DESSB-TRNG: A novel true random number generator using data encryption standard substitution box as post-processing

A quantum random number generator (QRNG) based on a silicon nanocrystals (Si-NCs) light emitting device (LED) coupled with a silicon single photon avalanche photodiode (Si-SPAD) is presented. A simple setup is used for the generation of random bits. The modeled approach assures a negligible bias on datasets of ∼100 Mbits length. The raw data pass all the statistical tests in the National Institute of Standards and Technology (NIST) suite without any post-processing operations. The bit-rate of 0.6 Mbps is achieved. The information-theoretically provable randomness extractor of Toeplitz-hashing function is applied to longer datasets (∼1 Gbits) to extract the randomness, to minimize the bias, and consequently pass all the NIST tests. Stabilizing the temperature, resetting the applied current to the LED, or a feedback system can also be used as parameter control solutions to generate good quality, long datasets of random numbers suitable for cryptographic applications.

The generation of true random numbers is one of the most important tasks in a hardware security module (HSM), particularly for cryptography applications. The stochastic behavior of electronic devices can be used to generate random numbers. In this paper, a reliable neuromorphic true random number generator (TRNG) relying on stochastic switching of the magnetic tunnel junction (MTJ) in the subcritical current regime is proposed. Thanks to the efficient structure of the proposed design as well as the fascinating features of the MTJs and carbon nanotube field-effect transistors (CNTFET), the proposed TRNG consumes low power. Moreover, the neuromorphic structure of the proposed design leads to variation tolerance and guarantees the truly random number generation even in the presence of the process variations. HSPICE simulations verify the functionality of the proposed TRNG. Furthermore, by considering the corners of the fabrication process, the randomness of the bitstream, generated by the proposed TRNG, is validated by the statistical randomness test provided by the U.S National Institute of Standards and Technology (NIST).

True random numbers are essential for ensuring information security and supporting simulations across various industries. With the exponential growth of data driven by advancements in artificial intelligence, robust encryption for communications has become increasingly important. While software-based deterministic random number algorithms are cost-effective and easy to use, they are vulnerable to attacks by powerful supercomputers, highlighting the need for more secure alternatives. As portable electronic devices and information-gathering sensors proliferate, portable true random number generators (TRNGs) are critical for maintaining security. In this work, hybrid material-based photodetectors composed of anionic polymers and perovskites that maximize stochastic photogeneration for TRNG applications are presented. By integrating perovskite photodetectors with simple electronic circuits, compact, low-power TRNG devices have been developed that are versatile and resilient to environmental factors. These devices generate 10000 bitss-1 without resets or delays, achieving significant miniaturization. The generated 10 Mbit random number is validated through US National Institute of Standards and Technology (NIST) testing. Using a 480000-bit random sequence, perfect image encryption, ensuring protection against hacking are demonstrated. Additionally, the perovskite TRNG can operate under external light even when embedded in pork skin, realizing its potential as an implantable device for personal security and authentication.

The pursuit of hardware-based security solutions has highlighted the true random number generator (TRNG). Various physical phenomena, from noise generation to quantum physics complexities, have been explored for random number generation. The arc discharge light-induced TRNG (ALTRNG) is introduced, featuring wavelength-dependent photocurrent generation and arc discharge irradiation. A bipolar photo-responsive photodetector (BPPD) differentiates "1" and "0" states, producing highly random bits validated by the National Institute of Standards and Technology (NIST) 15 tests. The BPPD's response to deep-ultraviolet (DUV) and blue light enables distinct photocurrent generation under arc discharge illumination. The ALTRNG generates true random signals, yielding bit streams with unpredictability, uniform distribution, and stability. With a readout circuit achieving 2-kbps, wireless random number transmission is demonstrated, highlighting potential for secure password systems and artificial X-ray image generation.

Random ferroelectric domain nucleation and growth lead to the generation of numerous unpredictable microscopic states that collectively form a natural high-entropy system. Conventional electrical methods can directly measure reversible domain switching currents, offering a viable platform for true random number generation (TRNG). However, TRNG based on random ferroelectric switching events is limited by the noise amplitudes in electrical signals. In this study, TRNG is realized via the stochastic formation of conductive domain walls in single-crystal LiNbO3 thin films bonded to SiO2/Si wafers. This approach achieves a noise amplitude and cycling endurance >500nA and >1010, respectively. The interfacial-layer-based device exhibits self-reinitialized stochastic sub-10-ns domain switching operations, enabling ultrafast generation of bit outputs and flexible device scaling. The generated random bitstreams, validated via National Institute of Standards and Technology (NIST)tests, exhibit robust resistance against machine-learning-based predictive attacks. This pioneering study establishes ferroelectric conductive domain walls as groundbreaking platforms for CMOS-compatible entropy source extraction, effectively addressing the long-standing challenges in amplifying entropy signals with operational robustness.

A physical random number generator, which generates truly random number trains by using the randomness of physical phenomena, is widely used in the field of cryptographic applications. We have developed an ultra high-speed superconductive physical random number generator that can generate random numbers at a frequency of more than 10 GHz by utilizing the high-speed operation and high-sensitivity of superconductive integrated circuits. In this study, we have statistically evaluated the quality of the random number trains generated by the superconductive physical random number generator. The performances of the statistical tests were based on a test method provided by National Institute of Standards and Technology (NIST). These statistical tests comprised several fundamental tests that were performed to evaluate the random number trains for their utilization in practical cryptographic applications. We have generated 230 random number trains consisting of 20,000-bits by using the superconductive physical random number generator fabricated by the SRL 2.5 kA/cm 2 Nb standard process. The generated random number trains passed all the fundamental statistical tests. This result indicates that the superconductive random number generator can be sufficiently utilized in practical applications.

Pseudo random number generators (PRNG) play a key role in various security and cryptographic applications where the performance of these applications is directly related to the quality of generated random numbers. The design of such random number generators is a challenging task. In this paper, we propose an application of Hopfield Neural Networks (HNN) as pseudo random number generator. This is done based on a unique property of HNN, i.e., its unpredictable behavior under certain conditions. We compare the main features of ideal random number generators with those of PRNG based on Hopfield Neural Networks. We use a battery of statistical tests developed by National Institute of Standards and Technology (NIST) to measure the performance, and to evaluate the quality of the proposed Hopfield random number generator.

Random numbers are at the heart of diverse fields, ranging from simulations of stochastic processes to classical and quantum cryptography. The requirement for true randomness in these applications has motivated various proposals for generating random numbers based on the inherent randomness of quantum systems. The generation of true random numbers with arbitrarily defined probability distributions is highly desirable for applications, but it is very challenging. Here we show that single-photon quantum walks can generate multi-bit random numbers with on-demand probability distributions, when the required “coin” parameters are found with the gradient descent (GD) algorithm. Our theoretical and experimental results exhibit high fidelity for various selected distributions. This GD-enhanced single-photon system provides a convenient way for building flexible and reliable quantum random number generators. Multi-bit random numbers are a necessary resource for high-dimensional quantum key distribution.

The need for robust cryptographic measures has become increasingly important in various applications, including secure communication, artificial intelligent model training, and stochastic artificial neural networks. Among these measures, true random number generators (TRNGs) are essential for creating unpredictable cryptographic keys. In this work, we utilize BaF2 as the active layer of the memristors. The switching mechanism of these memristors originates from the randomly formed and ruptured conductive filaments, but the devices possess a random telegraph noise (RTN)-type random current spiking at a single operation voltage. This spontaneous spiking behavior features a very high on/off ratio of 103, several orders higher than traditional RTN-based TRNGs. Moreover, we confirm that the resistive switching mechanism results from Ag filament formation through time-of-flight secondary ion mass spectrometry and provide a comprehensive understanding of the Ag diffusion during spiking thorough a Monte Carlo simulation with results well-consistent with the experimental data. The randomness of the random number string generated from the BaF2 memristors is confirmed by passing all 15 National Institute of Standards and Technology (NIST) randomness tests. The high on/off ratio, simple operation, and room-temperature fabrication of the BaF2 TRNG device provide great potential for stochastic hardware implementation in various applications.

A reconfigurable PUF structure with dual working modes based on entropy separation model

Encryption is one of the most important security methods in Fifth Generation (5G) networks, offering high speed and security to support enhanced Mobile Broadband (eMBB), as well as Ultra-Reliable Low-Latency Communications (URLLC). Each algorithm (Advanced Encryption Standard (AES), Data Encryption Standard (DES), ZUC, Synchronous Network-Oriented Word-oriented stream cipher, version 3G (Snow3G)) has distinct strengths and weaknesses in speed and security. Therefore, this research presents two new hybrid models: ZUC-AES (combining the speed of ZUC with the strength of AES) and SNOW3G-DES (combining the speed of SNOW3G with the strength of DES). The models were simulated in MATLAB for data up to 5,000,000 bits, the results simulating six algorithms in MATLAB showed an improvement in strength compared to conventional algorithms, with the p-value on the National Institute of Standards and Technology (NIST) SP 800-22 test improving by approximately average 50% for ZUC-AES (0.4323) compared to ZUC alone (0.288). ZUC was found to be the fastest of all with time 0.85s to 1000000 bit, while the third model, ZUC-AES, achieved superior results compared to AES and DES, while closely matching Snow3G's performance. The study proposed integrating RSA into the system to encrypt keys for secure exchange and increase the strength of encryption.

An ultra-low voltage chaos-based true random number generator for IoT applications

The Clean Air Mercury Rule (CAMR) which was published in the Federal Register on May 18, 2005, requires that calibration of mercury continuous emissions monitors (CEMs) be performed with NIST-traceable standards. Western Research Institute (WRI) is working closely with the Electric Power Research Institute (EPRI), the National Institute of Standards and Technology (NIST), and the Environmental Protection Agency (EPA) to facilitate the development of the experimental criteria for a NIST traceability protocol for dynamic elemental mercury vapor generators. The traceability protocol will be written by EPA. Traceability will be based on the actual analysis of the output of each calibration unit at several concentration levels ranging from about 2-40 ug/m{sup 3}, and this analysis will be directly traceable to analyses by NIST using isotope dilution inductively coupled plasma/mass spectrometry (ID ICP/MS) through a chain of analyses linking the calibration unit in the power plant to the NIST ID ICP/MS. Prior to this project, NIST did not provide a recommended mercury vapor pressure equation or list mercury vapor pressure in its vapor pressure database. The NIST Physical and Chemical Properties Division in Boulder, Colorado was subcontracted under this project to study the issue in detail and to recommend a mercury vapormore » pressure equation that the vendors of mercury vapor pressure calibration units can use to calculate the elemental mercury vapor concentration in an equilibrium chamber at a particular temperature. As part of this study, a preliminary evaluation of calibration units from five vendors was made. The work was performed by NIST in Gaithersburg, MD and Joe Rovani from WRI who traveled to NIST as a Visiting Scientist.« less

The transition effect ring oscillator (TERO) based true random number generator (TRNG) was proposed by Varchola and Drutarovsky in 2010. There were several stochastic models for this advanced TRNG based on ring oscillator. This paper proposed an improved TERO based TRNG and implements both on Altera Cyclone series FPGA platform and on a 0.13um CMOS ASIC process. FPGA experimental results show that this balanced TERO TRNG is in good performance as the experimental data results past the national institute of standards and technology (NIST) test in 1M bit/s. The TRNG is feasible for a security SoC.

A Look at its Past Decade and a Gaze towards its Future. As the National Metrology Institute (NMI) for the United States, the National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, has provided measurement services, both calibrations and reference materials, for more than 100 years. Through these services, our customers have benefitted from our measurement capabilities and expertise in many areas, including amount of substance; dimensional metrology; electricity and magnetism; ionizing radiation; mass and related quantities; photometry and radiometry; thermodynamics; and time and frequency. NIST’s customers have also had access to some of the lowest measurement uncertainties available and a dependable way to establish traceability to the International System of Units (SI) [http://www.nist.gov/pml/wmd/metric/si-units.cfm].In response to the signing of the International Committee for Weights and Measures (CIPM) Mutual Recognition Arrangement (MRA), NIST first established an institution-wide quality system for the measurement services 10 years ago [http://www.bipm.org/en/cipm-mra/objectives.html]. NIST’s Quality System for Measurement Services has advanced the quality of service and measurements we provide our customers by fostering an environment in which NIST management and staff work towards continual improvement in the development and delivery of NIST measurement services. This paper describes NIST’s Quality System for the Measurement Services and its relevance to international standards of quality, such as the International Organization for Standardization and the International Electrotechnical Commission (ISO/IEC) 17025 standard and ISO Guide 34 [http://www.nist.gov/nistqs/]. It also provides a history of this quality system and a glimpse of future goals for improving its implementation.