Making ATE accessible for academic institutions

The purpose of this paper is to present a conceptual approach and to make practical recommendations on how to improve the current Automatic Test Equipment (ATE) testing and maintenance capabilities by utilizing the existing cloud computing model to build a globally linked ATE maintenance system. The basic tenet of the ATE community is to support a multi-tiered maintenance concept which, in general, is a three tiered system that is composed of organizational maintenance (O-level), intermediate maintenance (I-level), and depot maintenance (D-level) organizations. The goal of the ATE is to (1) quickly and accurately detect and isolate each fault, (2) provide software tools for analyzing historical data, and (3) gather, manage, and distribute accurate and reliable maintenance information for the failed Unit Under Test (UUT). The ATE system should provide services that will (1) maintain a repository of information that will improve fault detection and isolation, allow for off-platform assessments, document failures, and help quantify corrective actions, (2) reduce false UUT pulls, and (3) reduce repair time by prompting repair procedures. Furthermore, the ATE system should provide additional services that will help optimize the time to diagnose problems by using collected failure information and by recommending entry points into the Test Program Set (TPS) software. It should also present information to the ATE maintainer to aid in informed repair decisions which could be in the form of pilot debrief results, platform Built In Test (BIT) results, O-level test outcomes and corrective actions, and maintenance and usage history of the platform and UUT. So, based on this definition of ATE maintenance the use of cloud computing can be used to provide services to improve the overall ATE testing throughput which will result in bottom line improvements to ATE life cycle costs. By using cloud computing, which is defined to be “a model for enabling ubiquitous, convenient, on-demand network access to a shared pool of configurable computing resources (e.g., networks, servers, storage, applications, and services) that can be rapidly provisioned and released with minimal management effort or service provider interaction”, users can develop cloud computing models that will provide access to application software and databases that can be used to build a globally linked ATE maintenance system. This paper will discuss the essential characteristics of the cloud computing models and define the various flavors of cloud offerings available to designers today. This paper will also analyze the cloud computing model to arrive at a conceptual approach that can be used to enhance the current ATE Testing and Maintenance capabilities. Practical recommendations will be discussed on how to transform the current ATE Testing and Maintenance capabilities into the specific cloud computing model offerings in order to help configure a globally linked ATE maintenance system.

For modern Automatic Test Equipment (ATE) one of the most daunting tasks is now Information Assurance (IA). What was once at most a secondary item consisting mainly of installing an Anti-Virus suite is now becoming one of the most important aspects of ATE. Given the current climate of IA it has become important to ensure ATE is kept safe from any breaches of security or loss of information. Even though most ATE are not on the Internet (or even on a network for many) they are still vulnerable to some of the same attack vectors plaguing common computers and other electronic devices. This paper will discuss some of the processes and procedures which must be used to ensure that modern ATE can continue to be used to test and detect faults in the systems they are designed to test. The common items that must be considered for ATE are as follows: The ATE system must have some form of Anti-Virus (as should all computers). The ATE system should have a minimum software footprint only providing the software needed to perform the task. The ATE system should be verified to have all the Operating System (OS) settings configured pursuant to the task it is intended to perform. The ATE OS settings should include password and password expiration settings to prevent access by anyone not expected to be on the system. The ATE system software should be written and constructed such that it in itself is not readily open to attack. The ATE system should be designed in a manner such that none of the instruments in the system can easily be attacked. The ATE system should insure any paths to the outside world (such as Ethernet or USB devices) are limited to only those required to perform the task it was designed for. These and many other common configuration concerns will be discussed in the paper.

The purpose of this paper is to present a framework from which Automated Test Equipment (ATE) manufacturers can use to help them develop, integrate, and deliver ATE cloud-based applications to the consumers of their products. In order to create these applications, the developer can utilize Commercial Web Services (CWS) as a means to help access compute power, storage devices, and other services that provide the flexibility to choose a development platform or programming model that makes the most sense in trying to resolve the problem at hand. CWS provides a flexible environment from which to choose various programming models, operating systems, databases, and architectures to serve the consumers needs. CWS is highly cost-effective in that the developers and consumers pay only for what they use. Using CWS makes it extremely easy to create scalable and elastic systems as the developers can quickly add and subtract resources to their applications in order to meet current or future consumer needs. Furthermore, security is always a concern so CWS builds services in accordance with security best practices by providing the appropriate security features in those services. Using a CWS provides a level of scale, security, reliability, and privacy that are often cost prohibitive for most organizations to meet. This paper will examine available CWS cloud service platforms that organizations can potentially use to help deploy applications and services in a cost effective manner. The CWS platform consists of the following six main services, which will be discussed in more detail in this paper - (1) Computational/Networking, (2) Storage/Content Delivery, (3) Databases, (4) Analytics, (5) Applications, and (6) Deployment and Management services. One or more of these services may be utilized to help develop, integrate, and deliver ATE cloud-based applications to the consumer. The goals of ATE are to (1) quickly and accurately detect and isolate each fault, (2) provide software tools for analyzing historical data, (3) gather, manage, and distribute accurate and reliable maintenance information for the failed Unit Under Test (UUT). The CWS cloud platform will aid in the development of cloud based tools and applications that are cost effective, flexible, scalable, and secure that can be used by multiple end users to aid in the development of ATE system software tool sets. One example of a cloud-based application is a diagnostic reasoner that could be used to aid in diagnosing UUT repair actions. This paper will show how developers can use CWS to develop ATE cloud-based applications and tools that will help improve the overall ATE testing throughput, thus resulting in bottom line improvements to ATE life cycle costs.

The complexity of electronic-device testing varies widely, ranging from the simplest type manual testing to the most complex Automatic Test Equipment (ATE). Presently power controllers for electrostatic precipitator at industry are tested using simulators at the E-shop and controller development lab. The simulated inputs and outputs are generated manually through mechanical keys and push button switches. The verification process and documentation are also done manually and hence time consuming. To overcome these disadvantages, an intelligent, multipurpose simulator cum test equipment was proposed. ATE was developed using LPC2378 ARM processor with required input and output channels. The ATE has multiple communication interfaces like RS485, RS 232, CAN and Ethernet. It is also provided with Liquid Crystal Display (LCD), keypad and Local Area Network (LAN) communication. ATE completes the testing of controller without any manual intervention. Upon completion of testing, ATE sends out test reports to any computer connected to its LAN Port. The test report is generated in the form of Hyper Text Markup Language(HTML) pages with time stamping and controller particulars.

FPGAs (Field Programmable Gate Arrays) are highly integrated devices which can be programmed as variable functions. The application-level testing of FPGAs usually include multiple reconfigurations and relevant functional tests respectively through ATEs (Automated Test Equipments). However, test engineers are facing a tough problem to reconfigure FPGAs automatically through an ATE instead of using specific tools and download cables provided by FPGAs manufacturers. This paper takes example for XILINX Virtex-E series, presents two different methods for FPGA auto configuration based on an ATE using JTAG configuration interface and boundary-scan protocol, and accomplishes the entire auto configuration-test procedure by a single ATE.

The next generation automatic test system (NGATS) is the latest addition to the Integrated family of test equipment (IFTE) developed and managed by product manager, test, measurement and diagnostic equipment (PM TMDE). This is Version 6 of what is commonly known as the Base Shop Test Facility series of systems developed by the off platform, automatic test system program. NGATS is a reconfigurable, general-purpose, mobile, deployable, automatic test system designed to provide sustainment support to all Army weapon systems. This flexible testing platform will finally standardize and reduce the quantity of the Army's ATE systems to one modern tester and improve weapon system availability. It will allow for a decrease in logistical support requirements for ATE systems and the supported weapons systems and increase the mobility, deployability, affordability and supportability, of automated test equipment. NGATS assures compliance with Joint NxTest architecture and will support the agile rapid global combat support (ARGCS) advanced concept technology demonstration (ACTD) by using a common framework for DOD automatic test systems (ATS). Incremental deployment of this system will ultimately modernize and replace three existing test platforms, DSESTS, BSTF (V) 3, and BSTF (V) 5. NGATS will not only support the weapons systems currently fielded but will also support additional weapons systems as they are developed and fielded in the future. The NGATS will initially take advantage of the existing Test Program Sets for legacy weapons systems however new systems and those legacy systems that will remain in the Army inventory will have TPSs designed to take full advantage of the modern NGATS technology. Increment 1 replaces DSESTS and supports the weapons systems in the heavy brigade combat team (HBCT). The TPSs for Abrams, Bradley and other systems will be rehosted to NGATS with significant improvements. Increment 2 replaces BSTF (V) 3 and supports the MLRS, Avenger, Paladin, TOW, SINCGARS, Kiowa Warrior, Ground Based Sensor, G/VLLD, and M1A1 (SRUs) systems. Increment 3 replaces BSTF (V) 5 and supports the Kiowa Warrior and Apache. There has been increased interest in utilizing the IFTE NGATS as an Army organic sustainment support platform. Other systems that are candidates for support are KNIGHT, LLDR, STRYKER, FCS, Firefinder, LOSAT, NLOS, HIMARS, Land Warrior, SHORADS, TAD, and CROWS.

To get better anti-jamming ability, the emission signal and array calibration signal of the Frequency Synthesizer need to work in pulse mode. To achieve miniaturization and function integration, the ability to generate FSK signals and PSK signals is also needed. To realize the real-time control, the network interface is selected as the medium. The features above make it impossible to measure the Frequency Synthesizer relying on test equipments at this stage. An automatic test system (ATS) based on PXI & LXI hybrid architecture is designed as a solution. Trigger distribution module is created to establish the synchronous measurement mechanism between the ATS and the Frequency Synthesizer. Network communication module is produced, which could send control commands to the Frequency Synthesizer and store fault monitoring information. The test methods of transmission power, spur rejection and harmonic rejection are realized based on zero-span mode and time-gate mode respectively. The FSK signal is demodulated by the sliding FFT method, and the PSK signal is demodulated by the Costas loop method. The accuracy and effectiveness of the test methods are verified through practical application. Besides, on the premise that temperature changes and response nonuniformity are included in the test results, the maximum deviation of transmission power is ±0.175dB within 100 discrete measurements, which could demonstrate the stability of the ATS.

Virtual test (VT), allowing the verification of test programs and associated test hardware in a simulation environment before silicon and without a real automatic test equipment (ATE), has proven to be an effective technique to cut time-to-market and costs for mixed-signal system on chip (SoC), even in an industrial environment. Mixed-signal VT requires behavioral models both for the device under test (DUT) and the device interface board (DIB), interfacing the DUT with the ATE. Test engineers are used to design the DIB circuitry in detail. The resulting schematic is used for the layout and manufacturing of the DIB. In order to develop a behavioral model of the DIB, the test engineer has (1) to abstract this low-level schematic, by identifying the relevant functions and signal flows, and (2) to write the model manually. This bottom-up procedure is very time consuming and may lead to inconsistencies and errors. This paper introduces a new top-down flow for DIB development, allowing the automatic generation of the DIB behavioral model using VHDL as the modeling language. Test engineers enter the design of the DIB by a schematic entry tool at a very abstract level (i.e. as a block diagram). Using specific libraries, test engineers can then generate the real circuit schematic or VHDL model by dedicated netlisters.

Faced with ever-increasing constraints of budget reductions and fight schedules, test engineers are looking for faster, more cost-efficient ways to get automatic test equipment (ATE) systems up and running. This case study examines a process known as Freedom/sup TM/ Series, developed by Racal Instruments, illustrating how the principles of design reuse and automation, applied to ATE systems, can dramatically reduce non-recurring engineering costs and accelerate schedules. Freedom Series is a modular approach to ATE system design. It exploits design reuse by standardizing components such as test instruments, interface cables, software drivers, and documentation. In addition, Freedom Series provides software tools that automate many non-recurring engineering tasks. The combination of modularity, reuse, and automation accelerates the system integration process and, in many cases, virtually eliminates non-recurring engineering costs.

This paper discusses a practical approach to the use of Commercial-Off-the-Shelf (COTS) tools to implement Automatic Test Equipment (ATE) and Unit Under Test (UUT) signal-based models to support both new Test Program Set (TPS) development and TPS rehost activities. This modeling technique also provides a standard to which existing and future ATEs and UUTs can be modeled and used for analysis and comparisons. The signal-based model is implemented via a Structured Query Language (SQL) Relational Data Base Management System (RDBMS). COTS Rapid Application Development (RAD) tools, such as Microsoft/sup (R)/ Visual Basic/sup (R)/ Microsoft Access/sup (R)/ and PowerBuilder/sup (R)/, are employed to implement interfaces to the SQL database model and to provide the necessary algorithms for data comparison, model reuse and other manipulations of the model data. After models are established for both the ATE and UUTs, ATU/UUT compatibility analysis can be performed to identify any potential incompatibilities. This information can be used to optimize the selection of a target ATE for a selected group of UUTs. It can also be used to identify any signal deficiencies in the target ATE that require ATE enhancements or Interface Test Adapter (ITA) signal conditioning, to ensure UUT compatibility.

The Versatile Automated Depot Test Station (VDATS) is a major component in solving the U.S. Air Forcepsilas Automatic Test System (ATS) proliferation concerns. VDATS addresses the proliferation issue by providing the capability to replace an estimated 260 depot-level test systems that assume 150 different configurations, as well as a large number of intermediate-level test systems.The Department of Defense (DoD) has invested billions of dollars in aging and increasingly obsolete ATS used to troubleshoot and diagnose components of military aircraft and weapon systems. The issues of increased downtimes, test system obsolescence, and nonportable Test Program Sets (TPS) further contributes to the DoD's continued reporting of spare parts shortages and the increasing impacts that ATS obsolescence has on the readiness of military aircraft and weapon systems. The VDATS provides a viable approach to resolving these issues. VDATS has an extensible designed-in expansion capability intended to support present and future Air Force workloads by providing an organically-developed ATS platform with a modular, open-systems architecture that is Flexible, Capable, Tailorable, and Sustainable. VDATS makes it technically feasible to now realize the laudable 1994 DoD policy goal stated in: Military Readiness: DoD Needs to Better Manage Automatic Test Equipment Modernization," GAO-03-451, March 2003.[1] VDATS meets this stated DoD policy goal of producing an ATS capable of supporting multiple weapon systems, aircraft, and eventually being interoperable between DoD services. In 2007 the Air Force's VDATS was officially designated as a DoD Standard Family of Testers, supporting the 2005 ATS Master Plan requirement meant to reduce ATS proliferation and life-cycle operations and support costs. This paper briefly examines the present-day issues and how the U.S. Air Force is resolving these with the VDATS program. It also explains the strategy to preserve present-day and near-future TPS re- host investments, while enhancing system capabilities to meet the Air Force's depot and intermediate-level ATS requirements for the foreseeable future.

This paper takes a look at some of the more common methods being used for circuit card test and repair. Examining the high and low end techniques, prepares the way to explore mid-range capabilities that can augment both. For the most part circuit card repair is carried out using low cost General Purpose Electronic Test Equipment (GPETE) or high cost Automatic Test Equipment (ATE) utilizing Test Program Sets (TPS). Whereas both methods have their advantages they leave a gap between the technologies used and the practical aspect. This paper, highlights an alternative method being adopted by various branches of the US government to increase the repair capabilities within the military.

The VXIbus (IEEE-STD-1155) was the first widely adopted modular standard in the test and measurement industry. The adoption of the VXIbus standard led the way for the industry system integrators to achieve tremendous reductions in instrument size, ATS footprint, power consumption, cooling and overall cost. Automated Test Systems (ATS) designed and delivered for more than the last 20 years were fielded with a high percentage of VXI instrumentation. During that same time period, the test and measurement industry developed their new product lines leveraging advanced technologies from the PC industries leaving very limited resources to contend with product supportability issues for their VXI instruments. Unfortunately, as the VXIbus standard and its instrument support declines, system sustainment challenges grow exponentially. Today the VXI user's ability to maintain and support their ATS inventory is being challenged. With the large sums of money that have been invested in the ATS and TPS, to support operational objectives, the using organizations must deal with this evolving support problem. User organizations are experiencing lifetime management struggles to mitigate the impacts to their capabilities caused by critical vendors obsoleting VXI instruments and ending their support. The removal of VXIbus instrumentation increases risk impact to the ATS system dramatically since most ATS systems were principally fielded utilizing VXIbus instruments. The ratio of the VXIbus architecture instrumentation as compared to the total number of instruments in the test system is high. This ratio, in effect, amplifies the risk to the system due to obsolescence. Sustainment solutions to facilitate integrating merging industry standards seamlessly with the VXI standard can ease the transition impact by relegating the scope of a change to the INSTRUMENT level and away from the STANDARD level risk impact. In the case of VXI to PXI, or VXI to PXIe, a bridge technology that can identify and provide a path to resolve the impact to the instrument level will allow the ATS managers to accurately plan costs and manage risk while sustaining operational capability.

This paper describes why transferring test programs and fixtures from obsolete automatic test equipment (ATE) to new equipment is not as simple as it should be. No one would argue that technology has made major advances on test in the last 30 years. Today, speed, overall performance, computing power and software tools are more sophisticated than 20 or 30 years ago, when the first ATE appeared. As these ATE are now heading for retirement and as the programs they were supporting still have a long life to live, one would think legacy replacement with new ATE to be a simple task. Unfortunately, this is seldom the case. We realize that old ATE had a number of cards up their sleeves to deal with. For example, high voltage technology, lack of computer aided engineering (CAE) data, requirements for parametric tests, extensive usage of the guided probe, and many other aspects might be not so simple to be reproduced with modern, yet powerful ATE. The paper shall identify the specific constraints involved with old technology and give examples of success stories where new ATE has been adapted to respond to the challenge. Paraphrasing (in reverse) and old saying, it will be like teaching old tricks to new dogs..

It is the mandate of Automated Test Equipment (ATE) to minimize manual tasking and maximize automation. However, the role of the operator remains crucial to successful deployment of any ATE system. Simple tasks such as setting up the Unit Under Test (UUT), correct probing, potentiometer alignments, etc. must be taught so new operators can establish a basic level of diagnostic capability in the fleet. Current Consolidated Automated Support System (CASS) training hardware is based on F-14 and S-3 platforms which are obsolete, utilize antiquated technology, and are difficult to repair. Such hardware also limits Instructors' ability to insert and remove effective training faults. This paper describes a design concept which provides a robust training test set, including hardware, for operators to learn basic troubleshooting skills and ATE interaction. The US Navy recognized the benefits of such a system to address training deficiencies and initiated the development and acquisition of the CASS Training Set (CATS). The test set includes a variety of training scenarios which are commonly seen in the fleet, including digital tests, analog tests, Operational Flight Program (OFP) loads, alignments, Radio Frequency (RF) tests, diagnostics, etc. The CATS training UUT uses latching relays to induce consistent, repeatable hardware faults, and a microcontroller to produce software faults. Faults are applied and removed through the Test Program Set (TPS) and require no soldering or de-soldering of components. This process automates training fault insertion, extends the life of the training equipment, and provides repeatable fault signatures. Consistent training scenarios ensure lower variance in technical capabilities of course graduates. A complete hardware and software package with the look-and-feel of a fleet avionics asset, but the reliability to withstand a training environment provides a valuable tool to train ATE operators and should be a basic part of any ATE system.