Unravelling friction anisotropy by atomic force microscopy.

Mechanisms of anisotropic wet friction in bioinspired hexagonal pillar arrays.

Layered materials are the most important class of solid lubricants. Friction on their surfaces has complex origins. Most experimental methods so far only give total friction force and cannot separate contributions from different origins. Here, we report a method to separate anisotropic and isotropic friction forces on atomically flat surfaces such as ${\mathrm{MoS}}_{2}$, graphite, h-BN, and mica by combining a two-dimensional friction force microscope technology and a two-dimensional friction model. We found that the friction force of most atomically flat surfaces is anisotropic, the total force on the tip misaligns with the scan direction, and the friction anisotropy vanishes under low sliding velocity. Our two-dimensional friction model explains experimental observations. It reveals the existence of elemental hopping combinations and the isotropic component in total friction. The misalignment angle can be used to calculate the ratio of anisotropic and isotropic friction components and the ratio of resistance forces from different lattice directions. The separation of anisotropic and isotropic friction forces will offer an avenue for studying the properties of individual friction components, which can boost the study of friction mechanisms in the future and benefit the application of solid lubricants.

Generation mechanism of friction anisotropy by surface texturing under boundary lubrication

Scanning probe microscopes (SPMs) are well known as surface imaging tools with nanometer scale resolution. SPMs can be used not only for surface observation but also for local surface manipulation. We have developed a nanometer-scale manipulator based on an atomic force microscope (AFM) which can be operated under observation using a scanning electron microscope. Nano manipulations of biological samples using the haptic control system of the AFM are demonstrated. Furthermore, we introduce a real time nanomanipulation system based on a high-speed atomic force microscopy (HS-AFM) . Even under surface manipulation using the AFM probe, the topographical image of the manipulated surface is periodically updated by HS-AFM. This system would be very useful for real time nano manipulation and fabrication of sample surfaces.

INTRODUCTION Background History of Microscopy SCANNING PROBE MICROSCOPES (SPMS) Scanning Tunneling Microscope Electron Tunneling Atomic Force Microscope (AFM) Modes of Operation of AFM Simultaneous AFM and Scanning Near-Field Fluorescence (SNOM and SNOM-AFM) Friction Force Microscopy (FFM) STM and AFM Studies under Fluids Sample Preparation Procedures for STM and AFM Calibration and Image Analysis of STM and AFM Comparative Studies of Diverse Molecules by STM and AFM LIPID-LIKE MOLECULES ON SOLIDS AND SAMS Collapsed Lipid Monolayers (Self-Assembly) Domain Patterns in Monomolecular Film Assemblies Mixed Lipid Molecule Assemblies Holes in LB Films of Self-Assembly Monolayers Visualization of Vesicles by AFM LB Films of Liquid Crystals STM and AFM Studies of Diverse Molecules on Solids STM Studies on the Effect of Functional Group BIOPOLYMERS AND SYNTHETIC POLYMERS STRUCTURES BY STM AND AFM DNA Structures by STM and AFM SPM Studies of Three-Dimensional Protein Structures Protein Adsorption Studies by AFM Biological Macromolecular Structures Synthetic Polymers Studies by SPMs Mixed Monolayers of Macromolecules and Lipids Diverse Macromolecular Properties as Studied by SPMs Monolayers of Synthetic Polyamino Acids Biopolymer SAM Structures at Interfaces by STM and AFM CRYSTAL STRUCTURES BY STM AND AFM Crystal Structures of Small Molecules Surface Adsorption Studies by SPMs Macromolecule Crystals by STM and AFM STUDIES OF SOLID SURFACES BY SPMS Wetting Properties of Solid Surfaces AFM Analyses of Surface Acid-Base Properties Measurement of Attractive and Repulsive Forces by Atomic Force Microscope (AFM) DIVERSE APPLICATIONS OF SPMS (STM AND AFM, ETC.) AND NANOTECHNOLOGY STM and AFM in Organic Chemistry Semiconductor Study by SPM STM and AFM in Inorganic Chemistry Nanolithography and Nanomachining Qualitative and Quantitative Analyses at Nanoscale Application of SPMs under Dynamic Conditions Application of AFM to Immunodiagnostic Systems Applications of STM and AFM in Industry SPM Studies of Nanoscale Reactors Nanoscale Evaluation of Surface Roughness by SPMs Application of STM and AFM in Pollution Control Friction Force Microscope (FFM) Time-Resolved Analyses by STM REFERENCES

Surface charges and adhesion measured by atomic force microscope influence on friction force

The measurement of small forces by atomic force microscopy (AFM) is of increasing importance in many applications. For example, in analytical applications where individual molecules are probed, or nanoindentation measurements as a source of information about materials properties on a nanometer scale. The fundamentals of AFM force measurement, and some of these applications, are briefly reviewed. In most cases absolute, not relative, measurements of forces are needed for valid comparisons with theory and other measurement techniques (such as optical tweezers). We review methods of AFM force calibration and the major uncertainties involved. The force range considered in this work is roughly from 10 pN to around 500 nN. We describe some issues of the repeatability of force measurements that can be important in common AFM instruments. In most cases the aspect that then limits the accuracy with which forces can be measured is the uncertainty in the stiffness (more specifically the normal force constant) of the atomic force microscope cantilever at the center of the instrument. It is known that commercially available microfabricated atomic force microscope cantilevers have a wide range of force constant, for cantilevers of nominally the same type and even the same production batch. Calibration is necessary, and many methods have been used over the years. We compare the accuracy that can be achieved and the ease of use of these different methods, including theoretical (dimensional), thermal, static and dynamic methods and their variants. A device developed at NPL should help overcome many of the problems of force constant calibration, at least for the most common AFM configurations. This is a microfabricated silicon device, which, because of its very small mass, is not susceptible to vibration as a larger device would be. A new calibration method based on electrical and Doppler measurements allows the calibration of the force constant of this device traceable to the SI newton. It can then be sent to AFM users for straightforward calibration of AFM force constants. We conclude with a brief discussion of the special problems of calibration of lateral forces, such as those obtained in frictional force measurements.

The load effect on the anisotropic friction property of gecko seta arrays have been experimentally investigated on a homemade micro adhesive and friction force detect device with isolated seta arrays. The result shows that when sliding against the direction of the seta curvature to grip out, the friction force is proportional to the normal load with a friction coefficient of about 0.6. When sliding along the direction of the seta curvature to grip in, the normal preload force could be fully or partly transformed into adhesion force and repulsive force while friction force rapidly rose with the increment of the applied preload. Under the same normal preload, the lateral friction force in grip in is more than twice of that in grip out. These properties of anisotropy in friction and adhesion are determined by the micro and nano-structures of setae.

Lowering friction coefficient under low loads by minimizing effects of adhesion force and viscous resistance

Investigations on the use of the scanning probe microscope (SPM) in the atomic force microscopy (AFM) mode for topography imaging and the magnetic force microscopy (MFM) mode for magnetic imaging are presented for a thin‐film recording head. Results showed that the SPM is suitable for imaging the surface profile of the recording head, determining the width of the pole gap region, and mapping the magnetic field patterns of the recording head excited under current bias conditions of different polarity. For the cobalt sputter‐coated tips used in MFM imaging, it was found that the magnetic field patterns obtained under different polarities of the current bias to the recording head were similar. This can be explained by the nature of the thin‐film MFM tip, in which the direction of the tip magnetic moment can follow the stray magnetic field of the sample as the current bias to the recording head reverses in direction.

In this paper, a novel scanning probe microscope (SPM) modeling technique is presented. The novelty of this technique is that it exploits the SPM's probe-surface interaction measurement capabilities [e.g., the topography signal in atomic force microscopy (AFM)] to determine the SPM's lateral positioning dynamics. SPM operation speed is limited due to mechanical vibrations induced by movement of the SPM nanopositioner. In order to facilitate high-speed SPM operation, the dynamics of the SPM can be modeled and used to design feedforward and feedback controllers that reduce nanopositioner vibrations. The proposed technique seeks to develop a transfer function model of the SPM dynamics using only the SPM probe-surface interaction signal obtained while scanning a calibration sample. The technique is presented in the context of an AFM example, errors associated with the method are analyzed, and the method is experimentally verified using a commercial AFM. Experimental modeling results show that the method is capable of modeling the dynamics of SPM systems.

The direct modification of silicon and other semiconductor and metal surfaces by the process of anodization using the electric field from a scanning probe microscope in conjunction with the absorbed water from the atmosphere as the electrolyte is one promising method of accomplishing direct write lithography for the electron device fabrication using scanning probe microscopes. Both scanning tunneling microscopes and conductive-tip atomic force microscopes have been used for anodization with the work reported here primarily accomplished with a conductive-tip atomic force microscope. We have found that the terminating thickness of the scanning probe microscope induced oxide is governed by the diffusion limited electric field at the surface (which in this case is a function of the scanning probe microscope tip potential), with many similarities to liquid electrolyte anodization process. In particular, when using atmospheric water as the electrolyte on a silicon substrate and a conductive-tip atomic force microscope with a −7 to −10 V tip potential, the terminating electric field that is reached as the silicon dioxide thickness increases is to its final value of 80 Å is ∼1×107 V/cm. This is consistent with the diffusion limited electric field that is observed in many other anodization processes and the native oxidation of silicon (Mott–Cabrera process).

Using liquid-cell atomic force microscopy, we investigate aqueous solutions of alkyltrimethylammonium halide surfactants at the Au111 surface. The long, micellar surfactant surface aggregates cover the gold surface completely and exhibit two types of orientational order for chloride and bromide counterions, respectively. We observe lateral forces perpendicular to the scanning direction, which we explain by anisotropic friction between the probe and the oriented micelles. Conversely, we show that these friction forces can be employed to modify the spatial conformation of the micellar adlayer. Where previous methods have failed to provide control over the orientation down to the level of individual micelles, we use this technique to achieve a very high degree of order over more than 100 micelle diameters.

Scanning probe microscopy has been extensively applied to probe interfacial water in many interdisciplinary fields but the disturbance of the probes on the hydrogen-bonding structure of water has remained an intractable problem. Here, we report submolecular-resolution imaging of the water clusters on a NaCl(001) surface within the nearly noninvasive region by a qPlus-based noncontact atomic force microscopy. Comparison with theoretical simulations reveals that the key lies in probing the weak high-order electrostatic force between the quadrupole-like CO-terminated tip and the polar water molecules at large tip–water distances. This interaction allows the imaging and structural determination of the weakly bonded water clusters and even of their metastable states with negligible disturbance. This work may open an avenue for studying the intrinsic structure and dynamics of ice or water on surfaces, ion hydration, and biological water with atomic precision.

This thesis deals with the development of microfabrication technologies based on photoplastic structuring by lithographic and molding techniques. These technologies, combined with an original releasing method, allow for the simple fabrication of pseudo three-dimensional, soft, photoplastic microstructures with features and shapes that are difficult to obtain with standard micro-machining. The photoplastic material used is the SU-8 photoresist, a material that is used increasingly in the growing field of micro-electro-mechanical systems (MEMS). Photoplastic SU-8 microstructure fabrication is based on a combination of multi-layer spin-coating, molding and photolithographic processing of the resist on a prestructured silicon substrate. The final product is obtained by release of the structure from the substrate. This thesis describes several SU-8 microstructures which have been developed with an emphasis on atomic force microscopy (AFM) and scanning-near field optical microscopy (SNOM) probes. Scanning probe microscopy is a well-established technique for surface analysis, but batch-fabricated, low-cost probes still remain a challenging issue. Using a polymer for the cantilever facilitates the realization of mechanical properties that are difficult to achieve with classical silicon technology. The design, fabrication and testing of single lever and cassettes of multiple single-lever probes are presented and demonstrates the potential for fabrication structures with complicated shape and features. The fabrication process for SU-8 AFM probes is a simple batch process in which the integrated tips and the levers are defined in one photolithography step. Tip radii of curvature smaller than 15 nm have been obtained. The cantilever thickness depends on the spin-coating parameters, hence it can be very well controlled over a full wafer. Photoplastic cantilevers with thicknesses ranging from 1 to 6 μm have been produced. Imaging soft, condensed matter with photo-plastic levers, which uses laser beam deflection sensing, exhibits a resolution that compares well with that of commercially available silicon cantilevers. Lateral resolution of 5–6 nm has been estimated from imaging DNA-plasmid molecules. A vertical resolution of the order of 0.1 nm has been found. A similar fabrication technique was also developed to fabricate photo-plastic tips for SNOM that are to be attached to optical fibers. This technique allows optical apertures to be integrated at the end of the well-defined tip directly by probe fabrication, without the need for any post-processing for the aperture formation. Sub-100 nm aperture have been fabricated using this technique. Simple fabrication, as well as topographical and optical imaging demonstrate the potential of photoplastic-based probes for both AFM and SNOM applications, as well as for future combined probes development. In addition, the fabrication of functional microstructures by using SU-8 processing needs to be combined with other microfabrication techniques. Simple releasing of the molded structures from the substrate is especially of great importance. A sacrificial layer technique based on electrochemical etching enhancement has been developed and combined with the fabrication of the different photoplastic SU-8 probes presented. This technique allows the fast releasing of large microstructures and has been demonstrated by releasing other SU-8 photoplastic microfabricated devices.