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  • https://doi.org/10.1109/tns.2023.3268987Copy DOI Icon

Supervised Deep Learning and Classification of Single-Event Transients

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Abstract

This article describes a method to detect and classify single-event transients (SETs) to determine the originating circuit node impacted by ionizing radiation. SETs were measured via two-photon absorption (TPA) laser excitation on a custom CMOS phase-locked loop (PLL), and convolutional neural networks (CNNs) were used to classify the spatial dependencies of the transient responses. A clustering technique is described to identify the groups of related circuit nodes and achieves over 90% identification accuracy.

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