- Research Article
- 10.1587/elex.23.20260076
Optimization of temperature offset drift and noise efficiency factor for chopper and auto-zero instrumentation amplifiers using a <i>V<sub>th</sub></i> tracking reference
- Jan 01, 2026
- IEICE Electronics Express
- Minki Park + 2 more +2
This letter introduces a method to optimize the temperature offset drift and noise efficiency factor (NEF) for chopper and auto-zero instrumentation amplifiers. In order to optimize offset drift and NEF, our proposed amplifier exploits a threshold voltage (Vth) tracking reference. A prototype of the proposed amplifier was fabricated using a standard 0.35μm complementary metal oxide semiconductor technology and occupies 0.174 mm2. Using the Vth tracking reference, an offset drift of 80 nV/℃ is achieved. The measured NEF was 2.45 with a supply current of 1.1 mA.
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