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Enhanced Pathological Element-Based Symbolic Nodal Analysis

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Abstract

An improved symbolic analysis procedure to enhance the analytic efficiency of the reported symbolic nodal analysis is presented. Two techniques are adopted in the proposed method to reduce the order of the system of equations when performing symbolic analysis. The first one uses voltage signal sources directly to perform symbolic analysis without replacing them with their nullor equivalences. The second one uses the nullor, grounded mirror, and floating mirror elements to model the active devices that involve differential or multiple single-ended signals. Practical examples are given which demonstrate the feasibility of the proposed methods.

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