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  • https://doi.org/10.1109/ccece.2010.5575139Copy DOI Icon

Estimating test cost during data path and controller synthesis with low power overhead

  • May 1, 2010
  • Haidar M Harmanani +1 more
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Abstract

This paper presents a method for concurrent BIST cost estimation during testable data path allocation. The method integrates testability in the design process and generates a distributed test controller that aims to minimize area and power. The system has been implemented and favorable results are reported.

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