High-Power and Highly Efficient CMOS Power Amplifiers for D-Band Applications in Silicon: Design methodologies that extend CMOS power, gain, and bandwidth toward sub-terahertz operation
As demand grows for multigigabit data links, high-resolution radar, and precision sensing, operating frequencies are being driven deep into the sub-terahertz (sub-THz) spectrum, where the <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">D</i>- and <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">G</i>-bands (110–220 GHz) offer immense bandwidth (BW). However, operating at these frequencies with CMOS silicon technologies reveals several fundamental physical limitations, including limited breakdown voltage, low intrinsic gain, dominant parasitics, and significant passive losses. This article brings together different design methodologies that push these limits and expand the achievable power, gain, and BW of CMOS power amplifiers (PAs) operating near <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">${f}_{\max}$</tex-math></inline-formula> The first approach revisits the concept of transistor stacking from a large-signal modeling perspective. By analytically accounting for all parasitic elements and the intrinsic delay of each device, a systematic framework is developed to determine the optimum input, output, and gate impedances for every transistor in the stack. A 45-nm SOI prototype that combines multiple stacked stages through a low-loss 4:1 combiner demonstrates 18.7 dBm saturated output power and 4.8% power-added efficiency (PAE) at 200 GHz, an example of how careful modeling can turn CMOS voltage limits into a scalable power generation strategy. The second methodology focuses on gain enhancement through embedding. At sub-THz frequencies, where matching-network losses can rival transistor gain, a passive feedback network is introduced and tuned on a “gain plane” that maps equi-gain and equi-load-conductance contours. This graphical design tool allows the simultaneous optimization of gain and output power. Implemented in a 65-nm CMOS 2 × 8 cell amplifier, the embedded approach achieves 19.5 dB gain and 9.4 dBm saturated power at 200 GHz, showing how modest feedback can recover otherwise-lost gain and extend usable output levels. The third technique, reverse-feedback amplification, breaks the BW barrier. By introducing a controlled amount of negative resistance into each amplifier cell, a distributed line is formed that supports constructive wave propagation and continuous power addition without interstage matching. Two 45-nm CMOS <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">G</i>-band amplifiers fabricated using this principle deliver up to 20.4 dB gain and 3.8% PAE across a 156- to 194-GHz 3-dB BW. Together, these methodologies, large-signal stacking, gain plane embedding, and distributed reverse feedback, demonstrate how thoughtful circuit architectures can overcome fundamental device limits to achieve high-power, high-efficiency, and broadband amplification in standard CMOS.
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