It is generally accepted that dust resistivity in excess of $${10}^{11}\, \Omega {\rm cm}$$ leads to the formation of back corona and to a deterioration of ESP performance. Besides dust conditioning, the most popular approach for reducing problems with back corona is the application of pulsed corona systems. The idea behind pulsing is very simply to reduce the E-field within the dust layer by reducing the time-averaged current density. However, experience shows that other high resistivity cases are resolved successfully with an opposing approach, using especially smooth HV from three-phase rectifiers in combination with high current densities. A detailed investigation into this discrepancy has revealed that high values of dust resistivity can be traced back to at least two different mechanisms. “Standard” high resistivity dusts show the behaviour which is typical for dielectrics. High potential drop across the dust layer is produced by the injection and immobilization of charge carriers into the material. Resistivity is strongly dependent on time and corona polarity and inversely proportional to the root of current density. The dust layers reach a high level of space charge density. In a sample of an “untypical” high resistivity dust we found that resistivity is independent of layer thickness and of corona polarity and does not show time effects. The dust layer does not accumulate any significant amount of space charge. The potential drop across the dust layer is nearly independent from current density, resulting in a resistivity which is inversely proportional to current density. With very high E-fields, the dust layer shows a progressive increase of current uptake with time, ending in a breakthrough. All these are the typical characteristics of a varistor material. Our results show that different mechanisms of high dust resistivity do exist. Therefore an appropriate choice of the high voltage supply and its control should be based on a thorough analysis of the electrical properties of the dust. A clearly better separation efficiency will be achieved.