both in a screening and a non-screening population. A total of 4192 prostatic biopsies were reported in a 6-year period by 15 consultant histopathologists, two of whom had an interest in uropathology and were deemed to be specialists (J.O. and C.S.). All biopsies were reviewed prior to the multidisciplinary team (MDT) meeting. The overall false-negative rate was 1.7% (screening 2.1%, non-screening 1.5%). The overall false-positive rate was 0.5% (screening 0.9%, non-screening 0.4%). These error rates varied among pathologists, with the false-negative rate ranging from 0% to 9.3%, and the false-positive rate ranging from 0% to 3.8%. The false-negative rate was three times greater than the false-positive rate, showing that detection of significant pathology is far greater in the negative biopsies. More errors occurred in the screening population than in the non-screening population. The consultants making the most errors were non-specialists, but the specialists also made false-negative errors, suggesting that just using specialist reporting alone would not have eradicated errors.

Describes the alpha-particle-induced soft errors in ECL logic circuitry. Soft-error 'hot' testing has been performed using 2.5-, 1.7-, and 1.3- mu m ECL gate arrays exposed to /sup 241/Am. Experimental results reveal that: (1) the soft errors in ECL logic circuitry are caused by two types of upsets, latch toggling and gate upsets in clock lines; (2) the soft error rate (SER) increases rapidly as feature size is scaled down; and (3) the SER increases rapidly as switching current is reduced. To overcome the degradation of soft-error tolerance, a soft-error hardened (SEH) circuit design technique employing a new driver configuration which prevents upsets of critical nodes from propagating to following gates is introduced. The SEH design has been implemented in the ECL gate arrays and verified to improve the SER by more than 10/sup 2/ times as compared with conventional circuits. >

An Evaluation of Conventional Culture, invA PCR, and the Real-Time PCR iQ-Check Kit as Detection Tools for Salmonella in Naturally Contaminated Premarket and Retail Turkey

The influence of fatigue and related factors on automated perimetric testing was evaluated in both eyes of sixteen normal observers and sixteen patients with early-to-moderate visual field loss using a Digilab 750 automated perimeter and a customized test procedure. False positive rate, false negative rate, and detection sensitivity at 5,10,15, and 20 degrees eccentricity were measured in 1.5-rain intervals throughout a 21-min visual field examination. Half of the normal observers and patients with visual field loss were given a briefrest(1.5-min) midway through each visual field exam to determine whether this would reduce fatigue effects. Our findings revealed that patients displayed considerably higher average false positive and false negative rates than normal observers. However, neither the patients nor normal observers demonstrated any consistent changes in false positive rate or false negative rate as a function of testing duration. In contrast, both normal observers and patients showed an average decrease in sensitivity as a function of increasing test duration with the magnitude of the time-dependent sensitivity loss becoming greater with increasing stimulus eccentricity. Patients demonstrated a larger time-dependent sensitivity loss than normal observers, averaging ~4dB at 20 degrees eccentricity. The introduction of a brief pause midway through the test procedure appeared to reduce the time-dependent sensitivity loss for the second half of the test procedure, especially for greater eccentricities.

Several different types of detectors, software, and hardware designs are employed in instruments used to monitor radioactive content of freight shipments in order to detect illicit trafficking of nuclear materials. The instruments can be container monitors, hand-held radiation detectors, mobile analysis systems, or fixed radiation portal monitors. However, within the various groupings (e.g., portal monitors), all instruments are expected to solve the same problem, that is, to detect and identify any radioactive material present according to the prescribed investigative procedure or CONOPS. The best way to compare the performance of different instruments is with a numerical score or Figure of Merit (FOM). The FOM must quantify the performance of the instrument with respect to true positives (TP), false positives (FP), and false negatives (FN). The minimization of FN for certain radionuclides (e.g., uranium and plutonium or other Special Nuclear Material (SNM)) is more important than the minimization of FN for non-threat nuclides (e.g., low level NORM). In a similar way, the minimization of FP for SNM is more important than falsely reporting the common NORM nuclides which represent no threat. System performance depends on the measurement detail (e.g., transit speed through a portal, measurement time in general, amount and distribution of NORM), therefore the test conditions should also be included in the statement of the FOM. The FOM is expected to vary significantly with the above measurement details. A FOM has been developed based on the number of true positives (TP), the number of false important positives (FIP), the number of FP, the number of true positives for SNM (TPSNM), and the number of false positives for SNM (FPSNM). This formula rates the overall performance with extra weight given to FP and FN for SNM. Examples will be shown for testing of portal monitors.

Relationships between age and visual field (VF) reliability indices were investigated using a large real-world dataset (42,421 VF data points from 11,525 eyes of 5930 subjects). All VFs tested and stored at Shimane University Hospital between 1988 and 2019 were exported. Correlations between age, mean deviation (MD), pattern standard deviation (PSD), and reliability indices including fixation losses (FLs), false negatives (FNs), and false positives (FPs) were analyzed. The mean ± standard deviation age was 65.0 ± 15.1 years; MD—−6.9 ± 8.1 decibels (dB); PSD—6.3 ± 4.6 dB; FL—8.6 ± 11.7%; FN—5.3 ± 8.3%; and FP—2.6 ± 5.0%. Univariate analyses showed strong associations between age and FNs (correlation coefficient, ρ = 0.20, p < 0.0001) and MD (ρ = −0.21, p < 0.0001). All FLs, FNs, and FPs were lowest during the third decade (20–29 years) of life. FLs were elevated consistently after that decade, and FNs were elevated sharply after the seventh decade. FPs were relatively stable after the fourth decade (30–39 years). Mixed-effect regression analyses in subjects 40 years and older showed that older age was associated with worse FLs (p < 0.0001) and FNs (p < 0.0001) but not FPs (p = 0.4126). Aging affects FLs and FNs with different modes but had minimal effects on FPs. Decreased VF sensitivity, deteriorated macular function, and technical difficulties with testing may be mechanisms of age-related changes in FLs and FNs.

The main objective of online anomaly detection is to identify abnormal/unusual behavior such as network intrusions, malware infections, over utilized system resources due to design defects etc from real time data stream. Terrabytes of performance data generated in cloud data centers is a well accepted example of such data stream in real time. In this paper, we propose an online anomaly detection framework using non-parametric statistical technique in cloud data center. In order to determine the accuracy of the proposed work, we experiments it to data collected from RUBis cloud testbed and Yahoo Cloud Serving Benchmark (YCSB). Our experimental results shows the greater accuracy in terms of True Positive Rate (TPR), False Positive Rate (FPR), True Negative Rate (TNR) and False Negative Rate (FNR).

Soft error resilience has become an essential design metric in electronic computing systems as advanced technology nodes have become less robust to high‐charged particle effects. Designers, therefore, should be able to assess this metric considering several software stack components running on top of commercial processors, early in the design phase. With this in mind, researchers are using virtual platform (VP) frameworks to assess this metric due to their flexibility and high simulation performance. In this regard, herein, this goal is achieved by analysing the soft error consistency of a just‐in‐time fault injection simulator (OVPsim‐FIM) against fault injection campaigns conducted with event‐driven simulators (i.e. more realistic and accurate platforms) considering single and multicore processor architectures. Reference single‐core fault injection campaigns are performed on RTL descriptions of Arm Cortex‐M0 and M3 processors, while gem5 simulator is used to multicore Arm Cortex‐A9 scenarios. Campaigns consider different open‐source and commercial compilers as well as real software stacks including FreeRTOS/Linux kernels and 52 applications. Results show that OVPsim‐FIM is more than 1000× faster than cycle‐accurate simulators and up to 312× faster than event‐driven simulators, while preserving the soft error analysis accuracy (i.e. mismatch below to 10%) for single and multicore processors.