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Introduction

  • Jan 1, 1997
  • Ludwig Reimer
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Abstract

In a conventional transmission electron microscope (CTEM, or TEM for short) (Fig. 1.1), a thin specimen is irradiated with an electron beam of uniform current density. The acceleration voltage of routine instruments is 80–120 kV. Medium-voltage instruments work at 200–500 kV to provide a better transmission and resolution, and in high-voltage electron microscopy (HVEM) the acceleration voltage reaches 500 kV – 3 MV. Earlier books on the subject are listed as references [1.1–50]. The development of both theory and instrumentation as well as of the different application of TEM can be followed by consulting the proceedings of the International Conferences on Electron Microscopy [1.51–61].KeywordsTransmission Electron MicroIncrease Energy LossPlasmon LossUniform Current DensityScan Tunnel MicroThese keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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