Applications of high voltage electron microscopy to botanical ultrastructure

High voltage electron microscopy (HVEM) has been employed in various ways (whole mounts of cells stereo pair imaging, axial tomography, and serial sections for reconstruction) to elucidate three dimensional (3-D) ultrastructural data. The increased specimen thickness allows further data analysis unobtainable from ultra-thin sections. HVEM can reduce the number of sections needed in 3-D reconstructiortby approximately ten times over conventional transmission electron microscopy (CTEM). But increasing section thickness also increases wear on the diamond knife used to section. We have compared the serial sections obtained from a histo-grade diamond knife with those from an E.M. grade ultra-knife. Both sets of sections were cut 0.5 μm thick from the same block, and evaluated under the one million volt beam of the HVEM.

High voltage electron microscopy (HVEM) combined with selective histochemical staining yields information otherwise difficult to obtain. Such selective staining follows the irregular contours, channels or surfaces of the structures being studied and thus is not easily traced in conventional thin section electron microscopy. Often the amount of enzyme activity is insufficient to provide an accurate estimate of quantitative differences in reaction product between experimental and control tissues. By taking stereo pairs of micrographs of serial thick sections at 1 MeV it is possible to obtain precise localization of very electron dense reaction products at high resolution and to view the three-dimensional aspects of enzyme distribution. Using stereoscopic visualization a cholinesterase reaction product is identified in neuromuscular junction regions isolated from the hind limb muscles of a dystrophic strain of mice.

chapter 13 Thick and Thin Serial Sectioning for the Three-Dimensional Reconstruction of Biological Ultrastructure

Cultures ofAureobasidium pullulans were grown on a defined medium which enhanced hyphal growth over yeast-type growth. The hyphae at 24 hours postinoculation were prepared for high voltage electron microscopy (HVEM). Serial thick sections (0.5 μm) were observed by means of HVEM operating at 1,000 kV. Tracings of cell walls and major cytoplasmic organelles were made on clear acetate sheets which were subsequently spaced at appropriate vertical heights in order to facilitate cell reconstruction. It was found that the majority of mitochondrial profiles were interconnected forming a highly reticulate mitochondrial network. No cells were found to contain a single mitochondrion, but several large mitochondrial networks were consistently located along the cell periphery and around nuclei and with only a few extensions into the central region of the cell.

There is a need for an electron microscopic method for visualization of selectively stained neurons and neuronal processes with higher resolution than can be obtained with the light microscope, but using thick sections that allow visualization of the three‐dimensional structure of the neuron. Such a method is required for measurement of the geometry of neurons, and this information is needed to test theoretical predictions on the way in which electrical signals of synaptic origin are processed by the cells. The high voltage electron microscope (HVEM) is well suited to this application, because of its high resolution and ability to form images of thick sections. Use of this instrument requires development of selective stains that can produce diffuse cytoplasmic staining of specific cells or cell populations on the basis of their functional properties. Several such methods currently being employed for light microscopic work can be used directly in the high voltage electron microscope or can be made useful by relatively minor alterations. These include intracellular staining with horseradish peroxidase, axonal tracing with Phaseolus vulgaris leukoagglutinin (PHA‐L), and immunocytochemical staining for specific cell markers known to stain the cytoplasm of certain cell populations.Cells stained intracellularly by microinjection of horseradish peroxidase during physiological recording experiments may be stained in thick (ca. 50 μm) sections cut on a vibratome or similar instrument and stained in the standard way, using methods designed for light microscopy. The sections are then postfixed in osmium tetroxide and embedded in epoxy plastic. Sections cut from these blocks at thicknesses of from 1 to 5 μm using a dry glass knife may be examined directly in the HVEM with no further staining. This produces a very clear image of the cell on a relatively unstained background. This method provides more than adequate resolution of the boundary of the neuron, allowing measurement of neuronal processes to better than 10‐nm precision.Similar results are obtained when the same method is applied to axonal tracing using PHA‐L. In this case, the exogenously applied marker is used to label a small population of nearby neurons and to trace their connections with other cells at a distance. The lectin is detected by immunocytochemistry, but the selective contrast of the image is adjustable because the concentration of antigen in the cell is largely controlled by the experimenter. The lectin is distributed diffusely in the cytoplasm in a pattern identical to that of intracellular staining, so like intracellular staining, it reveals the overall shape of the cell.Immunocytochemical labelling using endogenous antigens known to be distributed in the cytoplasm of specific neurons produced inadequate control of selective contrast when prepared in this manner. Instead, 1–10μm sections cut from blocks of nervous tissue were embedded in polyethylene glycol, stained using a combedded in polyethylene glycol, stained using a combination of immunocytochemistry and histochemical intensification methods, and embedded in plastic on the grid. This method, which is also suited for staining with poorly penetrating markers such as colloidal gold, may also prove useful in a variety of other situations requiring the intensification of selective contrast.

The evolution of hydrogen from many hydrated cryo-preserved soft materials under electron irradiation in the transmission electron microscope can be observed at doses of the order of 1000 e nm(-2) and above. Such hydrogen causes artefacts in conventional transmission electron microscope or scanning transmission electron microscopy (STEM) imaging as well as in analyses by electron energy-loss spectroscopy. Here we show that the evolution of hydrogen depends on specimen thickness. Using wedge-shaped specimens of frozen-hydrated Nafion, a perfluorinated ionomer, saturated with the organic solvent DMMP together with both thin and thick sections of frozen-hydrated porcine skin, we show that there is a thickness below which hydrogen evolution is not detected either by bubble observation in transmission electron microscope image mode or by spectroscopic analysis in STEM electron energy-loss spectroscopy mode. We suggest that this effect is due to the diffusion of hydrogen, whose diffusivity remains significant even at liquid nitrogen temperature over the length scales and time scales relevant to transmission electron microscopy analysis of thin specimens. In short, we speculate that sufficient hydrogen can diffuse to the specimen surface in thin sections so that concentrations are too low for bubbling or for spectroscopic detection. Significantly, this finding indicates that higher electron doses can be used during the imaging of radiation-sensitive hydrated soft materials and, consequently, higher spatial resolution can be achieved, if sufficiently thin specimens are used in order to avoid the evolution of hydrogen-based artefacts.

Image quality of microns-thick specimens in the ultra-high voltage electron microscope

Characterization of electrode dissolution products on the high-voltage electron microscope

Whole-cell imaging of the budding yeast Saccharomyces cerevisiae by high-voltage scanning transmission electron tomography

The formation of junctional complexes between endothelial cell processes was examined in rat spinal cords, from age birth to six weeks. Segments of spinal cord were removed from the region of the cervical enlargement and fixed. For comparative purposes, animals from each time group were subdivided into groups, fixed by either immersion or perfusion with an aldehyde combination in sodium cacodylate buffer and embedded in Araldite. Thin sections were examined by conventional transmission electron microscopy. Thick sections (0.5μ - 1.0μ) were stained with uranyl magnesium acetate for four hours at 60°C and lead citrate for 30 mins. and examined in the AEI Mark II High Voltage Electron Microscope.

It is well known that the combination of a field emission gun (FEG) and a conventional transmission electron microscope (CTEM) is extremely important for nanometer area analysis in analytical electron microscopy. However, the smaller illumination angle and reduced energy spread of FEG than those of a conventional electron gun (W hair pin filament or LaB6) give a slowly damping envelop function in phase contrast transfer function (PCTF). Thus the FEG ensures application not only to analytical microscopy but also to high resolution electron microscopy to improve the information limit.In a high voltage electron microscope (above 200 kV), high-speed vacuum pumps have to be provided below the acceleration tube to get an ultra high vacuum (UHV) around the field emission tip located at the top of the acceleration tube. However, this method is not always the best way to provide UHV because of the poor vacuum conductance caused by the electrodes inside the acceleration tube.

The afferent innervation pattern of inner hair cells in the apex of the guinea pig cochlea was studied using serial reconstruction of semithick (0.25-micron) sections and high-voltage electron microscopy (HVEM). This thickness produced a good compromise between the ability to resolve details of the synaptic contacts between the hair cells and sensory neurons and the number of sections required to reconstruct the nerve terminals within the receptor organ. The use of a goniometer allowed the sections to be tilted to angles optimum for viewing either the synaptic membrane specializations or the presynaptic bodies. Reasonably good images of 0.25-micron sections could be obtained using a conventional 120-keV microscope, but the images produced by the HVEM were clearly superior. The sensory nerve terminals and hair cells were reconstructed using a microcomputer-based computer-aided-design system. Nerve terminals with complex shapes could be successfully rendered as surface models viewed as stereo pairs. The advantages and limitations of the techniques used are discussed.

In a conventional transmission electron microscope (CTEM, or TEM for short) (Fig. 1.1), a thin specimen is irradiated with an electron beam of uniform current density. The acceleration voltage of routine instruments is 80–120 kV. Medium-voltage instruments work at 200–500 kV to provide a better transmission and resolution, and in high-voltage electron microscopy (HVEM) the acceleration voltage reaches 500 kV – 3 MV. Earlier books on the subject are listed as references [1.1–50]. The development of both theory and instrumentation as well as of the different application of TEM can be followed by consulting the proceedings of the International Conferences on Electron Microscopy [1.51–61].KeywordsTransmission Electron MicroIncrease Energy LossPlasmon LossUniform Current DensityScan Tunnel MicroThese keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

In many fields of research in science, engineering, and medicine, electron microscopy as a method for directly imaging submicroscopic structures has become increasingly important in recent decades. Electron microscopy (EM) includes several different techniques: conventional transmission electron microscopy (TEM), high-resolution electron microscopy (HREM), highvoltage electron microscopy (HVEM), scanning electron microscopy (SEM), analytical electron microscopy (AEM), emission electron microscopy (EEM), and others. In the past the central aim of using electron microscopy was structure determination, but recently it has been of growing importance for also investigating different processes, i.e., changes in materials by interaction with several influential factors (e.g., heat, electric or mechanic fields, mechanical loading). Of particular interest is the study of the micromechanical processes of deformation and fracture. Therefore, electron microscopy is a very powerful tool for materials science. The present review reports on some capabilities and limitation of the application of electron microscopy to solid polymers. In Section II the techniques of electron microscopy are briefly reviewed, followed by a section that describes the main methods of specimen preparation of solid polymeric materials. In Section IV the results of several applications of electron microscopy are discussed to reveal the morphology as well as the micromechanical deformation processes of several polymeric materials.

Utilizing serial thick sectioning techniques in combination with high voltage electron microscopy and stereopair analysis a count of 124 chromosomes was determined for a metaphasic plasmodial nucleus of the slime mold E. minutum.